Search Results - "Seeck, O"

The high-resolution diffraction beamline P08 at PETRA III by Seeck, O. H., Deiter, C., Pflaum, K., Bertam, F., Beerlink, A., Franz, H., Horbach, J., Schulte-Schrepping, H., Murphy, B. M., Greve, M., Magnussen, O.

“…The new third‐generation synchrotron radiation source PETRA III located at the Deutsches Elektronen‐Synchrotron DESY in Hamburg, Germany, has been operational…”
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Polar domains in lead titanate films under tensile strain by Catalan, G, Janssens, A, Rispens, G, Csiszar, S, Seeck, O, Rijnders, G, Blank, D H A, Noheda, B

“…Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crystal substrates of DyScO3. The films, of only 5 nm…”
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In situ X-ray measurements over large Q-space to study the evolution of oxide thin films prepared by RF sputter deposition by Walter, P., Wernecke, J., Scholz, M., Reuther, D., Rothkirch, A., Haas, D., Blume, J., Resta, A., Vlad, A., Faley, O., Schipmann, S., Nent, A., Seeck, O., Dippel, A.-C., Klemradt, U.

“…Sputter deposition is a versatile and industrially important deposition technique for thin films, with increasing demand for matching the characteristics of…”
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Temperature dependence of the 2D-3D transition in the growth of PTCDA on Ag(111): A real-time X-ray and kinetic Monte Carlo study by Krause, B, Schreiber, F, Dosch, H, Pimpinelli, A, Seeck, O. H

“…We present a real-time X-ray scattering study of the growth modes in organic molecular-beam epitaxy. We have studied the model system…”
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High-resolution X-ray characterization of mid-IR Al0.45Ga0.55As/GaAs Quantum Cascade Laser structures by Kubacka-Traczyk, J., Sankowska, I., Seeck, O.H., Kosiel, K., Bugajski, M.

“…In this paper, the X-ray diffraction profiles of Quantum Cascade Laser (QCL) structures have been investigated. The examined structures were grown by molecular…”
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Late growth stages and post-growth diffusion in organic epitaxy: PTCDA on Ag(1 1 1) by Krause, B., Dürr, A.C., Schreiber, F., Dosch, H., Seeck, O.H.

“…The late growth stages and the post-growth diffusion of crystalline organic thin films have been investigated for 3,4,9,10-perylenetetracarboxylic dianhydride…”
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Low-density polymer thin film formation in supercritical carbon dioxide by Koga, Tadanori, Seo, Y.-S., Jerome, J. L., Ge, S., Rafailovich, M. H., Sokolov, J. C., Chu, B., Seeck, O. H., Tolan, M., Kolb, R.

“…We report a method for producing stable low-density polymer films by using supercritical carbon dioxide (scCO2). Two different molecular weight polystyrene…”
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Structural investigation of ultrathin Pt/Co/Pt trilayer films under EUV irradiation by Dynowska, E., Pelka, J.B., Klinger, D., Minikayev, R., Bartnik, A., Dluzewski, P., Jakubowski, M., Klepka, M., Petruczik, A., Seeck, O.H., Sobierajski, R., Sveklo, I., Wawro, A.A., Maziewski, A.

“…Trilayer systems containing ultrathin (3nm) cobalt layer grown on 5nm thick Pt buffer layer and covered with 3nm thick Pt cap layer grown at room temperature…”
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Correlated Surfaces of Free-Standing Polystyrene Thin Films by Shin, K, Pu, Y, Rafailovich, M. H, Sokolov, J, Seeck, O. H, Sinha, S. K, Tolan, M, Kolb, R

“…We have performed X-ray specular and off-specular measurements of free-standing polystyrene thin films as a function of molecular weight and thickness. The…”
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Closely spaced SiGe barns as stressor structures for strain-enhancement in silicon by Hrauda, N., Zhang, J. J., Groiss, H., Gerharz, J. C., Etzelstorfer, T., Stangl, J., Holý, V., Deiter, C., Seeck, O. H., Bauer, G.

“…We present tensile and compressive strains realized within the same Si capping layer on an array of SiGe islands grown on pit-patterned (001) Si substrates…”
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PETRA III: DESY's New High Brilliance Third Generation Synchrotron Radiation Source by Franz, H, Leupold, O, Rohlsberger, R, Roth, S V, Seeck, O H, Spengler, J, Strempfer, J, Tischer, M, Viefhaus, J, Weckert, E, Wroblewski, T

“…At present, the storage ring DORIS III (4.5 GeV, 150 mA) serves as the main source for synchrotron radiation experiments at DESY. DORIS III is a second…”
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Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method by Seeck, O. H., Kaendler, I. D., Tolan, M., Shin, K., Rafailovich, M. H., Sokolov, J., Kolb, R.

“…X-ray reflectivity data of polymer bilayer systems have been analyzed using a Fourier method which takes into account different limits of integration in…”
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X-ray scattering from freestanding polymer films with geometrically curved surfaces by Lee, D R, Shin, K, Seeck, O H, Kim, Hyunjung, Seo, Y-S, Tolan, M, Rafailovich, M H, Sokolov, J, Sinha, S K

“…We show that the x-ray surface scattering from a freestanding polymer film exhibits features that cannot be explained by the usual stochastic formalism for…”
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Surfaces of Strongly Confined Polymer Thin Films Studied by X-Ray Scattering by Wang, J., Tolan, M., Seeck, O. H., Sinha, S. K., Bahr, O., Rafailovich, M. H., Sokolov, J.

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Diffraction analysis of highly ordered smectic supramolecules of conjugated rodlike polymers by Knaapila, M., Torkkeli, M., Jokela, K., Kisko, K., Horsburgh, L. E., Pålsson, L-O., Seeck, O. H., Dolbnya, I. P., Bras, W., Ten Brinke, G., Monkman, A. P., Ikkala, O., Serimaa, R.

“…A small/wide‐angle X‐ray scattering and grazing incidence diffraction study of comb‐shaped supramolecules of conjugated poly(2,5‐pyridinediyl), acid dopant and…”
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Structural study of Co/Gd multilayers by X-ray diffraction and GIXR by Pełka, J.B., Paszkowicz, W., Wawro, A., Baczewski, L.T., Seeck, O.

“…The objective of this work was the structural characterisation of Co/Gd multilayers grown by MBE process in various conditions, such as substrate composition,…”
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Polaronic orbital polarization in a layered colossal magnetoresistive manganite by Campbell, B. J., Sinha, S. K., Osborn, R., Rosenkranz, S., Mitchell, J. F., Argyriou, D. N., Vasiliu-Doloc, L., Seeck, O. H., Lynn, J. W., Univ. California at San Diego, LANL, NIST

“…The striking anisotropy observed in Huang scattering distributions near the intense Bragg reflections of La{sub 1.2}Sr{sub 1.8}Mn{sub 2}O{sub 7} is shown to be…”
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In situ X-ray measurements over large Q-space to study the evolution of oxide thin films prepared by RF sputter deposition by Walter, P., Wernecke, J., Scholz, M., Reuther, D., Rothkirch, A., Haas, D., Blume, J., Resta, A., Vlad, A., Faley, O., Schipmann, S., Nent, A., Seeck, O., Dippel, A. -C., Klemradt, U.

“…Sputter deposition is a versatile and industrially important deposition technique for thin films, with increasing demand for matching the characteristics of…”
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X-ray reflectivity study on the surface and bulk glass transition of polystyrene by Weber, R, Zimmermann, K M, Tolan, M, Stettner, J, Press, W, Seeck, O H, Erichsen, J, Zaporojtchenko, V, Strunskus, T, Faupel, F

“…The surfaces of polystyrene (PS) films decorated with gold nanoclusters were investigated by x-ray reflectivity measurements. The thicknesses of the films are…”
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Roughness of surfaces and interfaces by Press, W., Tolan, M., Stettner, J., Seeck, O.H., Schlomka, J.P., Nitz, V., Schwalowsky, L., Müller-Buschbaum, P., Bahr, D.

“…X-ray reflectivity is now a common tool for investigating density profiles of thin films and multilayers in a nondestructive manner. In contrast to the…”
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