Search Results - "Schrock, James A"
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Failure Analysis of 1200-V/150-A SiC MOSFET Under Repetitive Pulsed Overcurrent Conditions
Published in IEEE transactions on power electronics (01-03-2016)“…SiC MOSFETs are a leading option for increasing the power density of power electronics; however, for these devices to supersede the Si insulated-gate bipolar…”
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Journal Article -
2
High-Mobility Stable 1200-V, 150-A 4H-SiC DMOSFET Long-Term Reliability Analysis Under High Current Density Transient Conditions
Published in IEEE transactions on power electronics (01-06-2015)“…For SiC DMOSFETs to obtain widespread usage in power electronics their long-term operational ability to handle the stressful transient current and high…”
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Journal Article -
3
Failure Modes of 15-kV SiC SGTO Thyristors During Repetitive Extreme Pulsed Overcurrent Conditions
Published in IEEE transactions on power electronics (01-12-2016)“…SiC SGTO thyristors are an advanced solution for increasing the power density of medium voltage power electronics. However, for these devices to replace Si…”
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4
Experiments on a Disk-on-Rod Traveling Wave Tube Amplifier Driven by a Nonlinear Transmission Line Modulated Electron Beam
Published in IEEE transactions on plasma science (01-02-2022)“…Experiments have demonstrated high-power amplification (100 MW class) from a traveling wave amplifier driven by a modulated electron beam. The modulated…”
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Nonlinear transmission line-driven apparatus for short-pulse microwave exposure of aerosolized pathogens
Published in Review of scientific instruments (01-06-2021)“…A system capable of exposing a flowing aerosol stream to short duration (2-4 ns), high-power RF waveforms is described. The system utilizes a C-band…”
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6
Electron Bunching in a Nonlinear Transmission Line-Driven Electron Beam
Published in 2018 IEEE International Conference on Plasma Science (ICOPS) (24-06-2018)“…The nonlinear transmission line electron beam driver at the Air Force Research Laboratory produces a frequency agile modulated annular electron beam [1]. A…”
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Conference Proceeding -
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Modular Marx generator for dV/dt testing of power semiconductor devices
Published in 2014 IEEE International Power Modulator and High Voltage Conference (IPMHVC) (01-06-2014)“…A solid-state modular Marx Generator was designed for the purpose of testing the dV/dt capability of Power Semiconductor devices. The Marx Generator is capable…”
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Conference Proceeding -
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Single-pulse avalanche mode operation of 10-kV/10-A SiC MOSFET
Published in Microelectronics and reliability (01-02-2018)“…The high-voltage silicon carbide MOSFET is a state-of-the-art solution for increasing power density and efficiency in power electronics; nonetheless, a…”
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9
Spatially dispersive nonlinear transmission line experimental performance analysis
Published in IEEE transactions on dielectrics and electrical insulation (01-04-2019)“…Spatially dispersive nonlinear transmission lines (NLTLs) have attracted interest as pulsed RF sources. The characteristics of these sources need to be further…”
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Journal Article -
10
Analysis of GaN power MOSFET exporsure to pulsed overcurrents
Published in 2015 IEEE Pulsed Power Conference (PPC) (01-05-2015)“…The advancement of wide bandgap semiconductor materials has led to the development of Gallium Nitride (GaN) power semiconductor devices, specifically GaN Power…”
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Conference Proceeding -
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Economic analysis of battery energy storage system
Published in 2015 IEEE Industry Applications Society Annual Meeting (01-10-2015)“…Grid-connected battery energy storage systems (BESS) are essential for improving the transient dynamics of the power grid. There is ongoing research about how…”
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Conference Proceeding -
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Analysis of advanced 20 KV/20 a silicon carbide power insulated gate bipolar transistor in resistive and inductive switching tests
Published in 2015 IEEE Pulsed Power Conference (PPC) (01-05-2015)“…The power density of pulsed power systems can be increased with the utilization of silicon carbide power devices 1 . With the latest developments in…”
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Conference Proceeding -
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Evaluation and comparison of 1200-V/285-A silicon carbide half-bridge MOSFET modules
Published in 2015 IEEE Pulsed Power Conference (PPC) (01-05-2015)“…Silicon Carbide (4H-SiC) is a state-of-the-art solution for increasing the energy density of pulsed power and power electronics. High power SiC MOSFET modules…”
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Conference Proceeding -
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Pulsed power switching of 4H-SiC vertical D-MOSFET and device characterization
Published in 2013 Abstracts IEEE International Conference on Plasma Science (ICOPS) (01-06-2013)“…Summary form only given. This research is to characterize and compare CREE's new N-Channel Silicon Carbide (4H-SiC) vertical power D-MOSFET with CREE's…”
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Conference Proceeding -
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Analysis on repetitive pulsed overcurrent operation of GaN power transistors
Published in 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (01-11-2016)“…Gallium Nitride (GaN) transistors are of great interest for pulsed power and high power applications due to the proven capability of Silicon Carbide (SiC)…”
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Conference Proceeding -
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Continuous switching of ultra-high voltage silicon carbide MOSFETs
Published in 2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC) (01-07-2016)“…Silicon carbide power semiconductor devices are capable of increasing the power density of power electronics systems [1, 2]. In recent years, devices rated to…”
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Conference Proceeding -
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Simulation and design trade-off analysis of 15 kV SiC SGTO thyristor during extreme pulsed overcurrent conditions
Published in 2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC) (01-07-2016)“…Silicon carbide Super Gate Turn-Off (SGTO) thyristors are an advanced technology for increasing the power density of high voltage pulsed power or power…”
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Conference Proceeding -
18
Pulsed power switching of 4H-SiC vertical D-MOSFET and device characterization
Published in 2013 19th IEEE Pulsed Power Conference (PPC) (01-06-2013)“…The purpose of this research is to characterize and compare CREE's new N-Channel Silicon Carbide (4H-SiC) vertical power D-MOSFET with CREE's previous…”
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Conference Proceeding