Search Results - "Sepich, J. L."

Etch pit characterization of CdTe and CdZnTe substrates for use in mercury cadmium telluride epitaxy by Everson, W. J., Ard, C. K., Sepich, J. L., Dean, B. E., Neugebauer, G. T., Schaake, H. F.

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Correlation of HgCdTe epilayer defects with underlying substrate defects by synchrotron x‐ray topography by Dean, B. E., Johnson, C. J., McDevitt, S. C., Neugebauer, G. T., Sepich, J. L., Dobbyn, R. C., Kuriyama, M., Ellsworth, J., Vydyanath, H. R., Kennedy, J. J.

“…Synchrotron x‐ray topography studies have been conducted at the National Synchrotron Light Source at Brookhaven National Laboratory to correlate defects in…”
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Etch pit caracterization of CdTe and CdZnTe substrates for use in mercury cadmium telluride epitaxy by EVERSON, W. J, ARD, C. K, SEPICH, J. L, DEAN, B. E, NEUGEBAUER, G. T, SCHAAKE, H. F

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