Search Results - "Stanchu, H. V."

Modelling of X-ray diffraction curves for GaN nanowires on Si(111) by Kladko, V.P., Kuchuk, А.V., Stanchu, H.V., Safriuk, N.V., Belyaev, A.E., Wierzbicka, A., Sobanska, M., Klosek, K., Zytkiewicz, Z.R.

“…X-ray diffraction curves and reciprocal space maps from self induced GaN nanowires on Si(111) substrates were examined theoretically and experimentally…”
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Strain relaxation in GaN/AlN superlattices on GaN(0001) substrate: Combined superlattice-to-substrate lattice misfit and thickness-dependent effects by Stanchu, H.V., Kuchuk, A.V., Lytvyn, P.M., Mazur, Yu.I., Maidaniuk, Y., Benamara, M., Li, Shibin, Kryvyi, S., Kladko, V.P., Belyaev, A.E., Wang, Zh.M., Salamo, G.J.

“…•A new X-ray diffraction technique to determine the thickness and strain state of the SL (superlattice) quantum well/barrier layers has been developed.•The…”
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Modelling of X-ray diffraction curves for GaN nanowires on Si(1 1 1) by Kladko, V P, Kuchuk, A V, Stanchu, H V, Safriuk, N V, Belyaev, A E, Wierzbicka, A, Sobanska, M, Klosek, K, Zytkiewicz, Z R

“…X-ray diffraction curves and reciprocal space maps from self induced GaN nanowires on Si(1 1 1) substrates were examined theoretically and experimentally…”
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Investigation of Plasmon Gold Film Nanostructures by Means of both X-Ray Reflectometry and Diffractometry by Gudymenko, O. Y., Kryvyi, S. B., Stanchu, H. V., Kladko, V. P., Safryuk, N. V., Slobodian, M. V.

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Deformation state of short-period AlGaN/GaN superlattices at different well-barrier thickness ratios by Kladko, V.P.

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