Search Results - "Shirley, D A"

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    X-ray photoelectron spectroscopy in North America—the early years by Shirley, D.A, Fadley, C.S

    “…In this paper, we present a brief overview of the beginning years of X-ray photoelectron spectroscopy in the USA, with particular emphasis on activities in…”
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    Reevaluation of the p(2×2)S/Cu(001) structure using angle-resolved photoemission extended fine-structure spectroscopy by SCHACH VON WITTENAU, A. E, HUSSAIN, Z, WANG, L. Q, HUANG, Z. Q, JI, Z. G, SHIRLEY, D. A

    Published in Physical review. B, Condensed matter (15-06-1992)
    “…Low-temperature (110-160K) angle-resolved photoemission extended-fine-structure studies of p(2 x 2)S/Cu(001) were performed. Analysis based on…”
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    Angle-resolved photoemission extended fine structure: Multiple layers of emitters and multiple initial states by Huff, W.R.A., Chen, Y., Kellar, S.A., Moler, E.J., Wu, H., Hussain, Z., Shirley, D.A.

    “…Recently, angle-resolved photoemission extended fine structure (ARPEFS) has been applied to experimental systems involving multiple layers of emitters and non-…”
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    Electron spectroscopy into the twenty-first century by Shirley, D.A., Petersen, B.L., Howells, M.R.

    “…Global socioeconomic trends define the external envelope within which electron spectroscopy will develop in the coming decades. The signs are very positive…”
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    Hyperfine Interactions and ESCA Data by Shirley, D A

    Published in Physica scripta (01-03-1975)
    “…A comparison is made of those data obtained from ESCA and from hyperfine interactions that bear on the same problems. A formal Hamiltonian can be written in…”
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    Fourier-Transform Analysis of Normal Photoelectron Diffraction Data for Surface-Structure Determination by Hussain, Z., Shirley, D. A., Li, C. H., Tong, S. Y.

    “…A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the…”
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    Normal Photoelectron Diffraction of the Se 3d Level in Se Overlayers on Ni(100) by Kevan, S D, Rosenblatt, D H, Denley, D, Lu, B-C, Shirley, D A

    Published in Physical review letters (27-11-1978)
    “…Modulations of up to a factor of two were observed in the Se 3d photoelectron intensity normal to the surface, for Se overlayers on Ni(100), as the photon…”
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