Search Results - "Seidleck, Christina M"

32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches by Rodbell, K. P., Heidel, D. F., Pellish, J. A., Marshall, P. W., Tang, H. H. K., Murray, C. E., LaBel, K. A., Gordon, M. S., Stawiasz, K. G., Schwank, J. R., Berg, M. D., Kim, H. S., Friendlich, M. R., Phan, A. M., Seidleck, C. M.

“…Single event upset (SEU) experimental heavy ion data and modeling results for CMOS, silicon-on-insulator (SOI), 32 nm and 45 nm stacked and DICE latches are…”
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Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory by Casey, Megan C., Stansberry, Scott D., Seidleck, Christina M., Maharrey, Jeffrey A., Gamboa, Dante, Pellish, Jonathan A., Label, Kenneth A.

“…We are presenting single-event effect testing results on a 22-nm fully depleted silicon-on-insulator test chip from GlobalFoundries. The 128-Mb static random…”
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Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions by Sierawski, B.D., Pellish, J.A., Reed, R.A., Schrimpf, R.D., Warren, K.M., Weller, R.A., Mendenhall, M.H., Black, J.D., Tipton, A.D., Xapsos, M.A., Baumann, R.C., Xiaowei Deng, Campola, M.J., Friendlich, M.R., Kim, H.S., Phan, A.M., Seidleck, C.M.

“…Direct ionization from low energy protons is shown to cause upsets in a 65-nm bulk CMOS SRAM, consistent with results reported for other deep submicron…”
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Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies by Pellish, Jonathan A., Marshall, Paul W., Rodbell, Kenneth P., Gordon, Michael S., LaBel, Kenneth A., Schwank, James R., Dodds, Nathaniel A., Castaneda, Carlos M., Berg, Melanie D., Kim, Hak S., Phan, Anthony M., Seidleck, Christina M.

“…We report low-energy proton and low-energy alpha particle SEE data on a 32 nm SOI CMOS SRAM that demonstrates the criticality of using low-energy protons for…”
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Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs by Tipton, A.D., Pellish, J.A., Hutson, J.M., Baumann, R., Deng, X., Marshall, A., Xapsos, M.A., Kim, H.S., Friendlich, M.R., Campola, M.J., Seidleck, C.M., LaBel, K.A., Mendenhall, M.H., Reed, R.A., Schrimpf, R.D., Weller, R.A., Black, J.D.

“…The effects of device orientation on heavy ion-induced multiple-bit upset (MBU) in 65 nm SRAMs are examined. The MBU response is shown to depend on the…”
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Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing by Berg, M D, Buchner, S P, Hak Kim, Friendlich, M, Perez, C, Phan, A M, Seidleck, C M, Label, K A, Kruckmeyer, K

“…A novel approach to dynamic SEE ADC testing is presented. The benefits of this test scheme versus prior implemented techniques include the ability to observe…”
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Heavy Ion Testing With Iron at 1 GeV/amu by Pellish, Jonathan A, Xapsos, Michael A, LaBel, Kenneth A, Marshall, Paul W, Heidel, David F, Rodbell, Kenneth P, Hakey, Mark C, Dodd, Paul E, Shaneyfelt, Marty R, Schwank, James R, Baumann, Robert C, Xiaowei Deng, Marshall, Andrew, Sierawski, Brian D, Black, Jeffrey D, Reed, Robert A, Schrimpf, Ronald D, Kim, Hak S, Berg, Melanie D, Campola, Michael J, Friendlich, Mark R, Perez, Christopher E, Phan, Anthony M, Seidleck, Christina M

“…A 1 GeV/amu 56 Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends at the GCR flux energy…”
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Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM by Heidel, D.F., Marshall, P.W., LaBel, K.A., Schwank, J.R., Rodbell, K.P., Hakey, M.C., Berg, M.D., Dodd, P.E., Friendlich, M.R., Phan, A.D., Seidleck, C.M., Shaneyfelt, M.R., Xapsos, M.A.

“…Experimental results are presented on proton induced single-event-upsets (SEU) on a 65 nm silicon-on-insulator (SOI) SRAM. The low energy proton SEU results…”
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SEE data from the APEX Cosmic Ray Upset experiment: predicting the performance of commercial devices in space by Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

“…This paper presents additional results from the CRUX experiment on the US Air Force APEX satellite. The experiment monitors single event effects on 256 Kbit…”
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Single Event Induced Multiple Bit Errors and the Effects of Logic Masking by Berg, Melanie D., Kim, Hak S., Phan, Anthony D., Seidlick, Christina M., LaBel, Kenneth A., Pellish, Jonathan A.

“…We apply a model and heavy-ion cross section data to predict the potential that one single event upset (SEU) will induce multiple bit errors (MBEs) by the next…”
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Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM by Heidel, D.F., Marshall, P.W., Pellish, J.A., Rodbell, K.P., LaBel, K.A., Schwank, J.R., Rauch, S.E., Hakey, M.C., Berg, M.D., Castaneda, C.M., Dodd, P.E., Friendlich, M.R., Phan, A.D., Seidleck, C.M., Shaneyfelt, M.R., Xapsos, M.A.

“…Experimental results are presented on single-bit-upsets (SBU) and multiple-bit-upsets (MBU) on a 45 nm SOI SRAM. The accelerated testing results show the…”
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Outstanding Conference Paper Award 2009 IEEE Nuclear and Space Radiation Effects Conference

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Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications by LaBel, K.A., Marshall, P.W., Marshall, C.J., D'Ordine, M., Carts, M., Lum, G., Kim, H.S., Seidleck, C.M., Powell, T., Abbott, R., Barth, J., Stassinopoulos, E.G.

“…We present data on recent optocoupler in-flight anomalies and the subsequent ground test irradiation performed. Discussions of the single event mechanisms…”
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Compendium of Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA by Cochran, Donna J., Kniffin, Scott D., Buchner, Stephen P., LaBel, Kenneth A., O'Bryan, Martha V., Ladbury, Raymond L., Sanders, Anthony B., Hawkins, Donald K., Cox, Stephen R., Poivey, Christian F., Oldham, Timothy R., Kim, Hak, Irwin, Tim L., Friendlich, Mark R., Dung-Phan, Anthony M., Carts, Martin A., Berg, Melanie D., Seidleck, Christina M., Forney, James D.

“…Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include…”
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Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA by O'Bryan, M.V., Poivey, C., Kniffin, S.D., Buchner, S.P., Ladbury, R.L., Oldham, T.R., Howard, J.W., LaBel, K.A., Sanders, A.B., Berg, M., Marshall, C.J., Marshall, P.W., Kim, H.S., Dung-Phan, A.M., Hawkins, D.K., Carts, M.A., Forney, J.D., Irwin, T., Seidleck, C.M., Cox, S.R., Friendlich, M., Flanigan, R.J., Petrick, D., Powell, W., Karsh, J., Baze, M.P.

“…Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include…”
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Comparison of MIL-STD-1773 fiber optic data bus terminals: single event proton test irradiation, in-flight space performance, and prediction techniques by LaBel, K.A., Marshall, P.W., Marshall, C.J., Barth, J., Leidecker, H., Reed, R., Seidleck, C.M.

“…We present a comparison of proton single event ground test results for two generations of MTL-STD-1773 fiber optic data bus interface modules. Single event…”
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Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX by Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

“…This paper presents the results from the CRUX experiment on the Air Force APEX satellite. The experiment monitors single event upsets on screened commercial…”
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Recent single event effects results for candidate spacecraft electronics for NASA by O'Bryan, M.V., LaBel, K.A., Kniffin, S.D., Poivey, C., Howard, J.W., Ladbury, R.L., Buchner, S.P., Oldham, T.R., Marshall, P.W., Sanders, A.B., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Irwin, T., Seidleck, C.M., Cox, S.R., Palor, C., Petrick, D., Powell, W., Willits, B.L.

“…Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital,…”
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Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controller by LaBel, K.A., Barry, R.K., Castell, K., Kim, H.S., Seidleck, C.M.

“…As part of National Aeronautics and Space Administration (NASA)/Goddard Space Flight Center's (GSFC) efforts in supporting spaceflight qualification for…”
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On the suitability of fiber optic data links in the space radiation environment: a historical and scaling technology perspective by LaBel, K.A., Marshall, C.J., Marshall, P.W., Luers, P.J., Reed, R.A., Ott, M.N., Seidleck, C.M., Andrucyk, D.J.

“…As NASA, DoD, industry, and others propagate the current spacecraft trends for increasing science data throughput and on-board processing, the use of fiber…”
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