Search Results - "Tadayyon, S. M."
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Work function modification of indium–tin–oxide used in organic light emitting devices
Published in Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (01-07-1999)“…We report measurements on the modification of the work function (WF) of indium–tin–oxide (ITO) by deposition of Au and Pt overlayers, chosen because of their…”
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Conference Proceeding Journal Article -
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CuPc buffer layer role in OLED performance: a study of the interfacial band energies
Published in Organic electronics (01-06-2004)“…We present a UV photoemission (UPS) and topographic study of the indium–tin-oxide (ITO) anode used in organic light emitting diodes (OLEDs). The performance of…”
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Journal Article -
3
Reliable and reproducible determination of work function and ionization potentials of layers and surfaces relevant to organic light emitting diodes
Published in Organic electronics (01-06-2004)“…Ultra violet photoelectron spectroscopy has been used in most of the research related to determination of the energy levels of the materials in multilayer…”
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Journal Article -
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Interdiffusion in Pd/Ti bilayer films studied by Auger electron depth profiling
Published in JPN J APPL PHYS PART 1 REGUL PAP SHORT NOTE REV PAP (01-09-1993)“…Interdiffusion processes in Pd/Ti bilayer films subjected to diffusion annealing at temperatures between 523 K and 623 K are studied. Changes of the…”
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Journal Article -
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Rutherford backscattering and secondary ion mass spectrometry investigation of Mg:Ag–tris(8-hydroxy quinoline) aluminum interfaces
Published in Organic electronics (01-06-2003)“…The presence or absence of silver diffusion from Mg:Ag cathodes in tris(8-hydroxy quinoline) aluminum (Alq 3) type organic light emitting diodes (OLEDs) has…”
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Journal Article -
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Solid-state amorphization in palladium/titanium multilayer films during sputter deposition and postdeposition annealing
Published in Japanese Journal of Applied Physics (01-08-1994)“…Microstructures in Pd/Ti multilayer films have been investigated using X-ray diffraction, Auger electron spectroscopy and cross-sectional transmission electron…”
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Journal Article -
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Auger electron spectroscopy and X-ray diffraction study of interdiffusion and solid state amorphization of Ni/Ti multilayers
Published in Japanese Journal of Applied Physics (01-07-1992)“…The process of interlayer diffusion and solid-state reaction in Ni/Ti multilayer films during annealing at 523-623 K has been investigated by Auger electron…”
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Journal Article