Search Results - "Sheppard, C J R"

Double-reflection polygon mirror for high-speed optical coherence microscopy by Liu, Linbo, Chen, Nanguang, Sheppard, C J R

“…We report on a high-speed, high-efficiency, high-duty-cycle, path-length-maintaining and linear beam scanner suitable for en face scanning optical coherence…”
Get more information

Direct calculation of a three-dimensional diffracted field by Lin, J, Yuan, X-C, Kou, S S, Sheppard, C J R, Rodríguez-Herrera, O G, Dainty, J C

“…We present an approach to calculating the complex amplitude of a three-dimensional (3D) diffracted light field in the paraxial approximation based on a 3D…”
Get more information

Linear phase imaging using differential interference contrast microscopy by Arnison, M. R., Larkin, K. G., Sheppard, C. J. R., Smith, N. I., Cogswell, C. J.

“…Summary We propose an extension to Nomarski differential interference contrast microscopy that enables isotropic linear phase imaging. The method combines…”
Get full text

Superresolution along extended depth of focus with binary-phase filters for the Gaussian beam by Liu, Linbo, Diaz, Frédéric, Wang, Liang, Loiseaux, Brigitte, Huignard, Jean-Pierre, Sheppard, C J R, Chen, Nanguang

“…In the paraxial Debye regime, simple and power-efficient pupil filters are designed to break the diffraction limit along a large depth of focus (DOF) for the…”
Get more information

Second harmonic generation polarization microscopy with tightly focused linearly and radially polarized beams by Yew, E.Y.S., Sheppard, C.J.R.

“…Second harmonic generation microscopy was conducted on rat-tail tendons with linearly and radially polarized beams. Transverse and axial field components were…”
Get full text

The numerical integration of fundamental diffraction integrals for converging polarized spherical waves using a two-dimensional form of Simpson's 1/3 Rule by Cooper, I. J., Sheppard, C. J. R., Roy, M.

“…A comprehensive matrix method based upon a two-dimensional form of Simpson's 1/3 rule (2DSC method) to integrate numerically the vector form of the fundamental…”
Get full text

Design considerations for refractive solid immersion lens: application to subsurface integrated circuit fault localization using laser induced techniques by Goh, S H, Sheppard, C J R, Quah, A C T, Chua, C M, Koh, L S, Phang, J C H

“…With fast scaling and advancement of integrated circuit (IC) technology, circuitries have become smaller and denser. New materials and more sophisticated…”
Get more information

Molecular contrast of EGFR expression using gold nanoparticles as a reflectance-based imaging probe by Kah, J.C.Y., Olivo, M.C., Lee, C.G.L., Sheppard, C.J.R.

“…Advanced reflectance-based optical techniques for in vivo imaging often suffer from low contrast between neoplastic and normal tissue and are unable to image…”
Get full text

The beam propagation factor for higher order Gaussian beams by Saghafi, S., Sheppard, C.J.R.

“…The beam propagation factor M 2 for coherent, higher-order, single mode beams can be calculated in a number of different ways, for example directly from…”
Get full text

Characterising elegant and standard Hermite–Gaussian beam modes by Saghafi, S, Sheppard, C.J.R, Piper, J.A

“…Two tool parameters, the beam propagation factor M 2 and kurtosis factor k, are used to analyse solutions of the paraxial scalar wave equation (for rectangular…”
Get full text

Near field and far field of elegant Hermite-Gaussian and Laguerre-Gaussian modes by Saghafi, S., Sheppard, C. J. R.

“…An alternative set of eigensolutions of the paraxial wave equation to that of the ordinary Hermite-Gaussian modes is that of the so-called 'elegant'…”
Get full text

Effects of high angles of convergence on V ( z ) in the scanning acoustic microscope by Sheppard, C. J. R., Wilson, T.

“…An investigation is made of the effects of using high numerical aperture acoustic lenses on the V(z) respsonse in acoustic microscopy. Theoretical results are…”
Get full text

Efficient calculation of electromagnetic diffraction in optical systems using a multipole expansion by Sheppard, C. J. R., Török, P.

“…The field distribution in the focal region of a high-aperture optical system is calculated using an expansion into multipole components. For any angular…”
Get full text

Effect of a confocal pinhole in two-photon microscopy by Gauderon, R., Lukins, P. B., Sheppard, C. J. R.

“…We investigated the effect of a finite‐sized confocal pinhole on the performance of nonlinear optical microscopes based on two‐photon excited fluorescence and…”
Get full text

Evanescent fields do contribute to the far field (1999, J. mod. Optics, 46, 729) by Sheppard, C. J. R., Aguilar, F.

“…In a series of papers, Xiao has described a decomposition of the electric field of an electric dipole into homogeneous and evanescent components. Although the…”
Get full text

Integrated intensity and confocal imaging through scattering media by Sheppard, C. J. R., Sharma, M. D.

“…It is shown how the integrated intensity, discussed previously elsewhere, can be used to investigate in a simple way, the process of confocal imaging though a…”
Get full text

Fourier imaging of phase information in scanning and conventional optical microscopes by Sheppard, C. J. R., Wilson, T.

“…The imaging performance of scanning microscopes may be improved by introducing a pinhole in the detector plane, thus forming a confocal (or type 2) scanning…”
Get full text

Optical microscopy with extended depth of field by Sheppard, C. J. R., Hamilton, D. K., Cox, I. J.

“…A method is described that allows the depth of field in optical microscopy to be extended, in principle without limit, while high-resolution,…”
Get full text

Focal distributions and Hertz potentials by Sheppard, C.J.R.

“…The three-dimensional (3D) pupil function for a high-aperture focusing system can be expressed in terms of Hertz or Debye potentials. The electromagnetic field…”
Get full text

Fresnel coefficients for weak reflection, and the scattering potential for three-dimensional imaging by Sheppard, C.J.R., Aguilar, F.

“…The Fresnel coefficients for reflection from a planar interface between two dielectrics are investigated for the case when the change in refractive index is…”
Get full text