Search Results - "Sheraz née Rabbani, Sadia"

Enhancing Ion Yields in Time-of-Flight-Secondary Ion Mass Spectrometry: A Comparative Study of Argon and Water Cluster Primary Beams by Sheraz née Rabbani, Sadia, Berrueta Razo, Irma, Kohn, Taylor, Lockyer, Nicholas P, Vickerman, John C

“…Following from our previous Letter on this topic, this Article reports a detailed study of time-of-flight-secondary ion mass spectrometry (TOF-SIMS) positive…”
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Multiomics Imaging Using High-Energy Water Gas Cluster Ion Beam Secondary Ion Mass Spectrometry [(H2O) n ‑GCIB-SIMS] of Frozen-Hydrated Cells and Tissue by Tian, Hua, Sheraz née Rabbani, Sadia, Vickerman, John C, Winograd, Nicholas

“…Integration of multiomics at the single-cell level allows the unambiguous dissecting of phenotypic heterogeneity at different states such as health, disease,…”
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Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams by Sheraz née Rabbani, Sadia, Barber, Andrew, Fletcher, John S, Lockyer, Nicholas P, Vickerman, John C

“…Low secondary ion yields from organic and biological molecules are the principal limitation on the future exploitation of time of flight-secondary ion mass…”
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Examination of fragment ions of polystyrene in TOF-SIMS spectra using MS/MS by Kawashima, Tomoko, Kurosawa, Takako, Aoyagi, Satoka, Sheraz (née Rabbani), Sadia, Fletcher, John S., Futigami, Masayo, Lockyer, Nicholas P., Vickerman, John C.

“…In this study, tendencies of ionization and cleavage processes of time‐of‐flight (TOF)‐SIMS were examined using MS/MS, which enables an easy qualitative…”
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Mass spectrometric imaging of brain tissue by time-of-flight secondary ion mass spectrometry - How do polyatomic primary beams C60+, Ar2000+, water-doped Ar2000+ and (H2O)6000+ compare? by Berrueta Razo, Irma, Sheraz (née Rabbani), Sadia, Henderson, Alex, Lockyer, Nicholas P., Vickerman, John C.

“…Rationale To discover the degree to which water‐containing cluster beams increase secondary ion yield and reduce the matrix effect in time‐of‐flight secondary…”
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