Search Results - "Srinivasa Rao, Vempati"
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Chemical reaction impact on MHD natural convection flow through porous medium past an exponentially stretching sheet in presence of heat source/sink and viscous dissipation
Published in Case studies in thermal engineering (01-06-2021)“…This study investigates the viscous dissipation impact on free convection MHD flow through a porous medium over an exponentially stretching surface in presence…”
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Impact of porosity on two-dimensional unsteady MHD boundary layer heat and mass transfer stagnation point flow with radiation and viscous dissipation
Published in Numerical heat transfer. Part A, Applications (17-04-2024)“…The purpose of the present research is to examine the effect of porosity in the presence of radiation and viscous dissipation on two-dimensional unsteady MHD…”
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Multi-Chiplet Heterogeneous Integration Packaging for Semiconductor System Scaling
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11-06-2023)“…Since the invention of the transistor, we have enjoyed tremendous impact of semiconductors on electronic systems. Transistor scaling has played a critical role…”
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Conference Proceeding -
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Panel Warpage of Fan-Out Panel-Level Packaging Using RDL-First Technology
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-02-2020)“…In this study, fan-out panel-level packaging (FO-PLP) technology using a redistribution layer (RDL) first approach is demonstrated using a large glass panel as…”
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Study of Cu Pad Expansion with Surrounding Dielectrics for Hybrid Bonding
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…Copper/dielectric hybrid bonding technology is a key enabler for advanced chip-level (chip-to-chip, chip-to-wafer) or wafer-level (wafer-to-wafer)…”
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Conference Proceeding -
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Low Thermal Budget Fine-pitch Cu/Dielectric Hybrid Bonding with Cu Microstructure Modifications
Published in 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) (28-05-2024)“…Advanced packaging featuring vertical integration has emerged as a crucial technology facilitating high performance, low power consumption, and compatibility…”
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Conference Proceeding -
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Cu/Dielectric hybrid bonding among Glass and Si
Published in 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) (28-05-2024)“…Chaplets and advanced packaging technologies play a pivotal role in meeting the diverse and demanding requirements of data-intensive workloads, by offering…”
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Conference Proceeding -
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Application of Piezoresistive Stress Sensor in Wafer Bumping and Drop Impact Test of Embedded Ultrathin Device
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-06-2012)“…Though an understanding on the development of residual stresses in silicon device after chip level packaging processes has been investigated in previous…”
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Development of Large RDL Interposer Package using RDL-first FOWLP Process
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…In this work, an organic RDL interposer with large package size of 52 x 44 mm consisting of 12 embedded chiplets on a 60 x 60 mm organic substrate has been…”
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Conference Proceeding -
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Cu Damascene Process on Temporary Bonded Wafers for Thin Chip Stacking using Cu-Cu Hybrid Bonding
Published in 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) (01-05-2023)“…Hybrid bonding is one of the innovative permanent bonding technologies that form dielectric-dielectric and metal-metal bonds, respectively. Hybrid bonding is…”
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Conference Proceeding -
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Multi-Chip Stacked Memory Module Development using Chip to Wafer (C2W) Hybrid Bonding for Heterogeneous Integration Applications
Published in 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) (28-05-2024)“…The present study focuses on multi-chip stacked memory module development, and it encompasses a comprehensive overview of critical aspects, key learnings,…”
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Conference Proceeding -
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Process Challenges in Thin Wafers Fabrication with Double Side Hybrid Bond Pads for Chip Stacking
Published in 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) (28-05-2024)“…3D packaging with stacked dies is widely explored as a future advanced packaging technology for applications involving high-performance computing and High…”
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Conference Proceeding -
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Defect evolution during through-silicon via copper electroplating and methods for robust void-free filling
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…Void-free electroplating of copper in high-aspect ratio via structures is an important capability for achieving high-reliability through silicon vias (TSVs)…”
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Conference Proceeding -
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Reliability Assessment of 2.5D Module using Chip to Wafer Hybrid Bonding
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…Wafer to wafer hybrid bonding has been established to form fine pitch interconnections for high density I/O applications [1], [2]. However, this approach has…”
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Conference Proceeding -
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Evaluation of Low Temperature Inorganic Dielectric Materials for Hybrid Bonding Applications
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…High-bandwidth memory (HBM) market is witnessing huge demand for high performance computing. Vertical/3D stacking of memory chips using hybrid bonding is a…”
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Conference Proceeding -
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Polymer Dielectric Materials Evaluation for Hybrid Bonding Applications
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…Hybrid bonding is an emerging technology for advanced packaging and heterogeneous integration. In this work, Cu/polymer-based hybrid bonding is being evaluated…”
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Conference Proceeding -
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Multiple slip effects on steady MHD flow past a non-isothermal stretching surface in presence of Soret, Dufour with suction/injection
Published in International communications in heat and mass transfer (01-05-2022)“…The main purpose of this work is to investigate the influence of multi slip implications on steady-state MHD fluid flow in the occurrence of Soret and Dufour…”
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Journal Article -
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Design, assembly and reliability of large die and fine-pitch Cu/low- k flip chip package
Published in Microelectronics and reliability (01-07-2010)“…This paper reports the design, assembly and reliability assessment of 21 × 21 mm 2 Cu/low- k flip chip (65 nm node) with 150 μm bump pitch and high bump…”
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Development of 4 die stack module using Hybrid bonding approach
Published in 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) (01-05-2023)“…Die stacking is commonly used in memory modules. Solder micro-bumps and through silicon via (TSVs) are common interconnects, and it may not viable or suitable…”
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Conference Proceeding