Search Results - "Surawanitkun, C."

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  1. 1

    Switching Performance Comparison With Low Switching Energy Due to Initial Temperature Increment in CoFeB/MgO-Based Single and Double Barriers by Teso, B., Siritaratiwat, A., Kaewrawang, A., Kruesubthaworn, A., Namvong, A., Sainon, S., Surawanitkun, C.

    Published in IEEE transactions on electron devices (01-09-2019)
    “…Spin-transfer torque magnetic random-access memory (STT-MRAM) based on a single-barrier magnetic tunnel junction (SBMTJ) and a double-barrier magnetic tunnel…”
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    Journal Article
  2. 2

    Modeling of switching energy of magnetic tunnel junction devices with tilted magnetization by Surawanitkun, C., Kaewrawang, A., Siritaratiwat, A., Kruesubthaworn, A., Sivaratana, R., Jutong, N., Mewes, C.K.A., Mewes, T.

    “…For spin transfer torque (STT), the switching energy and thermal stability of magnetic tunnel junctions (MTJ) bits utilized in memory devices are important…”
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    Journal Article
  3. 3

    Instability of storage and temperature increment in nanopillars due to human body model electrostatic discharge by Surawanitkun, C., Kaewrawang, A., Imtawil, V., Mewes, C.K.A., Mewes, T., Siritaratiwat, A.

    Published in Journal of electrostatics (01-12-2011)
    “…MRAM relevant to current induced magnetization switching (CIMS) is studied due to thermal increment caused by CIMS. In this paper, the instability of storage…”
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    Journal Article
  4. 4

    Temperature dependence of magnetic properties on switching energy in magnetic tunnel junction devices with tilted magnetization by Teso, B., Kravenkit, S., Sorn-in, K., Kaewrawang, A., Kruesubthaworn, A., Siritaratiwat, A., Mewes, T., Mewes, C.K.A., Surawanitkun, C.

    Published in Applied surface science (01-04-2019)
    “…•This study focuses on the magnetic properties of MTJ based STT-MRAM.•Initial temperature increment in the device influences to the magnetic…”
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    Journal Article
  5. 5

    Magnetic Instability in Tunneling Magnetoresistive Heads Due to Temperature Increase During Electrostatic Discharge by Surawanitkun, C., Kaewrawang, A., Siritaratiwat, A., Kruesubthaworn, A., Sivaratana, R., Jutong, N., Mewes, C. K. A., Mewes, T.

    “…Recently, there has been a growing interest in the effects of electrostatic discharge (ESD) failure on tunneling magnetoresistive (TMR) recording heads because…”
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    Magazine Article