Search Results - "Tanba, Shinichi"

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    Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV by Sagawa, Ryusuke, Yasuhara, Akira, Hashiguchi, Hiroki, Naganuma, Tomoyuki, Tanba, Shinichi, Ishikawa, Takaki, Riedel, Thomas, Hartel, Peter, Linck, Martin, Uhlemann, Stephan, Müller, Heiko, Sawada, Hidetaka

    Published in Ultramicroscopy (01-03-2022)
    “…•Deep sub-Angstrom STEM imaging with CEOS ASCOR in JEOL NEOARM at 60kV.•Analytical optimum for chromatic- and diffraction-limited probe angles.•Residual…”
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    Journal Article
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