Search Results - "Shang-Fu Yeh"

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  1. 1

    Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor by Chao, Calvin Yi-Ping, Wu, Thomas Meng-Hsiu, Yeh, Shang-Fu, Lee, Chih-Lin, Tu, Honyih, Huang, Joey Chiao-Yi, Chang, Chin-Hao

    Published in Sensors (Basel, Switzerland) (01-09-2023)
    “…In this work, the degradation of the random telegraph noise (RTN) and the threshold voltage (Vt) shift of an 8.3Mpixel stacked CMOS image sensor (CIS) under…”
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    Journal Article
  2. 2

    Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors by Chao, Calvin Yi-Ping, Yeh, Shang-Fu, Wu, Meng-Hsu, Chou, Kuo-Yu, Tu, Honyih, Lee, Chih-Lin, Yin, Chin, Paillet, Philippe, Goiffon, Vincent

    Published in Sensors (Basel, Switzerland) (10-12-2019)
    “…In this paper we present a systematic approach to sort out different types of random telegraph noises (RTN) in CMOS image sensors (CIS) by examining their…”
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    Journal Article
  3. 3

    Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method by Chao, Calvin Yi-Ping, Tu, Honyih, Wu, Thomas Meng-Hsiu, Chou, Kuo-Yu, Yeh, Shang-Fu, Yin, Chin, Lee, Chih-Lin

    Published in Sensors (Basel, Switzerland) (23-11-2017)
    “…A study of the random telegraph noise (RTN) of a 1.1 μm pitch, 8.3 Mpixel CMOS image sensor (CIS) fabricated in a 45 nm backside-illumination (BSI) technology…”
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    Journal Article
  4. 4

    A Linear-Logarithmic CMOS Image Sensor With Pixel-FPN Reduction and Tunable Response Curve by Chou, Wei-Fan, Yeh, Shang-Fu, Chiu, Chin-Fong, Hsieh, Chih-Cheng

    Published in IEEE sensors journal (01-05-2014)
    “…This paper presents a high dynamic range (DR) linear-logarithmic (Lin-Log) CMOS image sensor (CIS) pixel with threshold voltage cancellation technique for…”
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    Journal Article
  5. 5

    Novel Single-Slope ADC Design for Full Well Capacity Expansion of CMOS Image Sensor by Yeh, Shang-Fu, Hsieh, Chih-Cheng

    Published in IEEE sensors journal (01-03-2013)
    “…This paper proposes a novel single-slope (SS) ADC design and operation for full well capacity (FWC) expansion of CMOS image sensor to increase the dynamic…”
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    Journal Article
  6. 6

    Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process by Chao, Calvin Yi-Ping, Wu, Meng-Hsu, Yeh, Shang-Fu, Chang, Chin-Hao, Lee, Chi-Lin, Yin, Chin, Chou, Kuo-Yu, Tu, Honyih

    “…It is difficult to measure the random telegraph noises (RTN) of MOSFET subthreshold currents at the sub-pA level directly and accurately. In this work, we used…”
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    Journal Article
  7. 7

    Random Telegraph Noises in CMOS Image Sensors Caused by Variable Gate-Induced Sense Node Leakage Due to X-Ray Irradiation by Chao, Calvin Yi-Ping, Wu, Thomas M.-H., Yeh, Shang-Fu, Chou, Kuo-Yu, Tu, Honyih, Lee, Chih-Lin, Yin, Chin, Paillet, Philippe, Goiffon, Vincent

    “…The effects of X-ray irradiation on the random noises, especially the random telegraph noises (RTN), of a 45-nm on 65-nm stacked CMOS image sensor with 8.3M…”
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    Journal Article
  8. 8

    CMOS Image Sensor Random Telegraph Noise Time Constant Extraction From Correlated To Uncorrelated Double Sampling by Chao, Calvin Yi-Ping, Honyih Tu, Wu, Thomas, Kuo-Yu Chou, Shang-Fu Yeh, Fu-Lung Hsueh

    “…A new method for on-chip random telegraph noise (RTN) characteristic time constant extraction using the double sampling circuit in an 8.3 Mpixel CMOS image…”
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    Journal Article
  9. 9

    A Dual-Exposure Single-Capture Wide Dynamic Range CMOS Image Sensor With Columnwise Highly/Lowly Illuminated Pixel Detection by YEH, Shang-Fu, HSIEH, Chih-Cheng, CHENG, Chiao-Jen, LIU, Chun-Kai

    Published in IEEE transactions on electron devices (01-07-2012)
    “…This paper proposes a dual-exposure single-capture wide dynamic-range (DR) CMOS image sensor (CIS) for optical identification systems. The proposed sensor…”
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    Journal Article
  10. 10
  11. 11

    A 0.66erms− Temporal-Readout-Noise 3-D-Stacked CMOS Image Sensor With Conditional Correlated Multiple Sampling Technique by Shang-Fu Yeh, Kuo-Yu Chou, Hon-Yih Tu, Chao, Calvin Yi-Ping, Fu-Lung Hsueh

    Published in IEEE journal of solid-state circuits (01-02-2018)
    “…This paper presents a sub-electron temporal readout noise, 8.3 Mpixel and 1.1-μ pixel pitch 3-D-stacked CMOS image sensor (CIS). A conditional correlated…”
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    Journal Article
  12. 12

    A novel single slope ADC design for wide dynamic range CMOS image sensors by Shang-Fu Yeh, Chih-Cheng Hsieh, Chiao-Jen Cheng, Chun-Kai Liu

    Published in 2011 IEEE SENSORS Proceedings (01-10-2011)
    “…This paper presents a novel single slope ADC design for dual-exposure wide dynamic range CMOS image sensor (CIS). The proposed design achieves column-wise…”
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    Conference Proceeding
  13. 13

    A new CMOS image sensor readout structure for 3D integrated imagers by Shang-Fu Yeh, Jin-Yi Lin, Chih-Cheng Hsieh, Ka-Yi Yeh, Chung-Chi Jim Li

    “…This paper presents a new CMOS image sensor (CIS) structure and ADC design for three-dimensional (3D) integrated imagers. A modular design of CIS sub-array is…”
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    Conference Proceeding
  14. 14
  15. 15

    A 143dB 1.96% FPN linear-logarithmic CMOS image sensor with threshold-voltage cancellation and tunable linear range by Wei-Fan Chou, Shang-Fu Yeh, Chih-Cheng Hsieh

    Published in 2012 IEEE Sensors (01-10-2012)
    “…This paper presents a high dynamic range (DR) linear-logarithmic (Lin-Log) CMOS image sensor (CIS) pixel with on-chip tunable linear range and threshold…”
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    Conference Proceeding
  16. 16

    An image lag free CMOS image sensor with Constant-Residue Reset by Shang-Fu Yeh, Chih-Cheng Hsieh, Chin-Fong Chiu, Hann-Huei Tsai

    “…A lag-free CMOS image sensor (CIS) with Constant-Residue Reset (CRR) operation is presented in this paper. It effectively eliminates image lag effect caused by…”
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    Conference Proceeding
  17. 17

    Live demonstration: The prototype of real-time image pre-processing system for satellites' remote sensing by Chen, Tsan-Jieh, Weng, Chih-Hui, Chiueh, Herming, Hsieh, Chih-Cheng, Yeh, Shang-Fu, Chang, Wen-Hsu, Juang, Ying-Zong, Tsai, Hann-Huei, Chiu, Chin-Fong

    “…High resolution image combination and processing plays an important role in today's satellites' remote sensing applications. This paper presents an image…”
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    Conference Proceeding
  18. 18
  19. 19

    A 3 Megapixel 100 Fps 2.8 \mum Pixel Pitch CMOS Image Sensor Layer With Built-in Self-Test for 3D Integrated Imagers by Shang-Fu Yeh, Chih-Cheng Hsieh, Ka-Yi Yeh

    Published in IEEE journal of solid-state circuits (01-03-2013)
    “…This paper presents a 3 megapixel 100 fps 2.8 μm pixel pitch CMOS image sensor (CIS) layer with built-in self-test (BIST) for three-dimensional (3D) integrated…”
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    Journal Article
  20. 20

    A 0.66e−rms temporal-readout-noise 3D-stacked CMOS image sensor with conditional correlated multiple sampling (CCMS) technique by Shang-Fu Yeh, Kuo-Yu Chou, Hon-Yih Tu, Chao, Calvin Yi-Ping, Fu-Lung Hsueh

    “…A conditional correlated multiple sampling (CCMS) technique for low noise CMOS image sensor (CIS) is proposed to reduce noise and address low frame rate issue…”
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    Conference Proceeding