Search Results - "Sung, Hyunju"
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Recessed Channel Fin Field-Effect Transistor Cell Technology for Future-Generation Dynamic Random Access Memories
Published in Japanese Journal of Applied Physics (01-04-2008)Get full text
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A Full FinFET DRAM Core Integration Technology Using a Simple Selective Fin Formation Technique
Published in 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers (2006)“…A full FinFET DRAM core which consists of McFETs for both the sense amplifiers and the sub-word drivers, as well as FinFETs for the memory cell array has been…”
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Conference Proceeding