Search Results - "TOBIN, S. P"
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HgCdTe MWIR back-illuminated electron-initiated avalanche photodiode arrays
Published in Journal of electronic materials (01-08-2007)“…This paper reports data for back-illuminated planar n-on-p HgCdTe electron-initiated avalanche photodiode (e-APD) 4 × 4 arrays with large unit cells (250 × 250…”
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Conference Proceeding Journal Article -
2
Characterization of HgCdTe MWIR Back-Illuminated Electron-Initiated Avalanche Photodiodes
Published in Journal of electronic materials (01-09-2008)“…This article reports new characterization data for large-area (250 μ m × 250 μ m) back-illuminated planar n -on- p HgCdTe electron-initiated avalanche…”
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Journal Article Conference Proceeding -
3
Characterization of Dislocations in HgCdTe Heteroepitaxial Layers Using a New Substrate Removal Technique
Published in Journal of electronic materials (01-08-2009)“…Dislocations are known to influence the electrical and optical properties of long-wavelength infrared (LWIR) HgCdTe detectors and have been shown to limit the…”
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Journal Article Conference Proceeding -
4
A Novel Stress Characterization Technique for the Development of Low-Stress Ohmic Contacts to HgCdTe
Published in Journal of electronic materials (01-08-2009)“…HgCdTe material intended for long-wavelength infrared detection is particularly susceptible to damage from stress. As a result, an ideal ohmic contact needs to…”
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Journal Article Conference Proceeding -
5
An algorithm for suboptimally placed supraglottic airway devices: the choice of videolaryngoscope
Published in British journal of anaesthesia : BJA (01-10-2017)Get full text
Journal Article -
6
Effects of Na2S and (NH4)2S edge passivation treatments on the dark current-voltage characteristics of GaAs pn diodes
Published in Applied physics letters (20-06-1988)“…The dark current-voltage characteristics of GaAs pn homojunctions whose surfaces have been passivated with Na2S and (NH4)2S chemical treatments have been…”
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7
HgCdTe growth on (552) oriented CdZnTe by metalorganic vapor phase epitaxy
Published in Journal of electronic materials (01-06-2001)“…We report the growth of HgCdTe on (552)B CdZnTe by metalorganic vapor phase epitaxy (MOVPE). The (552) plane is obtained by 180 degree rotation of the (211)…”
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Conference Proceeding Journal Article -
8
Ultralong minority-carrier lifetime epitaxial GaAs by photon recycling
Published in Applied physics letters (11-09-1989)“…The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition…”
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9
Composition and thickness control of thin LPE HgCdTe layers using x-ray diffraction
Published in Journal of electronic materials (01-06-2000)“…Double-axis X-ray rocking curve measurements have been used to nondestructively characterize the composition profile of HgCdTe heterojunction photodiode…”
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Journal Article -
10
The relationship between lattice matching and crosshatch in liquid phase epitaxy HgCdTe on CdZnTe substrates
Published in Journal of electronic materials (01-09-1995)Get full text
Conference Proceeding Journal Article -
11
Hall effect characterization of LPE HgCdTe P/n heterojunctions
Published in Journal of electronic materials (01-08-1993)“…Field and temp. dependences of Hall coeff. are used to simultaneously extract information about the p and n layers in long-wavelength ir title heterojunctions…”
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Conference Proceeding Journal Article -
12
A comparison of techniques for nondestructive composition measurements in CdZnTe substrates
Published in Journal of electronic materials (01-05-1995)Get full text
Conference Proceeding Journal Article -
13
CdZnTe substrate impurities and their effects on liquid phase epitaxy HgCdTe
Published in Journal of electronic materials (01-05-1995)Get full text
Conference Proceeding Journal Article -
14
Improved operability in Hg1−xCdxTe detector arrays
Published in Journal of electronic materials (01-06-1999)“…Progress has been made in identifying the source of outages and eliminating them from LPE grown title P-on-n structures. Failure analysis was performed on…”
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Journal Article -
15
Trace copper measurements and electrical effects in LPE HgCdTe
Published in Journal of electronic materials (01-08-1996)“…Recent improvements in sputter initiated resonance ionization spectroscopy (SIRIS) have now made it possible to measure copper in HgCdTe films into the low…”
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Journal Article -
16
X-ray diffraction characterization of LPE HgCdTe heterojunction photodiode material
Published in Journal of electronic materials (01-08-1993)“…Using asymmetric 246 reflection, small composition differences (0.03) can be resolved. High-resolution XRD is a nondestructive, relatively rapid technique for…”
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Conference Proceeding Journal Article -
17
Minority-carrier properties of GaAs on silicon
Published in Applied physics letters (18-07-1988)“…The minority-carrier lifetimes of the heteroepitaxial system of GaAs on Si are limited by recombination at mismatch dislocations. Here we show that increasing…”
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Journal Article -
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Advances in composition control for 16 mu m LPE P-on-n HgCdTe heterojunction photodiodes for remote sensing applications at 60 K
Published in Journal of electronic materials (01-01-1999)“…With good composition control in both p-type cap and n-type base LPE layers, it is possible to make barrier-free two-layer P-on-n HgCdTe heterojunction…”
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19
HgCdTe photodetectors with negative luminescent efficiencies >80
Published in Applied physics letters (14-05-2001)“…We have characterized the negative luminescent properties of photovoltaic HgCdTe detector structures with a room-temperature cutoff of 4.2 μm. Using an optical…”
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20
Sequential etch analysis of electron injection in p+-GaAs
Published in IEEE transactions on electron devices (01-07-1988)“…The influence of heavy impurity doping of electron injection currents in p+- n diodes is investigated experimentally. By extracting the n = 1 diffusion current…”
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