Search Results - "Tali, Maris"
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Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications
Published in IEEE transactions on nuclear science (01-05-2021)“…Proton direct ionization (PDI) from low-energy protons has been shown to have a potentially significant impact on the accuracy of prediction methods used to…”
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Journal Article -
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Heavy Ion Nuclear Reaction Impact on SEE Testing: From Standard to Ultra-high Energies
Published in IEEE transactions on nuclear science (01-07-2020)“…We perform Monte Carlo (MC) simulations to describe heavy ion (HI) nuclear interactions in a broad energy range (4 MeV/n-150 GeV/n), focusing on the single…”
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Thermal Neutron-Induced SEUs in the LHC Accelerator Environment
Published in IEEE transactions on nuclear science (01-07-2020)“…In addition to high-energy hadrons, which include neutrons, protons, and pions above 20 MeV, thermal neutrons (ThNs) are a major concern in terms of soft error…”
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4
High-Energy Electron-Induced SEUs and Jovian Environment Impact
Published in IEEE transactions on nuclear science (01-08-2017)“…We present experimental evidence of electron-induced upsets in a reference European Space Agency (ESA) single event upset (SEU) monitor, induced by a 200-MeV…”
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5
Single Event Effect Testing With Ultrahigh Energy Heavy Ion Beams
Published in IEEE transactions on nuclear science (01-01-2020)“…Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams provided at CERN, presents advantages related to their long ranges…”
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SEE Tests With Ultra Energetic Xe Ion Beam in the CHARM Facility at CERN
Published in IEEE transactions on nuclear science (01-07-2019)“…Taking advantage of the heavy ion acceleration program, tests on radiation effects with Ultrahigh Energy (UHE) xenon ion beams (with Energy > 5 GeV/nucleon)…”
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Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects Testing
Published in IEEE transactions on nuclear science (01-01-2019)“…Traditional heavy-ion testing for single-event effects is carried out in cyclotron facilities with energies around 10 MeV/n. Despite their capability of…”
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Mechanisms of Electron-Induced Single-Event Latchup
Published in IEEE transactions on nuclear science (01-01-2019)“…In this paper, possible mechanisms by which electrons can induce single-event latchups in electronics are discussed. The energy deposition and the nuclear…”
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Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate
Published in IEEE transactions on nuclear science (01-01-2020)“…We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in…”
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10
SEE Testing in the 24-GeV Proton Beam at the CHARM Facility
Published in IEEE transactions on nuclear science (01-08-2018)“…A 24-GeV proton beam is available at the Cern High energy AcceleRator Mixed field facility which can be used to test components and boards for single-event…”
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Mechanisms of Electron-Induced Single-Event Upsets in Medical and Experimental Linacs
Published in IEEE transactions on nuclear science (01-08-2018)“…In this paper, we perform an in-depth analysis of the single-event effects observed during testing at medical electron linacs and an experimental high-energy…”
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12
Space Shuttle: A Test Vehicle for the Reliability of the SkyWater 130nm PDK for Future Space Processors
Published in 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) (03-07-2023)“…Recently the ASIC industry experiences a massive change with more and more small and medium businesses entering the custom ASIC development. This trend is…”
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Conference Proceeding -
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CERN IRRADIATION FACILITIES
Published in Radiation protection dosimetry (01-08-2018)“…CERN provides unique irradiation facilities for applications in dosimetry, metrology, intercomparison of radiation protection devices, benchmark of Monte Carlo…”
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14
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
Published in 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (01-11-2020)“…The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The…”
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Conference Proceeding -
15
FPGA SEE Test with Ultra-High Energy Heavy Ions
Published in 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01-10-2018)“…The use of System-on-Chip (SoC) solutions in the design of space-borne data handling systems is an important step towards further miniaturization in space. In…”
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Conference Proceeding -
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Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01-07-2018)“…Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally,…”
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Conference Proceeding -
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Proton Evaluation of Single Event Effects in the NVIDIA GPU Orin SoM: Understanding Radiation Vulnerabilities Beyond the SoC
Published in 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) (03-07-2024)“…In this paper, we investigate the single event effects under proton irradiation for the state-of-the-art embedded GPU NVIDIA Jetson Orin NX System-on-Module…”
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Conference Proceeding -
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Sources of Single Event Effects in the NVIDIA Xavier SoC Family under Proton Irradiation
Published in 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) (12-09-2022)“…In this paper we characterise two embedded GPU devices from the NVIDIA Xavier family System-on-Chip (SoC) using a proton beam. We compare the NVIDIA Xavier NX…”
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Conference Proceeding -
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Radiation Test and in Orbit Performance of MpSoC AI Accelerator
Published in 2022 IEEE Aerospace Conference (AERO) (05-03-2022)“…Φ-Sat-1 is part of the European Space Agency initiative to promote the development of disruptive innovative technology and capabilities on-board EO missions…”
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Conference Proceeding -
20
Mono-energetic electron induced single-event effects at the VESPER facility
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01-09-2016)“…We present experimental evidence of electron induced upsets in a reference ESA SEU monitor, the SEU based particle detector, induced by 200 MeV electron beam…”
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Conference Proceeding