Crystal Structure of Cu-Sn-In Alloys Around the η-Phase Field Studied by Neutron Diffraction
Study of the Cu-Sn-In ternary system has become quite important in recent years, due to new environmental regulations increasingly restricting use of Pb for bonding technologies in electronic devices. A key relevant issue concerns the intermetallic phases which grow in the bonding zone and strongly...
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Published in: | Journal of electronic materials Vol. 41; no. 11; pp. 3223 - 3231 |
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Main Authors: | , , |
Format: | Journal Article |
Language: | English |
Published: |
Boston
Springer US
01-11-2012
Springer |
Subjects: | |
Online Access: | Get full text |
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Summary: | Study of the Cu-Sn-In ternary system has become quite important in recent years, due to new environmental regulations increasingly restricting use of Pb for bonding technologies in electronic devices. A key relevant issue concerns the intermetallic phases which grow in the bonding zone and strongly affect its quality and performance. In this work, we focus on the η-phase (Cu
2
In or Cu
6
Sn
5
) that exists in both end binaries and as a ternary phase. We present a neutron diffraction study of the constitution and crystallography of a series of alloys around the 60 at.% Cu composition, and with In contents ranging from 0 at.% to 25 at.%, quenched from 300°C. The alloys were characterized by scanning electron microscopy (SEM), electron probe microanalysis (EPMA), and high-resolution neutron diffraction (ND). Rietveld refinement of ND data allowed improvement of the currently available model for site occupancies in the hexagonal η-phase in the binary Cu-Sn as well as in ternary alloys. For the first time, structural data are reported for the ternary Cu-Sn-In η-phase as a function of composition, information that is of fundamental technological importance as well as valuable for ongoing modeling of the ternary phase diagram. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-012-2193-4 |