Search Results - "Stenzel, Olaf"

Broadband antireflective surface-relief structure for THz optics by Brückner, Claudia, Pradarutti, Boris, Stenzel, Olaf, Steinkopf, Ralf, Riehemann, Stefan, Notni, Gunther, Tünnermann, Andreas

“…The requirements for a broadband antireflective structure in the THz spectral region are derived. Optimized structural parameters for a surface-relief grating…”
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Putrescine N-methyltransferase in Solanum tuberosum L., a calystegine-forming plant by Stenzel, O, Teuber, M, Drager, B

“…Putrescine N-methyltransferase (PMT, EC 2.1.1.53) catalyses the first specific step in the biosynthesis of tropane and nicotine alkaloids. Potato (Solanum…”
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Characterization of metal-oxide thin films deposited by plasma-assisted reactive magnetron sputtering by Stefan Jakobs, Stefan Jakobs, Marc Lappschies, Marc Lappschies, Uwe Schallenberg, Uwe Schallenberg, Olaf Stenzel, Olaf Stenzel, Steffen Wilbrandt, Steffen Wilbrandt

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All-oxide broadband antireflection coatings by plasma ion assisted deposition: design, simulation, manufacturing and re-optimization by Wilbrandt, Steffen, Stenzel, Olaf, Kaiser, Norbert

“…A new all-oxide design for broadband antireflection coatings with significantly reduced impact of deposition errors to the final reflectance is presented…”
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Influence of temperature and plasma parameters on the properties of PEALD HfO2 by Lapteva, Margarita, Beladiya, Vivek, Riese, Sebastian, Hanke, Phillip, Otto, Felix, Fritz, Torsten, Schmitt, Paul, Stenzel, Olaf, Tünnermann, Andreas, Szeghalmi, Adriana

“…HfO2 has promising applications in semiconductors and optics due to its high dielectric constant and high refractive index. In this work, HfO2 thin films were…”
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Re-engineering of optical constants and layer thicknesses from in situ broadband monitoring: an oscillator model approach by Stenzel, Olaf, Wilbrandt, Steffen, Harhausen, Jens, Foest, Rüdiger

“…We present and discuss an in situ optical characterization methodology for calculating individual film thicknesses and optical constants of a multilayer…”
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Influence of temperature and plasma parameters on the properties of PEALD HfO 2 by Lapteva, Margarita, Beladiya, Vivek, Riese, Sebastian, Hanke, Phillip, Otto, Felix, Fritz, Torsten, Schmitt, Paul, Stenzel, Olaf, Tünnermann, Andreas, Szeghalmi, Adriana

“…HfO 2 has promising applications in semiconductors and optics due to its high dielectric constant and high refractive index. In this work, HfO 2 thin films…”
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AZO/Ag/AZO transparent conductive films: correlation between the structural, electrical, and optical properties and development of an optical model by Bingel, Astrid, Stenzel, Olaf, Naujok, Philipp, Müller, Robert, Shestaeva, Svetlana, Steglich, Martin, Schulz, Ulrike, Kaiser, Norbert, Tünnermann, Andreas

“…Multilayer transparent electrodes consisting of a tri-layer structure of Al-doped zinc oxide and silver (AZO/Ag/AZO) prepared by inline DC magnetron sputtering…”
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Optical properties of UV-transparent aluminum oxide / aluminum fluoride mixture films, prepared by plasma-ion assisted evaporation and ion beam sputtering by Stenzel, Olaf, Wilbrandt, Steffen, Du, Shan, Franke, Christian, Kaiser, Norbert, Tünnermann, Andreas, Mende, Mathias, Ehlers, Henrik, Held, Mario

“…Electron beam evaporation (without and with plasma assistance) as well as ion beam sputtering are used to prepare optical mixture coatings for applications in…”
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Optische Konstanten von Substraten im NIR/MIR‐Spektralbereich: Bestimmung mittels Fourier‐Transform‐Infrarot‐(FTIR‐)Spektrometrie by Franke, Christian, Stenzel, Olaf, Wilbrandt, Steffen, Schürmann, Mark, Wolf, Josephine, Todorova, Vera, Doherty, Brenda, Kaiser, Norbert

“…Für die Bestimmung der optischen Konstanten von Substraten und auch Einzelschichten im nahen‐ und mittleren Infrarot wurde eine Vorgehensweise entwickelt, die…”
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Optical in-situ process monitoring and control by Gaebler, Johannes, Stenzel, Olaf, Wilbrandt, Steffen, Kaiser, Norbert

“…In situ optical monitoring and process control: Measuring transmittance and reflectance of optical coatings during deposition Optical monitoring techniques…”
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Optische in‐situ Prozessverfolgung und ‐steuerung: Messung des Transmissions‐ und Reflexionsvermögens wachsender Schichten by Gäbler, Johannes, Stenzel, Olaf, Wilbrandt, Steffen, Kaiser, Norbert

“…Optische Monitoringverfahren haben sich im vergangenen Jahrzehnt als unverzichtbarer Bestandteil einer deterministischen Herstellungsstrategie anspruchsvoller…”
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Optische in‐situ Prozessverfolgung und ‐steuerung by Gäbler, Johannes, Stenzel, Olaf, Wilbrandt, Steffen, Kaiser, Norbert

“…Optische Monitoringverfahren haben sich im vergangenen Jahrzehnt als unverzichtbarer Bestandteil einer deterministischen Herstellungsstrategie anspruchsvoller…”
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Optische Konstanten von Substraten im NIR/MIR‐Spektralbereich by Franke, Christian, Stenzel, Olaf, Wilbrandt, Steffen, Schürmann, Mark, Wolf, Josephine, Todorova, Vera, Doherty, Brenda, Kaiser, Norbert

“…Für die Bestimmung der optischen Konstanten von Substraten und auch Einzelschichten im nahen‐ und mittleren Infrarot wurde eine Vorgehensweise entwickelt, die…”
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Spektralfotometrische Messungen bei 60° Einfallswinkel by Wilbrandt, Steffen, Böhme, Matthias, Stenzel, Olaf, Schlegel, Ralph, Kaiser, Norbert

“…Für die Charakterisierung und Qualitätskontrolle optischer Schichten wurde ein VN‐Messeinsatz zur Absolutmessung von Transmission und Reflexion unter 60°…”
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Spectrophotometric measurements at 60 degree angle of incidence by Wilbrandt, Steffen, Bohme, Matthias, Stenzel, Olaf, Schlegel, Ralph, Kaiser, Norbert

“…Spectrophotometric measurements at 60 degree incidence angle A measurement VN-accessory for characterisation and quality control of optical coatings using…”
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Spektralfotometrische Messungen bei 60° Einfallswinkel: Absolutmessung des gerichteten Transmissions‐ und Reflexionsvermögens von Oberflächen und Schichten by Wilbrandt, Steffen, Böhme, Matthias, Stenzel, Olaf, Schlegel, Ralph, Kaiser, Norbert

“…Für die Charakterisierung und Qualitätskontrolle optischer Schichten wurde ein VN‐Messeinsatz zur Absolutmessung von Transmission und Reflexion unter 60°…”
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In-situ broadband monitoring of heterogeneous optical coatings by Wilbrandt, Steffen, Kaiser, Norbert, Stenzel, Olaf

“…An in-situ broadband monitoring system was developed and integrated into a Leybold Syrus Pro 1100 deposition system equipped with an OMS4000 process…”
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Optical and non-optical characterization of Nb2O5–SiO2 compositional graded-index layers and rugate structures by Leitel, Robert, Stenzel, Olaf, Wilbrandt, Steffen, Gäbler, Dieter, Janicki, Vesna, Kaiser, Norbert

“…The deposition of graded-index layers and rugate structures was performed by coevaporation of silicon dioxide as the low index material and niobium pentoxide…”
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Aluminiumbasierte Reflektoren für das DUV und VUV by Wilbrandt, Steffen, Stenzel, Olaf, Heiße, Hanno, Kaiser, Norbert

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