Search Results - "Sicre, S.B.F."

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  1. 1
    Analysis of P@@db@ Centers in Ultrathin Hafnium Silicate Gate Stacks

    Analysis of P@@db@ Centers in Ultrathin Hafnium Silicate Gate Stacks by Sicre, S.B.F., de Souza, M.M.

    Published in IEEE transactions on electron devices (01-09-2007)
    “…A "kink" in the capacitance-voltage (C-V) characteristics of MOS capacitors with an ultrathin interfacial layer of 7-8 Aring in a hafnium silicate gate…”
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  2. 2
    Analysis of Centers in Ultrathin Hafnium Silicate Gate Stacks

    Analysis of Centers in Ultrathin Hafnium Silicate Gate Stacks by Sicre, S.B.F., De Souza, M.M.

    Published in IEEE transactions on electron devices (01-09-2007)
    “…A "kink" in the capacitance-voltage (C-V) characteristics of MOS capacitors with an ultrathin interfacial layer of 7-8 ¿ in a hafnium silicate gate dielectric…”
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    Journal Article
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  3. 3
    Analysis of Pb centers in ultrathin hafnium silicate gate stacks

    Analysis of Pb centers in ultrathin hafnium silicate gate stacks by SICRE, Sébastien B. F, MERLYNE DE SOUZA, Maria

    Published in IEEE transactions on electron devices (01-09-2007)
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