Search Results - "TOMITORI, M"

Local protrusions formed on Si(111) surface by surface melting and solidification under applied tensile stress by Nishimura, T., Tomitori, M.

“…The surface structure and composition of Si(111) was modified, by heating it to 1300 °C in ultrahigh vacuum under an external tensile stress. A stress of…”
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Observation of electronic states on Si(111)-(7 x 7) through short-range attractive force with noncontact atomic force spectroscopy by Arai, T, Tomitori, M

“…We experimentally reveal that the short-range attractive force between a Si tip and a Si(111)-(7 x 7) surface is enhanced at specified bias voltages; we…”
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Electric conductance through chemical bonding states being formed between a Si tip and a Si ( 111 ) − ( 7 × 7 ) surface by bias-voltage noncontact atomic force spectroscopy by Arai, T., Tomitori, M.

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Hexagonal arrangement of Ge clusters self-organized on a template of half unit cells of Si(1 1 1)-7 × 7 observed by scanning tunneling microscopy by Ansari, Z.A., Arai, T., Tomitori, M.

“…We observe initial nucleation of Ge clusters and their arrangement on Si(1 1 1)-7 × 7 by ultrahigh-vacuum scanning tunneling microscopy on an atomic scale;…”
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Interplay between nonlinearity, scan speed, damping, and electronics in frequency modulation atomic-force microscopy by Gauthier, Michel, Pérez, Ruben, Arai, Toyoko, Tomitori, Masahiko, Tsukada, Masaru

“…Numerical simulations of the frequency modulation atomic force microscope, including the whole dynamical regulation by the electronics, show that the…”
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An applicability of scanning tunneling microscopy for surface electron spectroscopy by TOMITORI, M, HIRADE, M, SUGANUMA, Y, ARAI, T

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Viscoelastic and electrical properties of self-assembled monolayers on Au(111) films by SALMERON, M, NEUBAUER, G, FOLCH, A, TOMITORI, M, OGLETREE, D. F, SAUTET, P

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Removal of contamination and oxide layers from UHV-AFM tips by Arai, T., Tomitori, M.

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Bias dependence of Si(111)7×7 images observed by noncontact atomic force microscopy by Arai, T, Tomitori, M

“…Noncontact atomic force microscopy (nc-AFM) imaging of a Si(111)7×7 surface has been done in order to examine the bias dependence of the contrast of Si…”
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Tunneling condition dependence of electron standing waves in vacuum gaps on Au(111) and Si(001) observed by scanning tunneling microscopy by Suganuma, Y., Tomitori, M.

“…Using a scanning tunneling microscope, the differential conductance (d I/d V) versus the applied bias voltage ( V) on Au(111) and n- and p-type Si(001)…”
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Visualization of tip-surface geometry at atomic distance by TEM-STM holder by Naitoh, Y., Takayanagi, K., Tomitori, M.

“…To clarify the tip-surface interaction of the scanning tunneling microscope (STM) by using a UHV transmission electron microscope (TEM), we specially designed…”
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Simultaneous imaging of tunneling current and damping energy by noncontact-AFM in ultra-high vacuum by Arai, T., Tomitori, M.

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Nanometer scale mechanical properties of Au(111) thin films by SALMERON, M, FOLCH, A, NEUBAUER, G, TOMITORI, M, OGLETREE, D. F, KOLBE, W

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Bias dependence of Si(111)7 x 7 images observed by noncontact atomic force microscopy by ARAI, T, TOMITORI, M

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Viscoelastic and electrical properties of self-assembled monolayers on gold (111) films by Salmeron, M, Neubauer, G, Folch, A, Tomitori, M, Ogletree, D. F, Sautet, P

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Observation of electronic states on Si(111)-(7 × 7) through short-range attractive force with noncontact atomic force spectroscopy by ARAI, T, TOMITORI, M

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Nanometer scale mechanical properties of gold(111) thin films by Salmeron, M, Folch, A, Neubauer, G, Tomitori, M, Ogletree, D. F, Kolbe, W

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Analysis of electron standing waves in a vacuum gap of scanning tunneling microscopy: Measurement of band bending through energy shifts of electron standing wave by Suganuma, Y., Tomitori, M.

“…Numerical simulation for the electron standing wave excited between a scanning tunneling microscopy (STM) tip and a sample in a field emission regime has been…”
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A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe by Arai, Toyoko, Tomitori, Masahiko

“…We grow a Si nanopillar on a commercial Si tip on an atomic force microscopy (AFM) cantilever using AFM in ultrahigh vacuum for a high-quality scanning force…”
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Germanium islands grown on a Si(111)7 x 7 surface observed by noncontact atomic force microscopy with simultaneous imaging on damping by ARAI, Toyoko, TOMITORI, Masahiko

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