Search Results - "TOBIN, S. P"

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  1. 1

    HgCdTe MWIR back-illuminated electron-initiated avalanche photodiode arrays by REINE, M. B, MARCINIEC, J. W, WONG, K. K, PARODOS, T, MULLARKEY, J. D, LAMARRE, P. A, TOBIN, S. P, GUSTAVSEN, K. A, WILLIAMS, G. M

    Published in Journal of electronic materials (01-08-2007)
    “…This paper reports data for back-illuminated planar n-on-p HgCdTe electron-initiated avalanche photodiode (e-APD) 4 × 4 arrays with large unit cells (250 × 250…”
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    Conference Proceeding Journal Article
  2. 2

    Characterization of HgCdTe MWIR Back-Illuminated Electron-Initiated Avalanche Photodiodes by Reine, M.B., Marciniec, J.W., Wong, K.K., Parodos, T., Mullarkey, J.D., Lamarre, P.A., Tobin, S.P., Minich, R.W., Gustavsen, K.A., Compton, M., Williams, G.M.

    Published in Journal of electronic materials (01-09-2008)
    “…This article reports new characterization data for large-area (250  μ m ×  250  μ m) back-illuminated planar n -on- p HgCdTe electron-initiated avalanche…”
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    Journal Article Conference Proceeding
  3. 3

    Characterization of Dislocations in HgCdTe Heteroepitaxial Layers Using a New Substrate Removal Technique by Lamarre, P., Fulk, C., D’Orsogna, D., Bellotti, E., Smith, F., LoVecchio, P., Reine, M. B., Parodos, T., Marciniec, J., Tobin, S. P., Markunas, J.

    Published in Journal of electronic materials (01-08-2009)
    “…Dislocations are known to influence the electrical and optical properties of long-wavelength infrared (LWIR) HgCdTe detectors and have been shown to limit the…”
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    Journal Article Conference Proceeding
  4. 4

    A Novel Stress Characterization Technique for the Development of Low-Stress Ohmic Contacts to HgCdTe by D’Orsogna, D., Lamarre, P., Bellotti, E., Barbone, P. E., Smith, F., Fulk, C., LoVecchio, P., Reine, M. B., Tobin, S. P., Markunas, J.

    Published in Journal of electronic materials (01-08-2009)
    “…HgCdTe material intended for long-wavelength infrared detection is particularly susceptible to damage from stress. As a result, an ideal ohmic contact needs to…”
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    Journal Article Conference Proceeding
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    Effects of Na2S and (NH4)2S edge passivation treatments on the dark current-voltage characteristics of GaAs pn diodes by CARPENTER, M. S, MELLOCH, M. R, LUNDSTROM, M. S, TOBIN, S. P

    Published in Applied physics letters (20-06-1988)
    “…The dark current-voltage characteristics of GaAs pn homojunctions whose surfaces have been passivated with Na2S and (NH4)2S chemical treatments have been…”
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    Journal Article
  7. 7

    HgCdTe growth on (552) oriented CdZnTe by metalorganic vapor phase epitaxy by MITRA, P, CASE, F. C, GLASS, H. L, SPEZIALE, V. M, FLINT, J. P, TOBIN, S. P, NORTON, P. W

    Published in Journal of electronic materials (01-06-2001)
    “…We report the growth of HgCdTe on (552)B CdZnTe by metalorganic vapor phase epitaxy (MOVPE). The (552) plane is obtained by 180 degree rotation of the (211)…”
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    Conference Proceeding Journal Article
  8. 8

    Ultralong minority-carrier lifetime epitaxial GaAs by photon recycling by AHRENKIEL, R. K, DUNLAVY, D. J, KEYES, B, VERNON, S. M, DIXON, T. M, TOBIN, S. P, MILLER, K. L, HAYES, R. E

    Published in Applied physics letters (11-09-1989)
    “…The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition…”
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    Journal Article
  9. 9

    Composition and thickness control of thin LPE HgCdTe layers using x-ray diffraction by Tobin, S P, Hutchins, M A, Norton, P W

    Published in Journal of electronic materials (01-06-2000)
    “…Double-axis X-ray rocking curve measurements have been used to nondestructively characterize the composition profile of HgCdTe heterojunction photodiode…”
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    Journal Article
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    Hall effect characterization of LPE HgCdTe P/n heterojunctions by TOBIN, S. P, PULTZ, G. N, KRUEGER, E. E, KESTIGIAN, M, WONG, K.-K, NORTON, P. W

    Published in Journal of electronic materials (01-08-1993)
    “…Field and temp. dependences of Hall coeff. are used to simultaneously extract information about the p and n layers in long-wavelength ir title heterojunctions…”
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    Conference Proceeding Journal Article
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    Improved operability in Hg1−xCdxTe detector arrays by Hutchins, M. A., Smith, F. T. J., Tobin, S. P., Norton, P. W.

    Published in Journal of electronic materials (01-06-1999)
    “…Progress has been made in identifying the source of outages and eliminating them from LPE grown title P-on-n structures. Failure analysis was performed on…”
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    Journal Article
  15. 15

    Trace copper measurements and electrical effects in LPE HgCdTe by Tower, J P, Tobin, S P, Norton, P W, Bollong, A B

    Published in Journal of electronic materials (01-08-1996)
    “…Recent improvements in sputter initiated resonance ionization spectroscopy (SIRIS) have now made it possible to measure copper in HgCdTe films into the low…”
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    Journal Article
  16. 16

    X-ray diffraction characterization of LPE HgCdTe heterojunction photodiode material by TOBIN, S. P, KRUEGER, E. E, PULTZ, G. N, KESTIGIAN, M, WONG, K.-K, NORTON, P. W

    Published in Journal of electronic materials (01-08-1993)
    “…Using asymmetric 246 reflection, small composition differences (0.03) can be resolved. High-resolution XRD is a nondestructive, relatively rapid technique for…”
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    Conference Proceeding Journal Article
  17. 17

    Minority-carrier properties of GaAs on silicon by AHRENKIEL, R. K, AL-JASSIM, M. M, DUNLAVY, D. J, JONES, K. M, VERNON, S. M, TOBIN, S. P, HAVEN, V. E

    Published in Applied physics letters (18-07-1988)
    “…The minority-carrier lifetimes of the heteroepitaxial system of GaAs on Si are limited by recombination at mismatch dislocations. Here we show that increasing…”
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    Journal Article
  18. 18

    Advances in composition control for 16 mu m LPE P-on-n HgCdTe heterojunction photodiodes for remote sensing applications at 60 K by Tobin, S P, Weiler, M H, Hutchins, M A, Parodos, T, Norton, P W

    Published in Journal of electronic materials (01-01-1999)
    “…With good composition control in both p-type cap and n-type base LPE layers, it is possible to make barrier-free two-layer P-on-n HgCdTe heterojunction…”
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    Journal Article
  19. 19

    HgCdTe photodetectors with negative luminescent efficiencies >80 by Bewley, W. W., Jurkovic, M. J., Felix, C. L., Lindle, J. R., Vurgaftman, I., Meyer, J. R., Aifer, E. H., Butler, J. E., Tobin, S. P., Norton, P. W., Hutchins, M. A.

    Published in Applied physics letters (14-05-2001)
    “…We have characterized the negative luminescent properties of photovoltaic HgCdTe detector structures with a room-temperature cutoff of 4.2 μm. Using an optical…”
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    Journal Article
  20. 20

    Sequential etch analysis of electron injection in p+-GaAs by KLAUSMEIER-BROWN, M. E, KYONO, C. S, DEMOULIN, P. D, TOBIN, S. P, LUNDSTROM, M. S, MELLOCH, M. R

    Published in IEEE transactions on electron devices (01-07-1988)
    “…The influence of heavy impurity doping of electron injection currents in p+- n diodes is investigated experimentally. By extracting the n = 1 diffusion current…”
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    Journal Article