Search Results - "Strojwas, Marcin"
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1
The design of patent pools: the determinants of licensing rules
Published in The Rand journal of economics (01-10-2007)“…Patent pools are an important but little-studied economic institution. In this article, we first make a set of predictions about the licensing terms associated…”
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Journal Article -
2
DFI Filler Cells - New Embedded Type of Test Structures for Non-Contact Detection of Electrical Defects on Product Wafers
Published in 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) (21-03-2022)“…A new type of test structures has been developed for process monitoring and defect detection on product wafers. The structures are part of PDF Solutions'…”
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Conference Proceeding -
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Logic characterization vehicle design reflection via layout rewiring
Published in 2016 IEEE International Test Conference (ITC) (01-11-2016)“…Continued scaling of semiconductor fabrication processes has made achieving yield targets increasingly difficult. The design and fabrication of various types…”
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Conference Proceeding -
4
Novel E-beam Techniques for Inspection and Monitoring
Published in 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (06-03-2022)“…In this paper, we report an advanced e-beam defect inspection tool (eProbe®250) and the Design-for- Inspection™ (DFI) system that has been built and deployed…”
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Conference Proceeding -
5
An empirical study of vertical integration in the semiconductor industry
Published 01-01-2005“…Dramatic technological progress in the design and manufacturing of semiconductor chips has been accompanied by the emergence of vertically specialized…”
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Dissertation
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6
An empirical study of vertical integration in the semiconductor industry
“…Dramatic technological progress in the design and manufacturing of semiconductor chips has been accompanied by the emergence of vertically specialized…”
Get full text
Dissertation