Search Results - "Styblinski, M A"

Parameter extraction for statistical IC modeling based on recursive inverse approximation by Ming Qu, Styblinski, M.A.

“…An accurate and efficient parameter extraction methodology, utilizing a new technique called recursive inverse approximation (RIA), is proposed for statistical…”
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Drift reliability optimization in IC design: generalized formulation and practical examples by Styblinski, M.A., Huang, M.

“…A generalized formulation of the drift reliability optimization problem is presented. Algorithmic solutions are also proposed. They can be implemented readily…”
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Combination of interpolation and self-organizing approximation techniques-a new approach to circuit performance modeling by Styblinski, M.A., Aftab, S.

“…An interpolation scheme (maximally flat quadratic interpolation (MFQI) and an approximation scheme (group method of data handling (GMDH)) are combined to…”
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Algorithms and Software Tools for IC Yield Optimization Based on Fundamental Fabrication Parameters by Styblinski, M.A., Opalski, L.J.

“…Algorithms, software tools and the relevant methodology for production yield optimization with respect to fundamental technological parameters of the IC…”
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Problems of Yield Gradient Estimation for Truncated Probability Density Functions by Styblinski, M.A.

“…In this paper theoretical possibilities of statistical yield gradient estimation are discussed for those cases where circuit element probability density…”
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Yield optimization for nondifferentiable density functions using convolution techniques by Tang, T.-S., Styblinski, M.A.

“…A method of yield derivative estimation for nondifferentiable or truncated probability-density functions (PDFs) is proposed and applied to yield optimization…”
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Generalization of Yield Optimization Problem: Maximum Income Approach by Opalski, L.J., Styblinski, M.A.

“…An approach to statistical design centering (SDC) based on a simple generalization of the production yield concept is introduced, leading to a new figure of…”
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New efficient approach to statistical delay modeling of CMOS digital combinational circuits by Aftab, Syed A, Styblinski, M A

“…This paper presents one of the first attempts to statistically characterize signal delays of basic CMOS digital combinational circuits using the transistor…”
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A generic software system for drift reliability optimization of VLSI circuits by Huang, Min, Styblinski, M. A.

“…In this paper, a generic software system called GOSSIP DR to perform Drift Reliability (DR) analysis and optimization is presented. This system was developed…”
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Circuit performance variability reduction: Principles, problems, and practical solutions by Styblinski, M A, Zhang, J C

“…The authors present several novel results in the area of variability minimization. They develop a variability gradient formula, give the theoretical conditions…”
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GOSSIP: a generic system for statistical circuit design by Opalski, L. J., Styblinski, M. A.

“…A new unique system called GOSSIP (Generic Optimization System for Statistical Improvement of Performance) is described. GOSSIP can be considered as a new…”
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An approach to VLSI circuit reliability optimization considering the hot electron effects by Huang, M., Styblinski, M.A.

“…An approach to suppressing the degradation caused by hot electron effects is proposed in which releasing the stress of critical transistors by optimal…”
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An efficient cubic spline approach to lifetime estimation (VSLI) by Huang, M., Styblinski, M.A.

“…The problem of VLSI circuit lifetime estimation is discussed. It is shown that lifetime determination is equivalent to finding the smallest zero of a…”
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A screening experiment based statistical design system for MOS VLSI circuits by Zhang, J.C., Styblinski, M.A.

“…A screening-experiment-based system for performance variability optimization of MOS VLSI circuits is described. It uses orthogonal-array-based design of…”
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Modeling circuit performance functions by a combination of physical models and black-box approximation by Styblinski, M.A., Aftab, S.A., Opalski, L.J.

“…Two novel modeling architectures are proposed for combining physically based analytical circuit performance function models with 'black-box' approximations…”
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Design for circuit quality: yield maximization, minimax, and Taguchi approach by Styblinski, M.A.

“…A relationship between yield optimization, deterministic minimax design, and the Taguchi 'on-target' design with variability reduction is established. It is…”
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A systematic approach of statistical modeling and its application to CMOS circuits by Chen, J., Styblinski, M.A.

“…A systematic approach of statistical modeling is developed to analyze and model statistical variations of CMOS transistor model parameters for statistical…”
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Fuzzy cognitive maps, signal flow graphs, and qualitative circuit analysis by Styblinski, Meyer

“…Fuzzy cognitive maps (FCMs) represent a means of fuzzy causal knowledge processing, using the net rather than the traditional tree knowledge representation…”
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Adaptive hierarchical multi-objective fuzzy optimization for circuit design by Rodrigues, B.R.S., Styblinski, M.A.

“…The outline of a methodology for adaptive hierarchical multiobjective function optimization in a fuzzy sense is presented, suitable for circuit optimization…”
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A heuristic global optimization algorithm and its application to CMOS circuit variability minimization by Qu, M., Styblinski, M.A.

“…A global optimization method with heuristic searching methodology is presented. By introducing the strategy of cluster analysis and random reflection…”
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