Search Results - "Seifert, Winfried"

Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography by Stoffers, Andreas, Cojocaru-Mirédin, Oana, Seifert, Winfried, Zaefferer, Stefan, Riepe, Stephan, Raabe, Dierk

“…This study aims to better understand the influence of crystallographic structure and impurity decoration on the recombination activity at grain boundaries in…”
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Out-diffusion and precipitation of copper in silicon: An electrostatic model by Flink, C, Feick, H, McHugo, SA, Seifert, W, Hieslmair, H, Heiser, T, Istratov, AA, Weber, ER

“…Concentrations of mobile interstitial copper and precipitated copper in silicon were studied after a high temperature intentional contamination and quench to…”
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Formation of copper precipitates in silicon by Flink, Christoph, Feick, Henning, McHugo, Scott A, Mohammed, Amna, Seifert, Winfried, Hieslmair, Henry, Heiser, Thomas, Istratov, Andrei A, Weber, Eicke R

“…The formation of copper precipitates in silicon was studied after high-temperature intentional contamination of p- and n-type FZ and Cz-grown silicon and…”
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Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography by Stoffers, Andreas, Cojocaru-Miredin, Oana, Breitenstein, Otwin, Seifert, Winfried, Zaefferer, Stefan, Raabe, Dierk

“…The efficiency of multicrystalline silicon solar cells suffers from the presence of extended defects like dislocations and grain boundaries. In fact, the…”
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Infrared light emission from porous silicon by Jia, Guobin, Seifert, Winfried, Arguirov, Tzanimir, Kittler, Martin

“…Very intense broad sub-bandgap infrared (IR) light emission around 1,550 nm was observed on porous silicon by photoluminescence (PL) measurements. The…”
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Micro-photoluminescence spectroscopy on metal precipitates in silicon by Gundel, Paul, Schubert, Martin C., Kwapil, Wolfram, Schön, Jonas, Reiche, Manfred, Savin, Hele, Yli-Koski, Marko, Sans, Juan Angel, Martinez-Criado, Gema, Seifert, Winfried, Warta, Wilhelm, Weber, Eicke R.

“…Metallic impurities are detrimental to many silicon devices and limit the efficiency of multicrystalline silicon solar cells. Therefore they are a major…”
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The effect of internal stresses on the recombination activity of structural defects in multi-crystalline solar silicon by Sarau, G., Christiansen, S., Holla, M., Seifert, W.

“…Internal stresses in multi-crystalline silicon (mc-Si) materials for solar cells are the result of the superposition between the thermally induced residual…”
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Influence of contamination on the electrical activity of crystal defects in silicon by Kittler, Martin, Seifert, Winfried, Knobloch, Klaus

“…It is shown by EBIC that dislocation activity is controlled by the degree of metal contamination. The activity can be affected by external gettering and…”
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Influence of Intrinsic Gettering on Silicon Recombination Properties and their Relation to Device Performance by Kittler, Martin, Richter, Hans, Seifert, Winfried

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