Search Results - "Stuckelberger, Michael Elias"

X‐ray diffraction with micrometre spatial resolution for highly absorbing samples by Chakrabarti, Prerana, Wildeis, Anna, Hartmann, Markus, Brandt, Robert, Döhrmann, Ralph, Fevola, Giovanni, Ossig, Christina, Stuckelberger, Michael Elias, Garrevoet, Jan, Falch, Ken Vidar, Galbierz, Vanessa, Falkenberg, Gerald, Modregger, Peter

“…X‐ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual…”
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Strain Mapping of CdTe Grains in Photovoltaic Devices by Calvo-Almazan, Irene, Huang, Xiaojing, Yan, Hanfei, Nazaretski, Evgeny, Chu, Yong S., Hruszkewycz, Stephan O., Stuckelberger, Michael Elias, Ulvestad, Andrew P., Colegrove, Eric, Ablekim, Tursun, Holt, Martin V., Hill, Megan O., Maddali, Siddharth, Lauhon, Lincoln J., Bertoni, Mariana I.

“…Strain within grains and at grain boundaries (GBs) in polycrystalline thin-film absorber layers limits the overall performance because of higher defect…”
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Three-dimensional in situ imaging of single-grain growth in polycrystalline In2O3:Zr films by Dzhigaev, Dmitry, Smirnov, Yury, Repecaud, Pierre-Alexis, Marçal, Lucas Atila Bernardes, Fevola, Giovanni, Sheyfer, Dina, Jeangros, Quentin, Cha, Wonsuk, Harder, Ross, Mikkelsen, Anders, Wallentin, Jesper, Morales-Masis, Monica, Stuckelberger, Michael Elias

“…Strain and interactions at grain boundaries during solid-phase crystallization are known to play a significant role in the functional properties of…”
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Strain Mapping of CdTe Grains in Photovoltaic Devices by Calvo-Almazan, Irene, Ulvestad, Andrew P., Colegrove, Eric, Ablekim, Tursun, Holt, Martin V., Hill, Megan O., Maddali, Siddharth, Lauhon, Lincoln J., Bertoni, Mariana I., Huang, Xiaojing, Yan, Hanfei, Nazaretski, Evgeny, Chu, Yong S., Hruszkewycz, Stephan O., Stuckelberger, Michael Elias

“…Strain within grains and at grain boundaries (GBs) in polycrystalline thin-film absorber layers limits the overall performance because of higher defect…”
Get full text