Search Results - "Stanchev, Todor"

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  1. 1

    Charge Storage and Reliability Characteristics of Nonvolatile Memory Capacitors with HfO2/Al2O3-Based Charge Trapping Layers by Spassov, Dencho, Paskaleva, Albena, Guziewicz, Elżbieta, Wozniak, Wojciech, Stanchev, Todor, Ivanov, Tsvetan, Wojewoda-Budka, Joanna, Janusz-Skuza, Marta

    Published in Materials (09-09-2022)
    “…Flash memories are the preferred choice for data storage in portable gadgets. The charge trapping nonvolatile flash memories are the main contender to replace…”
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    Journal Article
  2. 2

    Charge Storage and Reliability Characteristics of Nonvolatile Memory Capacitors with HfO[sub.2]/Al[sub.2]O[sub.3]-Based Charge Trapping Layers by Spassov, Dencho, Paskaleva, Albena, Guziewicz, Elżbieta, Wozniak, Wojciech, Stanchev, Todor, Ivanov, Tsvetan, Wojewoda-Budka, Joanna, Janusz-Skuza, Marta

    Published in Materials (01-09-2022)
    “…Flash memories are the preferred choice for data storage in portable gadgets. The charge trapping nonvolatile flash memories are the main contender to replace…”
    Get full text
    Journal Article
  3. 3

    Radiation Tolerance and Charge Trapping Enhancement of ALD HfO 2 /Al 2 O 3 Nanolaminated Dielectrics by Spassov, Dencho, Paskaleva, Albena, Guziewicz, Elżbieta, Davidović, Vojkan, Stanković, Srboljub, Djorić-Veljković, Snežana, Ivanov, Tzvetan, Stanchev, Todor, Stojadinović, Ninoslav

    Published in Materials (10-02-2021)
    “…High- dielectric stacks are regarded as a promising information storage media in the Charge Trapping Non-Volatile Memories, which are the most viable…”
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    Journal Article
  4. 4

    Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics by Spassov, Dencho, Paskaleva, Albena, Guziewicz, Elżbieta, Davidović, Vojkan, Stanković, Srboljub, Djorić-Veljković, Snežana, Ivanov, Tzvetan, Stanchev, Todor, Stojadinović, Ninoslav

    Published in Materials (10-02-2021)
    “…High-k dielectric stacks are regarded as a promising information storage media in the Charge Trapping Non-Volatile Memories, which are the most viable…”
    Get full text
    Journal Article