Search Results - "Shinohara, Armando H."

In-Service Aged Composite Insulators at Transmission Line Investigated by the Micro-Computerized Tomography by Pietro P. J. C. Silva, Shinohara, Armando H., Pacheco, Admilson P., Filho, Zurdival P. Castro, Monteiro, Sergio L. P.

“…Composite insulators aged in-service for almost 10 years at the transmission line of 230 kV, in an area where brittle fracture of a composite insulator…”
Get full text

Point defects and pre-dose requirements for sensitization of the 300°C TL peak in natural quartz by Guzzo, Pedro L., Khoury, Helen J., Miranda, Milena R., Barreto, Sandra B., Shinohara, Armando H.

“…This paper discusses the structural features required to stimulate a strong thermoluminescence (TL) glow peak near 300°C in clear natural quartz. For that…”
Get full text

Structural analysis of amorphous ZrYAlNi alloy by anomalous X-ray scattering by Sugiyama, Kazumasa, Shinohara, Armando H, Waseda, Yoshio, Inoue, Akihisa

“…The structure of Zr60Al15Ni25, Zr33Y27Al15Ni25 and Y60Al15Ni25 amorphous alloys were studied from the environmental structures of Zr, Y and Ni determined by…”
Get full text

Two-dimensional small-angle X-ray scattering from as-grown and heat-treated synthetic quartz by Guzzo, Pedro L., Shinohara, Armando H., Funari, Sérgio S., Daito, Shigeo, Santos, Anastacia E. F.

“…The small‐angle X‐ray scattering (SAXS) in as‐grown and heat‐treated quartz crystals was investigated as a function of the azimuth angle around the primary…”
Get full text

High quality synthetic quartz crystal growth for the information technology by Shinohara, Armando H.

Get full text

Effect of impurity segregation on crystal morphology of Y-Bar synthetic quartz by IWASAKI, F, SHINOHARA, A. H, IWASAKI, H, SUZUKI, C. K

“…The effects of Al and H impurities on the crystal morphology of Y -bar synthetic quartz were studied. The growth velocities perpendicular to the Y -axis were…”
Get full text

New seed geometry for growth of low dislocation synthetic quartz by Shinohara, A.H., Iano, M.C., Suzuki, C.K.

“…A method to grow low dislocation density synthetic quartz by using a special cutting seed geometry is reported. With this method, a relatively high dislocation…”
Get full text

X-ray topographic characterization of epitaxially grown diamond film by Suzuki, Carlos K., Shinohara, Armando H., Godoy, Paulo H., Watanabe, Noemia, Kamo, Mutsukazu

“…X-ray double crystal diffraction topography of homoepitaxial diamond film grown by microwave plasma chemical vapor deposition has been conducted to-study the…”
Get full text

Effect of Heat Treatment on the High-Purity Silica Glass Prepared from Amorphous and Crystalline Powders by Small Angle X-Ray Scattering by Shinohara, Armando H., Sekiya, Edson H., Torikai, Delson, Ogata, Daniela Y., Suzuki, Carlos K., Kellermann, Guinter, Torriani, Iris L.

“…High-purity silica glass prepared from high-purity amorphous and crystalline powders by flame fusion and sintering at high temperatures in vacuum, was…”
Get full text

High quality synthetic quartz crystal growth for the information technology by Shinohara, Armando H.

Get full text

Defects Detection in Electrical Insulators and Breaker for High Voltage by Low Cost Computed Radiography Systems by Shinohara, Armando H, Santana, Danilo M F, Oliveira, Pietro P J C, Silva, Rodrigo J G, Magalhaes, Otavio H, Silveira, Cidrack G, Khoury, Helen J

“…Nondestructive inspection of electrical insulators subjected to the high electrical stress and environmental damage is fundamental for reliable operation of a…”
Get full text

High resolution X-ray Laue topography of thick quartz crystals at SPring-8 by Suzuki, Carlos K., Shinohara, Armando H., Hiramatsu, Carlos Q., Yoshimura, Jun-ichi, Reid, James B., Kajiwara, Kentaro, Chikaura, Yoshinori

“…High resolution X-ray Laue topography was conducted on the SPring-8 BL-28B2 beamline, operating at a 5–100 keV energy range. The use of this beamline was…”
Get full text

On the Local Structure of Liquid Gallium from EXAFS Studies by Shinohara, Armando H., Omote, Kazuhiko, Waseda, Yoshio, Toguri, James M.

Get full text

Small Angle X-Ray Scattering Study for Determining the Particle Size of Colloidal Materials by Shinohara, A. H., Sugiyama, K., Shindo, D.

Get full text