Search Results - "Somos, I.L."

Power semiconductors empirical diagrams expressing life as a function of temperature excursion by Somos, I.L., Piccone, D.E., Willinger, L.J., Tobin, W.H.

“…Life expectancy for power semiconductor devices under cyclical power is discussed in practical terms as it has evolved over several decades. Predictions of…”
Get full text

Power semiconductors-a new method for predicting the on-state characteristic and temperature rise during multicycle fault currents by Somos, I.L., Piccone, D.E., Willinger, L.J., Tobin, W.H.

“…Solid-state switches are being designed for use on AC transmission lines for tighter control of power flow and increased use of transmission capacity in…”
Get full text

A thermal analogue of higher accuracy and factory test method for predicting and supporting thyristor fault suppression ratings by Piccone, D.E., Eriksson, L.O., Urbanek, J., Tobin, W.H., Somos, I.L.

“…Because sophisticated computer modeling is not easily accessible, a one-dimensional thermal analogue is often used for routine calculations of virtual junction…”
Get full text

Power semiconductors-a new method for predicting the on-state characteristic and temperature rise during multi-cycle fault currents by Somos, I.L., Piccone, D.E., Willinger, L.J., Tobin, W.H.

“…A concept, test procedure, and evaluation method are described for determining the on-state voltage of thyristors (or diodes) over a very wide temperature…”
Get full text

Two-dimensional heat flow in a GTO having a highly interdigitated emitter by Somos, I.L., Piccone, D.E., Tobin, W.H.

“…Thermal analogs of thyristors having the form of transmission lines are used routinely for calculating thermal phenomena, but they cannot be used for a…”
Get full text