Search Results - "Smit, G D J"

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  1. 1

    Layout Dependent Effects Of Passive Devices And Their Impact On Analog Integrated Circuits by Jayakumar, A., van Dort, M., Vertregt, M., Smit, G. D. J., Lander, R., Liu, I., Volf, P.

    “…Analog blocks on products built using advanced CMOS technologies were seen to have deviating behavior on silicon than estimated by post layout simulations,…”
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    Conference Proceeding
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    Scaling of nano-Schottky-diodes by Smit, G. D. J., Rogge, S., Klapwijk, T. M.

    Published in Applied physics letters (11-11-2002)
    “…A generally applicable model is presented to describe the potential barrier shape in ultrasmall Schottky diodes. It is shown that for diodes smaller than a…”
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    Journal Article
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    Enhanced tunneling across nanometer-scale metal–semiconductor interfaces by Smit, G. D. J., Rogge, S., Klapwijk, T. M.

    Published in Applied physics letters (08-04-2002)
    “…We have measured electrical transport across epitaxial, nanometer-sized metal–semiconductor interfaces by contacting CoSi2 islands grown on Si(111) with the…”
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    Journal Article
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    PSP-SOI: An advanced surface potential based compact model of partially depleted SOI MOSFETs for circuit simulations by Wu, W., Li, X., Gildenblat, G., Workman, G.O., Veeraraghavan, S., McAndrew, C.C., van Langevelde, R., Smit, G.D.J., Scholten, A.J., Klaassen, D.B.M., Watts, J.

    Published in Solid-state electronics (2009)
    “…This paper reports recent progress in partially depleted (PD) SOI MOSFET modeling using a surface potential based approach. The new model is formulated within…”
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    Journal Article
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    Valence Band Offset Measurements on Thin Silicon-on-Insulator MOSFETs by van der Steen, J.-L.P.J., Hueting, R.J.E., Smit, G.D.J., Hoang, T.., Holleman, J.., Schmitz, J..

    Published in IEEE electron device letters (01-09-2007)
    “…The effect of quantum confinement in thin silicon-on-insulator double-gate MOSFETs has been directly determined from subthreshold current measurements for the…”
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    Journal Article
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    RF benchmark tests for compact MOS models by Smit, G D J, Scholten, A J, Klaassen, D B M

    “…Next to accurate fits of measurements, smoothness, and robustness, compact MOSFET models should ideally meet a large number of additional requirements. In this…”
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    Conference Proceeding
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    Scaling of micro-fabricated nanometer-sized Schottky diodes by Smit, G.D.J., Flokstra, M.G., Rogge, S., Klapwijk, T.M.

    Published in Microelectronic engineering (01-10-2002)
    “…Diodes on the nanometer scale generally show non-ideal transport characteristics. In this paper, the transition of a conventional Schottky diode to a…”
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    Journal Article Conference Proceeding
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    The Relation Between Degradation Under DC and RF Stress Conditions by Scholten, A. J., Stephens, D., Smit, G. D. J., Sasse, G. T., Bisschop, J.

    Published in IEEE transactions on electron devices (01-08-2011)
    “…In this paper, we develop a method to derive degradation formulas for time-varying stress from the formulas for the constant-bias case, discuss its…”
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    Journal Article
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    A surface-potential based model for GaN HEMTs in RF power amplifier applications by John, D L, Allerstam, F, Rodle, T, Murad, S K, Smit, G D J

    “…We present the first surface-potential based compact model for RF GaN HEMTs and benchmark our work against both numerical simulations and device measurements…”
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    Conference Proceeding
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    The New CMC Standard Compact MOS Model PSP: Advantages for RF Applications by Scholten, A.J., Smit, G.D.J., De Vries, B.A., Tiemeijer, L.F., Croon, J.A., Klaassen, D.B.M., van Langevelde, R., Xin Li, Weimin Wu, Gildenblat, G.

    Published in IEEE journal of solid-state circuits (01-05-2009)
    “…The surface-potential-based compact MOS model PSP is reviewed with special emphasis to features of interest to analog and RF designers. Various aspects of the…”
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    Journal Article Conference Proceeding
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    Multi-Subband Monte Carlo simulations of I ON degradation due to fin thickness fluctuations in FinFETs by Serra, N., Palestri, P., Smit, G.D.J., Selmi, L.

    Published in Solid-state electronics (01-04-2009)
    “…The impact of fin thickness nonuniformities on carrier transport in n-type FinFETs is analyzed with a Multi-Subband Monte Carlo technique, which allows for an…”
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    Journal Article
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    Analysis and Prediction of Structural Motifs in the Glycolytic Enzymes [and Discussion] by Sternberg, M. J. E., Cohen, F. E., Taylor, W. R., Feldmann, R. J., Smit, J. D. G.

    “…Protein crystallography has determined the three-dimensional structures of 10 of the 13 enzymes of the glycolytic pathway. Diagrams and details of these enzyme…”
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    Journal Article
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    The Low-Resolution Structure of Human Muscle Aldolase [and Discussion] by Millar, J. R., Shaw, P. J., Stammers, D. K., Watson, H. C., Smit, J. D. G.

    “…The three-dimensional structure of human muscle aldolase has been solved at 5 Å resolution with the use of two isomorphous heavy atom derivatives. The enzyme's…”
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    Journal Article
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    PSP-SOI: A Surface Potential Based Compact Model of Partially Depleted SOI MOSFETs by Wu, W., Li, X., Gildenblat, G., Workman, G., Veeraraghavan, S., McAndrew, C., van Langevelde, R., Smit, G.D.J., Scholten, A.J., Klaassen, D.B.M., Watts, J.

    “…This paper reports recent progress on partially depleted (PD) SOI modeling using a surface potential based approach. The new model, called PSP-SOI, is…”
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    Conference Proceeding
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    The crystal structure of fructose-1,6-bisphosphate aldolase from Drosophila melanogaster at 2.5 Å resolution by HESTER, G, BRENNER-HOLZACH, O, ROSSI, F. A, STRUCK-DONATZ, M, WINTERHALTER, K. H, SMIT, J. D. G, PIONTEK, K

    Published in FEBS letters (04-11-1991)
    “…The structure of fructose-1,6-bisphosphate aldolase from Drosophila melanogaster has been determined by X-ray diffraction at 2.5 A resolution. The insect…”
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    Journal Article
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