Search Results - "Shih, W.C"

Enhanced output power of near-ultraviolet InGaN-GaN LEDs grown on patterned sapphire substrates by Wuu, D.S., Wang, W.K., Shih, W.C., Horng, R.H., Lee, C.E., Lin, W.Y., Fang, J.S.

“…Near-ultraviolet nitride-based light-emitting diodes (LEDs) with peak emission wavelengths around 410 nm were fabricated onto c-face patterned sapphire…”
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TSV by 355 UV laser for 4G component packaging with micro-electroforming by Pan, C.T., Chen, Y.C., Wang, S.Y., Cheng, Y.T., Yen, C.K., Lin, Y.L., Shih, W.C.

“…Nickel micro-electroforming was integrated with 355-nm wavelength ultraviolet laser process to fabricate the through silicon via (TSV) for 4G communication…”
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Characteristics of transparent conductive Al-doped ZnO and Ag–Ti tri-layer thin films prepared by multi-target magnetron sputtering by Shih, W.C., Kao, K.S., Cheng, D.L., Chung, C.J., Hsieh, P.T., Ou, S.L.

“…Al-doped ZnO (AZO) and Ag–Ti films were successfully deposited on glass substrates by multi-target magnetron sputtering to form the high transparent…”
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Transmission electron microscopy of AlCu interconnects during in-situ electromigration testing by Shih, W.C., Greer, A.L.

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The effect of annealing temperature on the electrical properties of metal-ferroelectric (PbZr 0.53Ti 0.47O 3)-insulator (ZrO 2)-semiconductor (MFIS) thin-film capacitors by Juan, P.C., Jiang, J.D., Shih, W.C., Lee, J.Y.M.

“…Metal-ferroelectric-insulator-semiconductor (MFIS) thin-film structures using PbZr 0.53Ti 0.47O 3 (PZT) as the ferroelectric layer and zirconium oxide (ZrO 2)…”
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Ce K-edge EXAFS study of nanocrystalline CeO2 by Lee, J.-F, Tang, M.-T, Shih, W.C, Liu, R.S

“…Nanocrystalline CeO2 samples were prepared via precipitation from aqueous cerium(IV) sulfate solution under a controlled pH. After being subjected to…”
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Evolution of microstructure and magnetoresistance in Co/Cu multilayers during annealing by Rätzke, K, Hall, M.J, Jardine, D.B, Shih, W.C, Somekh, R.E, Greer, A.L

“…Co/Cu multilayers [Co (1.5 nm)/Cu (4 nm)] 35 made by magnetron sputtering have been investigated by vibrating-sample magnetometry, electrical resistance…”
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Transmission electron microscopy of Al Cu interconnects during in-situ electromigration testing by Shih, W.C., Greer, A.L.

“…Transmission electron microscopy of 2.1 μm wide Al-4 wt.% Cu interconnects during in-situ electromigration stressing shows micros-tructural evolution and the…”
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Cyclopeptide alkaloids. Synthetic, spectroscopic and conformational studies of phencyclopeptine model compounds by Goff, Dane, Lagarias, J. Clark, Shih, Willy C, Klein, Melvin P, Rapoport, Henry

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Cyclopeptide alkaloids. Conformational analysis of the dihydro-p-phencyclopeptine nucleus by Lagarias, J. Clark, Yokoyama, Wallace H, Bordner, Jon, Shih, Willy C, Klein, Melvin P, Rapoport, Henry

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