Search Results - "Sternberg, A.L"

Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations by Boulghassoul, Y., Massengill, L.W., Sternberg, A.L., Bhuva, B.L., Holman, W.T.

“…In this work, the characteristics of single-event transient (SET) generation and propagation are analyzed in a digital phase-locked loop (DPLL) circuit,…”
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Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing by Amusan, O.A., Massengill, L.W., Baze, M.P., Bhuva, B.L., Witulski, A.F., DasGupta, S., Sternberg, A.L., Fleming, P.R., Heath, C.C., Alles, M.L.

“…Heavy-ion testing of a radiation-hardened-by-design (RHBD) 90 nm dual interlocked cell (DICE latch) shows significant directional sensitivity results impacting…”
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HBD layout isolation techniques for multiple node charge collection mitigation by Black, J.D., Sternberg, A.L., Alles, M.L., Witulski, A.F., Bhuva, B.L., Massengill, L.W., Benedetto, J.M., Baze, M.P., Wert, J.L., Hubert, M.G.

“…A three-dimensional (3D) technology computer-aided design (TCAD) model was used to simulate charge collection at multiple nodes. Guard contacts are shown to…”
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Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry by Warren, K.M., Sternberg, A.L., Weller, R.A., Baze, M.P., Massengill, L.W., Reed, R.A., Mendenhall, M.H., Schrimpf, R.D.

“…Monte-Carlo radiation transport code is coupled with SPICE circuit level simulation to identify regions of single event upset vulnerability in an SEU hardened…”
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Effects of technology scaling on the SET sensitivity of RF CMOS Voltage-controlled oscillators by Boulghassoul, Y., Massengill, L.W., Sternberg, A.L., Bhuva, B.L.

“…We analyze single-event transient (SET) effects in a high-speed voltage-controlled oscillator (VCO) design that is applicable to mixed-signal RF operations…”
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Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology by Balasubramanian, A., Amusan, O.A., Bhuva, B.L., Reed, R.A., Sternberg, A.L., Massengill, L.W., McMorrow, D., Nation, S.A., Melinger, J.S.

“…The presence of single event (SE) induced interconnect crosstalk has been measured and demonstrated experimentally using single and two photon laser absorption…”
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Spatial and temporal characteristics of energy deposition by protons and alpha particles in silicon by Kobayashi, A.S., Sternberg, A.L., Massengill, L.W., Schrimpf, R.D., Weller, R.A.

“…We present spatial and temporal distributions of energy deposition in silicon obtained from Monte Carlo simulations with Geant4. Detailed simulations are…”
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Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation by Pease, R.L., Sternberg, A.L., Boulghassoul, Y., Massengill, L.W., Buchner, S., McMorrow, D., Walsh, D.S., Hash, G.L., LaLumondiere, S.D., Moss, S.C.

“…Generally good agreement is obtained between the single-event output voltage transient waveforms obtained by exposing individual circuit elements of a bipolar…”
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Single-event mitigation in combinational logic using targeted data path hardening by Srinivasan, V., Sternberg, A.L., Duncan, A.R., Robinson, W.H., Bhuva, B.L., Massengill, L.W.

“…A technique is proposed to selectively harden complex combinational logic circuits to single-event (SE) upsets. Propagation paths with sensitive nodes are…”
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Proton radiation response mechanisms in bipolar analog circuits by Barnaby, H.J., Schrimpf, R.D., Sternberg, A.L., Berthe, V., Cirba, C.R., Pease, R.L.

“…The experimental data presented in this paper indicate that the doping and geometry of critical transistors are the primary factors that affect the proton…”
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Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis by Boulghassoul, Y., Massengill, L.W., Sternberg, A.L., Pease, R.L., Buchner, S., Howard, J.W., McMorrow, D., Savage, M.W., Poivey, C.

“…This work presents the development of a transistor-level circuit model of the LM124 operational amplifier specifically engineered and calibrated for analog…”
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Evaluating average and atypical response in radiation effects simulations by Weller, R.A., Sternberg, A.L., Massengill, L.W., Schrimpf, R.D., Fleetwood, D.M.

“…We examine the limits of performing single-event simulations using pre-averaged radiation events. Geant4 simulations show the necessity, for future devices, to…”
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The role of parasitic elements in the single-event transient response of linear circuits by Sternberg, A.L., Massengill, L.W., Buchner, S., Pease, R.L., Boulghassoul, Y., Savage, M.W., McMorrow, D., Weller, R.A.

“…Parasitic elements can play an important role in the single-event transient sensitivity of a circuit. This work describes how parasitics can affect the…”
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Temperature dependence and irradiation response of 1/f-noise in MOSFETs by Xiong, H.D., Fleetwood, D.M., Choi, B.K., Sternberg, A.L.

“…Measured the 1/f-noise of 3 /spl mu/m/spl times/16 /spl mu/m nMOS transistors with gate-oxide thickness of 48 nm as a function of frequency (f), gate voltage…”
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Total dose effects on double gate fully depleted SOI MOSFETs by Bongim Jun, Xiong, H.D., Sternberg, A.L., Cirba, C.R., Dakai Chen, Schrimpf, R.D., Fleetwood, D.M., Schwank, J.R., Cristoloveanu, S.

“…Total ionizing dose effects on fully-depleted (FD) silicon-on-insulator (SOI) transistors are studied when the devices are operated in single gate (SG) and…”
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Effect of amplifier parameters on single-event transients in an inverting operational amplifier by Sternberg, A.L., Massengill, L.W., Schrimpf, R.D., Boulghassoul, Y., Barnaby, H.J., Buchner, S., Pease, R.L., Howard, J.W.

“…Laser data and simulation tools are combined to investigate the single-event transient response of the LM124 operational amplifier. The effect of the bandwidth…”
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Patterns of Growth and Decline in Lung Function in Persistent Childhood Asthma by McGeachie, Michael J, Yates, Katherine P, Zhou, Xiaobo, Guo, Feng, Sternberg, Alice L, Van Natta, Mark L, Wise, Robert A, Szefler, Stanley J, Sharma, Sunita, Kho, Alvin T, Cho, Michael H, Croteau-Chonka, Damien C, Castaldi, Peter J, Jain, Gaurav, Sanyal, Amartya, Zhan, Ye, Lajoie, Bryan R, Dekker, Job, Stamatoyannopoulos, John, Covar, Ronina A, Zeiger, Robert S, Adkinson, N. Franklin, Williams, Paul V, Kelly, H. William, Grasemann, Hartmut, Vonk, Judith M, Koppelman, Gerard H, Postma, Dirkje S, Raby, Benjamin A, Houston, Isaac, Lu, Quan, Fuhlbrigge, Anne L, Tantisira, Kelan G, Silverman, Edwin K, Tonascia, James, Weiss, Scott T, Strunk, Robert C

“…Data from a controlled trial of asthma treatment that enrolled patients in the first decade of life were combined with follow-up data to provide novel…”
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Comparison of SEUTool results to experimental results in boeing radiation tolerant DSP (BDSP C30) by Duncan, A.R., Srinivasan, V., Sternberg, A.L., Robinson, W.H., Bhuva, B.L., Massengill, L.W.

“…A CAD tool (SEUTool) is analyzed for simulating single-event upsets (SEUs) in large combinational logic circuits. SEUTool cross-section results show excellent…”
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Education Outcomes in a Duty-Hour Flexibility Trial in Internal Medicine by Desai, Sanjay V, Asch, David A, Bellini, Lisa M, Chaiyachati, Krisda H, Liu, Manqing, Sternberg, Alice L, Tonascia, James, Yeager, Alyssa M, Asch, Jeremy M, Katz, Joel T, Basner, Mathias, Bates, David W, Bilimoria, Karl Y, Dinges, David F, Even-Shoshan, Orit, Shade, David M, Silber, Jeffrey H, Small, Dylan S, Volpp, Kevin G, Shea, Judy A

“…Internal medicine residency programs were randomly assigned to standard duty-hour policies or to flexible policies without limits on shift length and time off…”
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Application determination of single-event transient characteristics in the LM 111 comparator by Sternberg, A.L., Massengill, L.W., Schrimpf, R.D., Calvel, P.

“…The effect of an integrated circuit's application can have a profound effect on its single-event transient response. This paper demonstrates how small changes…”
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