Search Results - "Stanford, V.M."
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Measurements for the reliability and electrical characterization of semiconductor nanowires
Published in 2008 IEEE International Reliability Physics Symposium (01-04-2008)“…Nanoelectronic devices based upon self-assembled semiconductor nanowires are excellent research tools for investigating the behavior of structures with…”
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Conference Proceeding -
2
Electronic Detection of Biomolecules
Published in 2008 Device Research Conference (01-06-2008)“…We are developing metrologies that could enable the rapid screening of therapeutic agents against anthrax infection, determine the structure-function…”
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Conference Proceeding