Search Results - "Selg, Hardi"

JÄNES: A NAS Framework for ML-based EDA Applications by Selg, Hardi, Jenihhin, Maksim, Ellervee, Peeter

“…While Machine Learning is increasingly adopted for a spectrum of complex and time-consuming Electronic Design Automation (EDA) tasks, the efficiency of…”
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ML-Based Online Design Error Localization for RISC-V Implementations by Selg, Hardi, Jenihhin, Maksim, Ellervee, Peeter, Raik, Jaan

“…The accelerated growth of computing systems' complexity makes comprehensive design verification challenging and time-consuming. In practice, hard-to-model…”
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Wafer-Level Die Re-Test Success Prediction Using Machine Learning by Selg, Hardi, Jenihhin, Maksim, Ellervee, Peeter

“…For high-volume production, time spent for wafer-level test is a crucial contributor to the overall product cost. At the same time, accurate filtering out of…”
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Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs by Selg, Hardi, Shibin, Konstantin, Tsertov, Anton, Jenihhin, Maksim, Ellervee, Peeter, Raik, Jaan

“…This paper proposes a novel in-field ML-assisted fault localization and fault management approach for intermittent faults in RISC-V microprocessor cores…”
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Keynote: Cost-Efficient Reliability for Edge-AI Chips by Jenihhin, Maksim, Taheri, Mahdi, Cherezova, Natalia, Ahmadilivani, Mohammad Hasan, Selg, Hardi, Jutman, Artur, Shibin, Konstantin, Tsertov, Anton, Devadze, Sergei, Kodamanchili, Rama Mounika, Rafiq, Ahsan, Raik, Jaan, Daneshtalab, Masoud

“…Very recently, Artificial Intelligence started undergoing a remarkable transformation by moving closer to the source of data, thus establishing the Edge AI…”
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