Search Results - "TIMMERING, C. E"
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Observation of zero-dimensional states in a one-dimensional electron interferometer
Published in Physical review letters (22-05-1989)“…Electron transport in a one-dimensional electron interferometer is studied. The apparatus consists of a disk-shaped two-dimensional electron gas, to which…”
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2
Transport through a finite one-dimensional crystal
Published in Physical review letters (16-07-1990)Get full text
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3
Selective population and detection of edge channels in the fractional quantum hall regime
Published in Physical review letters (05-02-1990)Get full text
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4
Boron Vapour Phase Doping of Silicon for Bipolar Device Applications
Published in Japanese Journal of Applied Physics (01-10-1999)“…Boron vapour-phase doping (VPD) has been investigated as a possible processing tool for defect-free applications in shallow, vertical and deep junctions in…”
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5
Submicron YBa2Cu3O7-δ-Ag-YBa2Cu3O7-δ superconducting proximity junctions
Published in Applied physics letters (02-09-1991)“…Using a deep submicron structuring process for oxide superconducting films, we have fabricated planar YBa2Cu3O7−δ-Ag-YBa2Cu3O7–δ proximity junctions operating…”
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6
Quantum point contact as a local probe of the electrostatic potential contours
Published in Physical review. B, Condensed matter (15-10-1990)Get full text
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7
On the optimization of SiGe-base bipolar transistors
Published in IEEE transactions on electron devices (01-09-1996)“…Advanced epitaxial growth of strained SiGe into a Si substrate enhances the freedom for designing high speed bipolar transistors. Devices can be designed by…”
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8
Copper substrate transfer technology for silicon RF circuits
Published in 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) (2003)“…We present exploratory experiments on the waferscale transfer of silicon RF circuits to copper substrates. This approach allows for a well defined microstrip…”
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Conference Proceeding -
9
Electron-beam collimation with a quantum point contact
Published in Physical review. B, Condensed matter (15-01-1990)Get full text
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10
Permeable Base Transistors with Schottky and junction Gates
Published in ESSDERC '93: 23rd European solid State Device Research Conference (01-09-1993)“…Permeable base transistors (PBT) with metal gates and pn-junction gates have been fabricated with conventional device technology. Measurement results compared…”
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Conference Proceeding -
11
18 ps ECL-gate delay in laterally scaled 30 GHz bipolar transistors
Published in Proceedings of 1994 IEEE International Electron Devices Meeting (1994)“…ECL-gate delays as low as 18 ps have been achieved in conventional bipolar technology, with a cut-off frequency f/sub T/ of 30 GHz. Rather than optimizing…”
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12
Selective-epitaxial base technology with 14 ps ECL-gate delay, for low power wide-band communication systems
Published in Proceedings of International Electron Devices Meeting (1995)“…A silicon bipolar technology is presented that incorporates a selectively epitaxially grown base in a double-polysilicon transistor. Si-bases as well as…”
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Conference Proceeding -
13
Selectively-Implanted Collector Profile Optimisation for High-Speed Vertical Bipolar Transistors
Published in 27th European Solid-State Device Research Conference (1997)Get full text
Conference Proceeding -
14
Submicron YBa2Cu3O(7-delta)-Ag-YBa2Cu3O(7-delta) superconducting proximity junctions
Published in Applied physics letters (02-09-1991)“…A deep submicron structuring process for oxide superconducting films has been used to fabricate planar YBa2Cu3O(7-delta)-Ag-YBa2Cu3O(7-delta) proximity…”
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15
Contact resistance of TiW to Phase Change Material in the amorphous and crystalline states
Published in 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS) (01-10-2009)“…Electrical characterisation of metal to Phase Change Material (PCM) contacts is necessary for optimum power transfer during switching of a Phase Change Random…”
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Conference Proceeding -
16
Merits and limitations of circular TLM structures for contact resistance determination for novel III-V HBTs
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)“…This paper discusses merits and limitations of CTLM (Circular Transfer Length Method) contact resistance assessment test structures. Requiring just one…”
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Conference Proceeding -
17
On the Optimisation of SiGe-Base Bipolar Transistors
Published in ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference (01-09-1995)“…Extensive computer simulations of NPN SiGe-base bipolar transistors were performed to examine the effect of the Ge profile in the electrical characteristics…”
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18
A 34 GHz fT Bipolar Process with High-Energy-Implanted Collector
Published in 27th European Solid-State Device Research Conference (1997)Get full text
Conference Proceeding -
19
Heterojunction bipolar transistors with Si1-x Gex base
Published in ESSDERC '92: 22nd European Solid State Device Research conference (01-09-1992)“…Mesa-isolated bipolar transistors with strained Si 1-x Ge z -base layers, grown by molecular beam epitaxy end atmospheric pressure chemical vapour deposition,…”
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Conference Proceeding