Search Results - "Stanislav Jurecka"

Optical and microstructural properties of electrodeposited cuprous oxide by Jurečka, Stanislav, Sahoo, Prangya P., Čendula, Peter

“…The production of hydrogen fuel using photoelectrochemical water splitting method requires semiconductor materials with suitable energy gap, electrical and…”
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Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method by Shakoury, Reza, Rezaee, Sahar, Mwema, Fredrick, Luna, Carlos, Ghosh, Koushik, Jurečka, Stanislav, Ţălu, Ştefan, Arman, Ali, Grayeli Korpi, Alireza

“…The micromorphology of tantalum pentoxide (Ta 2 O 5 ) thin films, deposited on glass substrates by electron gun method, has been analyzed using atomic force…”
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Investigation of morphological and optical properties of nanostructured layers formed by the SSCT etching of silicon by Jurečka, Stanislav, Imamura, Kentaro, Matsumoto, Taketoshi, Kobayashi, Hikaru

“…[Display omitted] •Forming of the nanostructured SSCT layers.•Analysis of microstructure by statistical, Abbott-Firestone, Fourier and multifractal…”
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Multifractal analysis and optical properties of nanostructured silicon layers by Jurečka, Stanislav, Matsumoto, Taketoshi, Imamura, Kentaro, Kobayashi, Hikaru

“…[Display omitted] •SSCT etching of silicon.•Anizotropic etching.•Multifractal detrended fluctuation analysis of SEM and AFM images.•Fourier analysis of SEM and…”
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Influence of film thickness on structural, optical, and electrical properties of sputtered nickel oxide thin films by Rezaee, Sahar, Korpi, Alireza Grayeli, Karimi, Maryam, Jurečka, Stanislav, Arman, Ali, Luna, Carlos, Ţălu, Ştefan

“…Utilizing radio frequency magnetron sputtering, we successfully fabricated nickel oxide thin films with different thickness (from 80 to 270 nm), and conducted…”
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Prepared σ-MnO2 thin films by chemical bath deposition methods and study of its optical and microstructure properties by Astinchap, Bandar, Moradian, Rostam, Namdari, Tahereh, Jurečka, Stanislav, Ţălu, Ştefan

“…In this work, σ-MnO 2 thin films deposited by chemical bath deposition method at three concentration of solution. The influence of concentration on thickness,…”
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Investigation of deposition temperature effect on spatial patterns of MgF2 thin films by Shakoury, Reza, Matos, Robert Saraiva, Fonseca Filho, Henrique Duarte, Rezaee, Sahar, Arman, Ali, Boochani, Arash, Jurečka, Stanislav, Zelati, Amir, Mardani, Mohsen, Ţălu, Ştefan

“…In this work, the atomic force microscopy (AFM) technique was used to characterize 3D MgF2 thin film surfaces through advanced analysis involving…”
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Multifractal analysis of textured silicon surfaces by Jurečka, Stanislav, Angermann, Heike, Kobayashi, Hikaru, Takahashi, Masao, Pinčík, Emil

“…•We prepared pyramidal textures at Si with different shape distributions.•The texture morphology properties were examined by statistical and fractal methods…”
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Optical Properties of Porous Silicon Solar Cells for Use in Transport by Martin Kralik, Michaela Hola, Stanislav Jurecka

“…Porous silicon (pSi) samples were prepared by electrochemical etching of p-type silicon (p-type Si) substrate. Three pSi samples with different parameters of…”
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Microstructure, fractal geometry and corrosion properties of CrN thin films: The effect of shot number and angular position by Habibi, Maryam, Mirzaei, Saeed, Arman, Ali, Jurečka, Stanislav, Sadeghi, Mohammad, Zelati, Amir, Shakoury, Reza, Tanhaee, Ehsan, Ghobadi, Nader, Ehteram, Hamid, Ţălu, Ştefan

“…The effect of different plasma focus shots and angular positions (0° and 30°) on the properties of chromium nitride (CrN) coatings, deposited by a plasma focus…”
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Statistical and Fractal Analysis of Random Height Function by Stanislav Jurecka, Maria Jureckova

“…Nanostructured semiconductor surfaces are commonly used for suppression of the light reflection. We prepared several kinds of surface structures on silicon…”
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Analysis of Photoluminiscence in the NCSI-DMA System by Stanislav Jurecka, Kentaro Imamura, Taketoshi Matsumoto, Hikaru Kobayashi

“…Silicon nanocrystalline particles (ncSi) were fabricated from the Si swarf using the beads milling method. Observed photoluminiscence spectra (PL) of the ncSi…”
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Properties of charge states in MOS structure with ultrathin oxide layer by Jurečka, Stanislav, Kobayashi, Hikaru, Takahashi, Masao, Matsumoto, Taketoshi, Pinčík, Emil

“…► Study of space and energy quantization effects in a MOS structure with ultrathin NAOS oxide layer. ► Analysis of electrical properties of NAOS oxide layer by…”
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Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM) by Ţălu, Ştefan, Yadav, Ram Pratap, Ali, Arman, Alireza Grayeli Korpi, Sobola, Dinara, Ţălu, Mihai, Rezaee, Sahare, Achour, Amine, Jurečka, Stanislav, Mardani, Mohsen

“…Fractal concepts are used to explore how different energies (10, 20 and 50 keV) and fluence of 5 × 1017 N+ cm−2 affect the morphology of nickel thin film. The…”
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Ofstatistical and Fractal Properties of Semiconductor Surface Roughness by Jurecka, Stanislav, Jureckova, Maria, Kobayashi, Hikaru, Takahashi, Masao, Madani, Mohammad, Pincik, Emil

“…Surface morphology evolution is of primary significance for the thin-film growth and modification of surface andinterface states. Surface and interface states…”
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Thin Film Solar Cells and their Optical Properties by Jurecka, Stanislav, Pincik, Emil, Brunner, Robert

“…In this work we report on the optical parameters of the semiconductor thin film for solar cell applications determination. The method is based on the dynamical…”
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Passivation of Si-based structures in HCN and KCN solutions by Pinčík, Emil, Kobayashi, Hikaru, Rusnák, Jaroslav, Takahashi, Masao, Mikula, Milan, Kim, Woo Byoung, Kučera, Michal, Brunner, Robert, Jurečka, Stanislav

“…► Confirmation of high efficiency KCN and HCN passivation procedures. ► Decrease of number of nonradiation transitions. ► Decrease of interface defect states…”
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Genetic Synthesis of the Diffraction Profile by Jurecka, Stanislav, Havlik, Milan, Jureckova, Maria

“…In this paper we describe theoretical synthesis of the x-ray diffraction line profile as a superposition of the spectral components Ka1 and Ka2 optimized to…”
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On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties by Jurečka, Stanislav, Kobayashi, Hikaru, Takahashi, Masao, Matsumoto, Taketoshi, Jurečková, Mária, Chovanec, Ferdinand, Pinčík, Emil

“…The surface roughness of the semiconductor substrate substantially influences properties of the whole semiconductor/oxide structure. SiO2/Si structures were…”
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Effect of annealing on the micromorphology and corrosion properties of Ti/SS thin films by Rezaee, Sahar, Arman, Ali, Jurečka, Stanislav, Korpi, Alireza Grayeli, Mwema, Fredrick, Luna, Carlos, Sobola, Dinara, Kulesza, Sławomir, Shakoury, Reza, Bramowicz, Mirosław, Ahmadpourian, Azin

“…Ti and TiN thin films were deposited by means of electron beam evaporation on stainless steel substrates, and subsequently annealed at different temperatures…”
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