Search Results - "Suzuki, Mineharu"

Raw-to-repository characterization data conversion for repeatable, replicable, and reproducible measurements by Suzuki, Mineharu, Nagao, Hiroko, Harada, Yoshitomo, Shinotsuka, Hiroshi, Watanabe, Katsumi, Sasaki, Akito, Matsuda, Asahiko, Kimoto, Koji, Yoshikawa, Hideki

“…The National Institute for Materials Science, Japan, has been developing a materials data platform linked with a materials data repository system for rapid new…”
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Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use by KOBATA, Masaaki, PÍŠ, Igor, IWAI, Hideo, YAMAZUI, Hiromichi, TAKAHASHI, Hiroaki, SUZUKI, Mineharu, MATSUDA, Hiroyuki, DAIMON, Hiroshi, KOBAYASHI, Keisuke

“…This article reports development of a practical laboratory hard X-ray photoelectron spectroscopy (HXPS) system by combining a focused monochromatic Cr Kα X-ray…”
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Characterization and electrochemical properties of highly dispersed copper oxide/hydroxide nanoparticles in graphite-like carbon films prepared by RF sputtering method by You, Tianyan, Niwa, Osamu, Tomita, Masato, Ando, Hiroshi, Suzuki, Mineharu, Hirono, Shigeru

“…We prepared 4.5% and 2.6% copper oxide/hydroxide nanoparticle highly dispersed in graphite-like carbon film (Cu–NDC) by RF co-sputtering copper and carbon…”
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The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beam by Miyayama, Takuya, Sanada, Noriaki, Iida, Shin-ichi, Hammond, John S., Suzuki, Mineharu

“…The effect of angle of incidence of C60 ion beam for low damage polymer depth profiling on TOF-SIMS and XPS has been investigated. In this study, TOF-SIMS and…”
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Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy by SUZUKI, Mineharu, URUSHIHARA, Nobuaki, SANADA, Noriaki, PAUL, Dennis F., BRYAN, Scott, HAMMOND, John S.

“…Cross-sections of GaAs/AlAs thin films prepared by cleavage of MBE-grown superlattices have been analyzed with Auger electron spectroscopy with a spatial…”
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Improvement of thermal stability of Ni silicide on N +–Si by direct deposition of group III element (Al, B) thin film at Ni/Si interface by Tsutsui, Kazuo, Shiozawa, Takashi, Nagahiro, Koji, Ohishi, Yoshihisa, Kakushima, Kuniyuki, Ahmet, Parhat, Urushihara, Nobuyuki, Suzuki, Mineharu, Iwai, Hiroshi

“…The direct deposition of a thin Al or B layer at Ni/Si interface was proposed as a new method to solve a problem of degraded thermal stability of Ni silicide…”
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Quantification in high-energy resolution Auger electron spectroscopy; Proposal of a reference target convolution technique for direct spectra by Watanabe, Katsumi, Watanabe, Daisuke, Mamiya, Kazutoshi, Koizumi, Seiji, Sanada, Noriaki, Suzuki, Mineharu

“…Currently, high-energy resolution Auger electron spectroscopy (AES) is utilized for chemical-state qualitative analysis, such as x-ray photoelectron…”
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Peak intensities in Auger electron spectroscopy for quantification: Relationship between differentiated spectral intensities and direct peak areas by Watanabe, Katsumi, Watanabe, Daisuke, Mamiya, Kazutoshi, Koizumi, Seiji, Sanada, Noriaki, Suzuki, Mineharu

“…In Auger electron spectroscopy, qualitative analyses are performed by using high-energy resolution direct spectra with a spherical capacitor analyzer (SCA)…”
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Atomic configuration dependent secondary electron emission from reconstructed silicon surfaces by HOMMA, Y, SUZUKI, M, TOMITA, M

“…We show that domains of reconstructed silicon surfaces can be imaged by secondary electrons (SEs) using an ultrahigh vacuum scanning electron microscope with a…”
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Incident Angle Dependence in Polymer TOF-SIMS Depth Profiling with C60 Ion Beams by Iida, Shin-ichi, Miyayama, Takuya, Sanada, Noriaki, Suzuki, Mineharu, Fisher, Gregory L., Bryan, Scott R.

“…Cluster ions such as C60+ are well used as the sputtering ions for polymer depth profiling. The molecules of analyte surfaces are occasionally damaged by the…”
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Development of Combinatorial Ion Implantation System by Sato, Yoshiyuki, Sakaguchi, Isao, Suzuki, Mineharu, Haneda, Hajime

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Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams by Miyayama, Takuya, Sanada, Noriaki, Bryan, Scott R., Hammond, John S., Suzuki, Mineharu

“…An Ar Gas Cluster Ion Beam (GCIB) has been shown to remove previous Ar+ ion beam‐induced surface damage to a bulk polyimide (PI) film. After removal of the…”
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Efficiency of automated peak identification with daily used commercial software for X-ray photoelectron spectra - report from VAMAS/TWA 2/A 9 project by Suzuki, Mineharu, Fukushima, Sei, Tanuma, Shigeo

“…In the first step of X‐ray photoelectron spectroscopy (XPS) analysis, photoelectron peaks in a survey spectrum for the specimen of interest are generally…”
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Observation of atomic step morphology on silicon oxide surfaces by Homma, Yoshikazu, Suzuki, Mineharu, Yabumoto, Norikuni

“…Atomic step structures on oxidized Si(111) surfaces are investigated by scanning electron microscopy with grazing incidence of the primary electron beam and by…”
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The effect of angle of incidence to low damage sputtering of organic polymers using a C 60 ion beam by Miyayama, Takuya, Sanada, Noriaki, Iida, Shin-ichi, Hammond, John S., Suzuki, Mineharu

“…The effect of angle of incidence of C 60 ion beam for low damage polymer depth profiling on TOF-SIMS and XPS has been investigated. In this study, TOF-SIMS and…”
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Observation of atomic defects on LiF(100) surface with ultrahigh vacuum atomic force microscope (UHV AFM) by OHTA, M, KONISHI, T, SUGAWARA, Y, MORITA, S, SUZUKI, M, ENOMOTO, Y

“…We have constructed an atomic force microscope (AFM) operating under an ultrahigh vacuum (UHV). We have imaged the cleaved (100) surface of LiF ionic crystal…”
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Surface characteristics and electrical properties of PMMA chips for incubation-type planar-patch-clamp biosensors by Obuliraj, Senthilkumar, Takada, Noriko, Wang, Zhi-Hong, Kobayashi, Kei, Nagaoka, Yasutaka, Kim, Jongduk, Suzuki, Mineharu, Hirose, Yoshito, Utsumi, Yuichi, Urisu, Tsuneo

“…Polymethylmethacrylate (PMMA) plates were successfully applied as sensor chips in an incubation-type planar patch clamp (IPPC). Hot embossing both sides formed…”
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Photoemission study of PbIn alloy surface segregation using synchrotron radiation by SUZUKI, M

“…PbIn alloy surfaces were examined using photoemission spectroscopy with synchrotron radiation. Pb segregation was revealed in the surface subnanometer region…”
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Roughness Evaluation of Thermally Oxidized Si(111) Surfaces by Scanning Force Microscopy by Suzuki, Mineharu, Homma, Yoshikazu, Yukie Kudoh, Yukie Kudoh, Norikuni Yabumoto, Norikuni Yabumoto

“…We used scanning force microscopy to evaluate the surface roughness of thermally oxidized Si(111). The initial surface, before oxidation, consisted of…”
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Real-time observation of (1×1)-(7×7) phase transition on vicinal Si(111) surfaces by scanning tunneling microscopy by SUZUKI, M, HIBINO, H, HOMMA, Y, FUKUDA, T, SATO, T, IWATSUKI, M, MIKI, K, TOKUMOTO, H

“…Scanning tunneling microscopy of a Si(111) surface with a misorientation of 10° reveals that the (7×7) domains form stripes whose widths are quantized in units…”
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