Search Results - "Sexton, Frederick W."

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    Dielectric breakdown of thin oxides during ramped current-temperature stress by Fleetwood, D.M., Riewe, L.C., Winokur, P.S., Sexton, F.W.

    Published in IEEE transactions on nuclear science (01-12-2000)
    “…Dielectric breakdown in thin gate oxides is studied with a bias-temperature ramp technique. Research grade 6.5 nm oxides with Al gates show variable…”
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    Journal Article
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    New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle by Dodds, N. A., Dodd, P. E., Shaneyfelt, M. R., Sexton, F. W., Martinez, M. J., Black, J. D., Marshall, P. W., Reed, R. A., McCurdy, M. W., Weller, R. A., Pellish, J. A., Rodbell, K. P., Gordon, M. S.

    Published in IEEE transactions on nuclear science (01-12-2015)
    “…We present low-energy proton single-event upset (SEU) data on a 65 nm SOI SRAM whose substrate has been completely removed. Since the protons only had to…”
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    Journal Article
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