Search Results - "Syre Wiig, Marie"

Combined Degradation and Soiling With Validation Against Independent Soiling Station Measurements by Nygard, Magnus Moe, Skomedal, Asmund Frantzen, Wiig, Marie Syre, Marstein, Erik Stensrud

“…Operation and maintenance (O&M) is needed to limit losses caused by soiling and degradation in PV power plants, but accurate estimates of both mechanisms are…”
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Impurity control in high performance multicrystalline silicon by Stokkan, Gaute, Marisa, Di Sabatino, Søndenå, Rune, Juel, Mari, Autruffe, Antoine, Adamczyk, Krzysztof, Skarstad, Hanna Vaksvik, Ekstrøm, Kai Erik, Wiig, Marie Syre, You, Chang Chuan, Haug, Halvard, M‘Hamdi, Mohammed

“…We report results from a national project about impurities in high performance multicrystalline silicon: Contamination sources, transport routes, interaction…”
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Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection by Søndenå, Rune, Hu, Yu, Juel, Mari, Syre Wiig, Marie, Angelskår, Hallvard

“…Oxygen induced stacking faults (OSFs) are mainly seen in oxygen rich wafers from the seed end of Cz-silicon crystals. In wafers this ring shaped OSF-region…”
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Lifetime spectroscopy with high spatial resolution based on temperature- and injection dependent photoluminescence imaging by Haug, Halvard, Søndenå, Rune, Berg, Amalie, Wiig, Marie Syre

“…In this paper we present a method for performing temperature- and injection dependent lifetime spectroscopy (TIDLS) with high spatial resolution based on…”
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The Influence of Minority Carrier Density on Degradation and Regeneration Kinetics in Multicrystalline Silicon Wafers by Wyller, Guro Marie, Wiig, Marie, Due-Sorensen, Ida, Sondena, Rune

“…The rate at which silicon solar cells and wafers degrade and regenerate when subjected to light and elevated temperatures (LeTID) is known to depend on the…”
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Is It Possible to Unambiguously Assess the Presence of Two Defects By Temperature- and Injection-Dependent Lifetime Spectroscopy? by Narland, Tine U., Bernardini, Simone, Wiig, Marie Syre, Bertoni, Mariana I.

“…This paper comprehends a systematic study of the prospects for an unambiguous assessment of the presence of two separate defects in silicon samples analyzed by…”
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