Search Results - "Schmidt, D.M."

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    Modeling ionizing radiation induced gain degradation of the lateral PNP bipolar junction transistor by Schmidt, D.M., Wu, A., Schrimpf, R.D., Fleetwood, D.M., Pease, R.L.

    Published in IEEE transactions on nuclear science (01-12-1996)
    “…Ionizing-radiation-induced gain degradation in lateral PNP bipolar junction transistors is due to an increase in base current as a result of recombination at…”
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    Journal Article
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    Comparison of ionizing-radiation-induced gain degradation in lateral, substrate, and vertical PNP BJTs by Schmidt, D.M., Fleetwood, D.M., Schrimpf, R.D., Pease, R.L., Graves, R.J., Johnson, G.H., Galloway, K.F., Combs, W.E.

    Published in IEEE transactions on nuclear science (01-12-1995)
    “…A comparison is presented of ionizing-radiation-induced gain degradation in lateral, substrate, and vertical PNPs. The dose-rate dependence of current gain…”
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    Journal Article
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    Hardness-assurance issues for lateral PNP bipolar junction transistors by Schrimpf, R.D., Graves, R.J., Schmidt, D.M., Fleetwood, D.M., Pease, R.L., Combs, W.E., DeLaus, M.

    Published in IEEE transactions on nuclear science (01-12-1995)
    “…The dose-rate dependence of gain degradation in lateral PNP transistors is even stronger than the dependence previously reported for NPN BJTs. In this work,…”
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    Journal Article
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    Gain degradation of lateral and substrate pnp bipolar junction transistors by Witczak, S.C., Schrimpf, R.D., Galloway, K.F., Fleetwood, D.M., Pease, R.L., Puhl, J.M., Schmidt, D.M., Combs, W.E., Suehle, J.S.

    Published in IEEE transactions on nuclear science (01-12-1996)
    “…The effect of dose rate on radiation-induced current gain degradation at 20 krad(Si) was quantified for lateral and substrate pnp bipolar transistors over the…”
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    Journal Article
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    A generalized spatiotemporal covariance model for stationary background in analysis of MEG data by Plis, S.M., Schmidt, D.M., Jun, S.C., Ranken, D.M.

    “…Using a noise covariance model based on a single Kronecker product of spatial and temporal covariance in the spatiotemporal analysis of MEG data was…”
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    Conference Proceeding Journal Article
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    Spatial-temporal Bayesian inference for MEG/EEG by Schmidt, D.M., George, J.S., Ranken, D.M., Wood, C.C.

    “…We recently described a new approach to the MEG/EEG inverse problem based on Bayesian Inference [1999]. Unlike almost all other approaches to the inverse…”
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    Conference Proceeding
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    Bayesian inference applied to the neural electromagnetic inverse problem by Schmidt, D.M., George, J.S., Wood, C.C.

    “…The problem of estimating the current distribution in the brain from surface EEG or MEG measurements (the so called neural electromagnetic inverse problem) is…”
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    Conference Proceeding
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    Source Inversion Technique using Bayesian Inference: Combined MEG/fMRI by Jun, S.C., George, J.S., Kim, W., Plis, S.M., Ranken, D.M., Schmidt, D.M.

    “…As a way to integrate multi-modal brain imaging data in the Bayesian frame, we propose a spatiotemporal Bayesian inference multi-dipole analysis for MEG and…”
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    Conference Proceeding
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    Studies of performance and resolution of double sided silicon strip detectors by Alexander, J.P., Artuso, M., Busch, B., Dobbins, J., Jones, C.D., Wuerthwein, F., Morrison, R.J., Schmidt, D.M.

    Published in IEEE transactions on nuclear science (01-04-1991)
    “…Double-sided silicon strip detectors have been fabricated and tested in a silicon tracking telescope placed in a high-energy muon beam at Fermi National…”
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    Journal Article
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    Larval parasitoids collected from overwintering European corn borer (Lepidoptera: Pyralidae) in Pennsylvania by Losey, J.E. (University of Maryland, College Park, MD), Song, P.Z, Schmidt, D.M, Calvin, D.D, Liewehr, D.J

    “…Three imported parasitoids emerged from larvae of the European corn borer, Ostrinia nubilalis (Hubner), from overwintering sites in corn in Pennsylvania in…”
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    Journal Article
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    Visualization of ionizing-radiation and hot-carrier stress response of polysilicon emitter BJTs by Graves, R.J., Schmidt, D.M., Kosier, S.L., Wei, A., Schrimpf, R.D., Galloway, K.F.

    “…Process and device simulation software tools are used to produce an animated visualization of the mechanisms involved in the ionizing-radiation and hot-carrier…”
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    Conference Proceeding Journal Article
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