Search Results - "Tambo, T."

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  1. 1

    Tuning the emission wavelength of Si nanocrystals in SiO2 by oxidation by Brongersma, M. L., Polman, A., Min, K. S., Boer, E., Tambo, T., Atwater, H. A.

    Published in Applied physics letters (18-05-1998)
    “…Si nanocrystals (diameter 2–5 nm) were formed by 35 keV Si+ implantation at a fluence of 6×1016 Si/cm2 into a 100 nm thick thermally grown SiO2 film on Si…”
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    Journal Article
  2. 2

    Effect of AlSb buffer layer thickness on heteroepitaxial growth of InSb films on a Si(001) substrate by Mori, M., Murata, K., Fujimoto, N., Tatsuyama, C., Tambo, T.

    Published in Thin solid films (31-07-2007)
    “…Aluminum antimonide (AlSb) layers with various thickness ranged from about 8 to 250 nm were grown at 520 °C as the buffer layer for the heteroepitaxial growth…”
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    Journal Article
  3. 3

    Heteroepitaxial growth of rotated InSb films on a Si(1 1 1) substrate via 2×2-In surface reconstruction by Mori, M., Saito, M., Yamashita, Y., Nagashima, K., Hashimoto, M., Tatsuyama, C., Tambo, T.

    Published in Journal of crystal growth (01-04-2007)
    “…The heteroepitaxial growth of InSb films via In-induced surface reconstructions such as 2×2-In and √3×√3-In on a Si(1 1 1) substrate was carried out by using a…”
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    Journal Article Conference Proceeding
  4. 4

    The structural deformations in the Si/SiGe system induced by thermal annealing by SHUQI ZHENG, MORI, M, TAMBO, T, TATSUYAMA, C

    Published in Journal of materials science (01-07-2007)
    “…The structural deformations in Si/SiGe system during thermal annealing were investigated by means of atomic force microscope (AFM) and high-resolution X-ray…”
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    Journal Article
  5. 5

    Optical and structural characterization of CdSe and CdTe layers and fabrication of a CdTe/CdSe structure by Alam, S., Pathan, M.A.K., Siddiquee, K.A.M.H., Islam, A.B.M.O., Gafur, M.A., Saha, D.K., Mori, M., Tambo, T.

    Published in Optik (Stuttgart) (01-08-2013)
    “…CdTe/CdSe heterojunction solar cell structure is fabricated using a simple, easy and low-cost electrodeposition method. To fabricate this solar cell structure,…”
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    Journal Article
  6. 6

    Low-temperature growth of InSb(1 1 1) on Si(1 1 1) substrate by Murata, K., Ahmad, N.B., Tamura, Y., Mori, M., Tatsuyama, C., Tambo, T.

    Published in Journal of crystal growth (01-04-2007)
    “…Low-temperature growth of InSb films on Si(1 1 1) substrate was performed in an ultra-high vacuum chamber by coevaporation of elemental Indium and Antimony…”
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    Journal Article Conference Proceeding
  7. 7

    Interdiffusion at Si/SiGe interface analyzed by high-resolution X-ray diffraction by Zheng, Shuqi, Kawashima, M., Mori, M., Tambo, T., Tatsuyama, C.

    Published in Thin solid films (05-06-2006)
    “…The interdiffusion at Si/SiGe interface with Ge mole fraction of 19.2%, and SiGe layer thickness of 283 nm was studied by high-resolution X-ray diffraction…”
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    Journal Article Conference Proceeding
  8. 8

    Heteroepitaxial growth of InSb films on a Si(0 0 1) substrate via AlSb buffer layer by Mori, M., Akae, N., Uotani, K., Fujimoto, N., Tambo, T., Tatsuyama, C.

    Published in Applied surface science (30-06-2003)
    “…AlSb is a more suitable material as buffer layers for the heteroepitaxial growth of InSb films on a Si(0 0 1) substrate than Ge. It reduces the large lattice…”
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    Journal Article Conference Proceeding
  9. 9

    Heteroepitaxy of InSb films grown on a Si(0 0 1) substrate with AlSb buffer layer by Mori, M., Fujimoto, N., Akae, N., Uotani, K., Tambo, T., Tatsuyama, C.

    Published in Journal of crystal growth (15-01-2006)
    “…The growth of InSb films on a Si(0 0 1) substrate with AlSb buffer layer was performed in an ultra high vacuum chamber (UHV) by a co-evaporation of elemental…”
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    Journal Article
  10. 10

    Sb adsorption onto In nanocluster array structure formed on a Si(1 1 1)–(7 × 7) by Saito, M., Takeuchi, C., Mori, M., Tambo, T., Tatsuyama, C.

    Published in Applied surface science (15-05-2005)
    “…The application of self organized growth method (magic clustering method) for the formation of new type of nanocluster is reported. Sb has been deposited onto…”
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    Journal Article Conference Proceeding
  11. 11

    Atomic H-mediated (Si14/Ge1)20 superlattice buffers for the growth of Si0.75Ge0.25 alloy layers with low residual strain by Rahman, M.M., Tambo, T., Tatsuyama, C.

    Published in Thin solid films (01-10-2004)
    “…We report on the growth of high-quality 2000-A -thick Si0.75Ge0.25 alloy layers using short-period (Si14/Ge1)20 superlattice (SSL) buffer with atomic H…”
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    Journal Article
  12. 12

    Surfactant mediated growth of Sb clusters on Si(1 1 1) surface by Gruznev, D.V., Ohmura, K., Saitoh, M., Tsukabayashi, S., Tambo, T., Lifshits, V.G., Tatsuyama, C.

    Published in Journal of crystal growth (01-09-2004)
    “…Adsorption kinetics of Sb onto the Si(1 1 1) surface has been modified by incorporation of a Si(1 1 1)–In(√3×√3) surface phase (θ In = 1 3 ML) . In contrast to…”
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    Journal Article
  13. 13

    Surface structure evolution during Sb adsorption on Si(1 1 1)–In(4×1) reconstruction by Gruznev, D.V., Rao, B.V., Tambo, T., Tatsuyama, C.

    Published in Applied surface science (01-05-2002)
    “…The Sb adsorption process on the Si(1 1 1)–In(4×1) surface phase was studied in the temperature range 200–400 °C. The formation of a Si(1 1 1)–InSb (2×2)…”
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    Journal Article
  14. 14

    Atomic structure and formation process of the Si(1 1 1)–Sb(√7 × √7) surface phase by Gruznev, D., Rao, B.V., Furukawa, Y., Mori, M., Tambo, T., Lifshits, V.G., Tatsuyama, C.

    Published in Applied surface science (15-05-2003)
    “…During the study of Sb condensation on the Si(111)–In(√3×√3) surface phase we observed the formation of a new Sb-induced surface structure with (√7×√7) lattice…”
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    Journal Article
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    Study of Sb adsorption on the Si(0 0 1)–In(4 × 3) surface by Gruznev, D, Furukawa, Y, Mori, M, Tambo, T, Lifshits, V.G, Tatsuyama, C

    Published in Applied surface science (30-06-2003)
    “…The process of Sb adsorption onto Si(0 0 1)–In(4×3) surface phase has been studied using scanning tunneling microscopy (STM), reflection high-energy electron…”
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    Journal Article
  19. 19

    Modification of Sb/Si(0 0 1) interface by incorporation of In(4 × 3) surface reconstruction by Gruznev, D.V., Ohmura, K., Mori, M., Tambo, T., Lifshits, V.G., Tatsuyama, C.

    Published in Applied surface science (15-10-2004)
    “…The formation of a Sb/Si(001) interface with artificial surface structure is achieved by Sb adsorption onto the In(4 × 3) surface phase at RT followed by…”
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    Journal Article
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