A New Approach to Increasing the Resolution of a Mass Spectrometer with Wedge-Shaped Reflectors

A New Approach to Increasing the Resolution of a Mass Spectrometer with Wedge-Shaped Reflectors

The paper describes the investigation of the ion-optical properties of a laser TOF mass spectrometer including two successively positioned wedge-shaped ion mirrors. Some specific properties of the configuration of ion trajectories near their reflection in the second ion reflector are found. The depe...

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Bibliographic Details
Published in:Journal of analytical chemistry (New York, N.Y.) Vol. 72; no. 13; pp. 1350 - 1353
Main Authors: Sysoeva, E. A., Spakhov, A. V., Sysoev, Alexander A.
Format: Journal Article
Language:English
Published: Moscow Pleiades Publishing 15-12-2017
Springer
Springer Nature B.V
Subjects:
Aberration
Analytical Chemistry
Chemistry
Chemistry and Materials Science
Innovations
Ion flux
Ion trajectories
Mass spectrometry
Mathematical analysis
Optical mirrors
Optical properties
Polynomials
Reflectors
Wedges
method of aberration correction
wedge-shaped reflector
temporal aberration
resolution
laser ion source
TOF mass analyzer
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Summary:The paper describes the investigation of the ion-optical properties of a laser TOF mass spectrometer including two successively positioned wedge-shaped ion mirrors. Some specific properties of the configuration of ion trajectories near their reflection in the second ion reflector are found. The dependence of aberrations on ion energy acquired toothed shape for the resolution of the analyzer higher than 3000–5000. The approximation of the dependence gave a 15 th degree polynomial. The calculation of polynomial coefficients showed a great contribution to the duration of ion packets for aberrations of higher order. The discovered features allowed us to suggest a way of the local correction of nearby trajectories in the total ion flux. By correcting the local motion of individual groups of ions, we could reduce temporary aberration to 1–1.6 ns, depending on ion energy. For the time of ion flight ~35 μs, such duration limits the resolution of the analyzer by a value not less than 10000. The real length of ion drift path was about 30 cm. The total overall sizes of the ionoptical system were ~24 × 19 × 5 cm.
ISSN:1061-9348
1608-3199
DOI:10.1134/S1061934817130123