Search Results - "Tan, Shida"
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1
The neon gas field ion source—a first characterization of neon nanomachining properties
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21-07-2011)“…At the Charged Particle Optics Conference (CPO7) in 2006, a novel trimer based helium gas field ion source (GFIS) was introduced for use in a new helium ion…”
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Journal Article -
2
The Prospects of a Subnanometer Focused Neon Ion Beam
Published in Scanning (01-03-2012)“…Summary The success of the helium ion microscope has encouraged extensions of this technology to produce beams of other ion species. A review of the various…”
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Journal Article -
3
Observation of synchronized atomic motions in the field ion microscope
Published in Ultramicroscopy (01-03-2013)“…For over half a century, the field ion microscope (FIM) has been used to visualize atomic structures at the apex of a sharpened needle by way of the ion beams…”
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4
Optical Trapping of Single-Walled Carbon Nanotubes
Published in Nano letters (01-08-2004)“…Optical trapping and manipulation of individually dissolved single-walled carbon nanotubes in an aqueous solution was demonstrated using an infrared laser…”
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5
Measurement of ultrashort laser pulses using single-crystal films of 4-aminobenzophenone
Published in Optics communications (15-12-2007)“…Single-crystal thin-film of an organic second-order nonlinear optical material, 4-aminobenzophenone (ABP), is used to measure the pulsewidth of a Ti-Sapphire…”
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6
Aqueous two-phase system of cationic and anionic surfactant mixture and its application to the extraction of porphyrins and metalloporphyrins
Published in Analytica chimica acta (10-08-1998)“…Aqueous two-phase system is obtained when a cationic surfactant with bigger alkyl polar head groups such as dodecyltriethylammonium bromide (C 12NE) is mixed…”
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7
Current density profile characterization and analysis method for focused ion beam
Published in Microelectronic engineering (02-04-2016)“…The most critical challenge of circuit edit is the scaling of nano-machined features to the ever-decreasing minimum dimensions of VLSI process technologies. A…”
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Journal Article -
8
In Situ Mitigation of Subsurface and Peripheral Focused Ion Beam Damage via Simultaneous Pulsed Laser Heating
Published in Small (Weinheim an der Bergstrasse, Germany) (06-04-2016)“…Focused helium and neon ion (He+/Ne+) beam processing has recently been used to push resolution limits of direct‐write nanoscale synthesis. The ubiquitous…”
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9
Laser-Assisted Focused He+ Ion Beam Induced Etching with and without XeF2 Gas Assist
Published in ACS applied materials & interfaces (26-10-2016)“…Focused helium ion (He+) milling has been demonstrated as a high-resolution nanopatterning technique; however, it can be limited by its low sputter yield as…”
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Journal Article -
10
Monte Carlo simulation of nanoscale material focused ion beam gas-assisted etching: Ga + and Ne + etching of SiO 2 in the presence of a XeF 2 precursor gas
Published in Nanoscale advances (11-09-2019)“…Elucidating energetic particle-precursor gas–solid interactions is critical to many atomic and nanoscale synthesis approaches. Focused ion beam sputtering and…”
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Journal Article -
11
Monte Carlo simulation of nanoscale material focused ion beam gas-assisted etching: Ga and Ne etching of SiO in the presence of a XeF precursor gas
Published in Nanoscale advances (11-09-2019)“…Elucidating energetic particle-precursor gas-solid interactions is critical to many atomic and nanoscale synthesis approaches. Focused ion beam sputtering and…”
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Journal Article -
12
Monte Carlo simulation of nanoscale material focused ion beam gas-assisted etching: Ga+ and Ne+ etching of SiO2 in the presence of a XeF2 precursor gas
Published in Nanoscale advances (2019)“…Elucidating energetic particle-precursor gas–solid interactions is critical to many atomic and nanoscale synthesis approaches. Focused ion beam sputtering and…”
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Journal Article -
13
Ion Beams: In Situ Mitigation of Subsurface and Peripheral Focused Ion Beam Damage via Simultaneous Pulsed Laser Heating (Small 13/2016)
Published in Small (Weinheim an der Bergstrasse, Germany) (01-04-2016)“…Focused ion beam (FIB) processing is an important direct‐write nanoscale synthesis technique; however it generates subsurface defects that can preclude its use…”
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Journal Article -
14
Laser-Assisted Focused He + Ion Beam Induced Etching with and without XeF 2 Gas Assist
Published in ACS applied materials & interfaces (26-10-2016)“…Focused helium ion (He ) milling has been demonstrated as a high-resolution nanopatterning technique; however, it can be limited by its low sputter yield as…”
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Journal Article -
15
Efficient mirrorless laserlike emission in a novel organic salt DEST: cooperative emission
Published in Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170) (2001)“…Summary form only given. In recent years, significant research attention has been focused on organic materials, especially conjugated polymers due to their…”
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Conference Proceeding -
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Studies of selected organic nonlinear optical and light-emitting materials
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Dissertation -
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Studies of selected organic nonlinear optical and light -emitting materials
Published 01-01-2002“…In this dissertation, the nonlinear optical and light emitting properties of a selected class of organic materials have been studied in detail. Novel organic…”
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Dissertation -
18
Nonlinear optical studies of 3-methyl-4-methoxy-4′-nitrostilbene single-crystal films
Published in Applied physics letters (07-08-2000)“…We report the second-order optical measurement of single-crystal thin-films of 3-methyl-4-methoxy-4′-nitrostilbene by transverse second-harmonic generation…”
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Journal Article -
19
Electro-optic and second-harmonic generation measurement in 3-methyl-4-methoxy-4'-nitrostilbene (MMONS) single-crystal thin-films
Published in Conference on Lasers and Electro-Optics (CLEO 2000). Technical Digest. Postconference Edition. TOPS Vol.39 (IEEE Cat. No.00CH37088) (2000)“…Summary form only given. Significant effort has been devoted to investigate organic second-order optical materials with potential applications in frequency…”
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Conference Proceeding -
20
Efficient spectrally narrowed laserlike emission in the blue-green using a novel organic salt
Published in Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170) (2001)“…Summary form only given. There has been considerable interest in spectrally narrowed light emission from organic dyes bind conjugated polymers. Stilbazolium…”
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Conference Proceeding