Search Results - "Struski, P."

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  1. 1
    Dynamic force microscopy and Kelvin probe force microscopy of KBr film on InSb( [formula omitted]) surface at submonolayer coverage

    Dynamic force microscopy and Kelvin probe force microscopy of KBr film on InSb( [formula omitted]) surface at submonolayer coverage by Krok, F., Kolodziej, J.J., Such, B., Czuba, P., Struski, P., Piatkowski, P., Szymonski, M.

    Published in Surface science (20-09-2004)
    “…Dynamic force microscopy (DFM) and Kelvin probe force microscopy (KPFM) have been used to study epitaxial growth of KBr film at submonolayer coverage on InSb(0…”
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  2. 2
    Surface topography dependent desorption of alkali halides

    Surface topography dependent desorption of alkali halides by Such, B, Kolodziej, J, Czuba, P, Piatkowski, P, Struski, P, Krok, F, Szymonski, M

    Published in Physical review letters (18-09-2000)
    “…Electron-stimulated desorption of the (100)KBr surface has been investigated in vacuum with noncontact atomic force microscopy and mass spectroscopy. It has…”
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  3. 3
    Frenkel defect interactions at surfaces of irradiated alkali halides studied by non-contact atomic-force microscopy

    Frenkel defect interactions at surfaces of irradiated alkali halides studied by non-contact atomic-force microscopy by Kolodziej, J.J., Such, B., Czuba, P., Krok, F., Piatkowski, P., Struski, P., Szymonski, M., Bennewitz, R., Schär, S., Meyer, E.

    Published in Surface science (01-06-2001)
    “…Irradiation of alkali halide crystal leads to production of Frenkel defects in the crystal bulk. Subsequent diffusion and interactions of these defects with…”
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  4. 4
    Desorption and surface topography changes induced by He+ ion bombardment of alkali halides

    Desorption and surface topography changes induced by He+ ion bombardment of alkali halides by Krok, F., Kolodziej, J.J., Such, B., Czuba, P., Piatkowski, P., Struski, P., Szymonski, M.

    “…Desorption fluxes from alkali halide (RbI, KBr) crystals under 5keV He+ bombardment and the corresponding surface topography evolution were investigated by…”
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  5. 5
    Nano-scale modification of ionic surfaces induced by electronic transitions

    Nano-scale modification of ionic surfaces induced by electronic transitions by Szymonski, M., Kolodziej, J., Such, B., Piatkowski, P., Struski, P., Czuba, P., Krok, F.

    Published in Progress in surface science (01-08-2001)
    “…This paper presents a review of recent experimental and theoretical work on surface modification of alkali halides due to electronic excitations caused by…”
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  6. 6
    STM/nc-AFM investigation of ( n×6) reconstructed GaAs(0 0 1) surface

    STM/nc-AFM investigation of ( n×6) reconstructed GaAs(0 0 1) surface by Such, B., Kolodziej, J.J., Czuba, P., Krok, F., Piatkowski, P., Struski, P., Szymonski, M.

    Published in Surface science (01-05-2003)
    “…We have investigated the n×6 reconstructed GaAs(0 0 1) surface with scanning tunneling and non-contact atomic force microscopy techniques (STM/nc-AFM). For the…”
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  7. 7
    Surface topography dependent desorption of sodium chloride

    Surface topography dependent desorption of sodium chloride by Such, B., Kolodziej, J., Krok, F., Struski, P., Piatkowski, P., Szymonski, M.

    Published in Radiation effects and defects in solids (01-12-2001)
    “…Electron-stimulated desorption (ESD) of NaCl (001) surface was investigated in UHV by means of mass spectroscopy (MS) at various temperatures of the crystal…”
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  8. 8
    Ion-beam-induced surface modification and nanostructuring of AIIIBV semiconductors

    Ion-beam-induced surface modification and nanostructuring of AIIIBV semiconductors by SZYMONSKI, M, KROK, F, STRUSKI, P, KOLODZIEJ, J, SUCH, B

    Published in Progress in surface science (01-12-2003)
    “…Ion-beam-induced modification of InSb (00 1) semiconductor surface has been studied by means of atomic force microscopy and Kelvin probe force microscopy. It…”
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  9. 9
    Ion-beam-induced surface modification and nanostructuring of A IIIB V semiconductors

    Ion-beam-induced surface modification and nanostructuring of A IIIB V semiconductors by Szymonski, M, Krok, F, Struski, P, Kolodziej, J, Such, B

    Published in Progress in surface science (2003)
    “…Ion-beam-induced modification of InSb (0 0 1) semiconductor surface has been studied by means of atomic force microscopy and Kelvin probe force microscopy. It…”
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  10. 10
    Dynamic force microscopy and Kelvin probe force microscopy of KBr film on InSb(0 0 1) surface at submonolayer coverage

    Dynamic force microscopy and Kelvin probe force microscopy of KBr film on InSb(0 0 1) surface at submonolayer coverage by KROK, F, KOLODZIEJ, J. J, SUCH, B, CZUBA, P, STRUSKI, P, PIATKOWSKI, P, SZYMONSKI, M

    Published in Surface science (2004)
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  11. 11
    Frenkel defect interactions at surfaces of irradiated alkali halides studied by non-contact atomic-force microscopy

    Frenkel defect interactions at surfaces of irradiated alkali halides studied by non-contact atomic-force microscopy by KOLODZIEJ, J. J, SUCH, B, CZUBA, P, KROK, F, PIATKOWSKI, P, STRUSKI, P, SZYMONSKI, M, BENNEWITZ, R, SCHÄR, S, MEYER, E

    Published in Surface science (2001)
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