Search Results - "Scheuermann, U."

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  1. 1

    Impact of load pulse duration on power cycling lifetime of Al wire bonds by Scheuermann, U., Schmidt, R.

    Published in Microelectronics and reliability (01-09-2013)
    “…The elimination of solder interfaces in advanced power modules has increased the lifetime in active power cycling tests. It facilitates the investigation of Al…”
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    Journal Article Conference Proceeding
  2. 2

    Reliability challenges of automotive power electronics by Scheuermann, U.

    Published in Microelectronics and reliability (01-09-2009)
    “…A high reliability of power electronic modules is an essential requirement for hybrid traction applications. This includes a high capability to withstand the…”
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    Journal Article Conference Proceeding
  3. 3

    Power cycling results for different control strategies by Scheuermann, U., Schuler, S.

    Published in Microelectronics and reliability (01-09-2010)
    “…Power cycling is an important method to characterize the lifetime of power semiconductor modules. Application engineers use lifetime curves published by…”
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    Journal Article Conference Proceeding
  4. 4

    Achalasia—an unnecessary long way to diagnosis by Niebisch, S., Hadzijusufovic, E., Mehdorn, M., Müller, M., Scheuermann, U., Lyros, O., Schulz, H. G., Jansen-Winkeln, B., Lang, H., Gockel, I.

    Published in Diseases of the esophagus (01-05-2017)
    “…SUMMARY Although achalasia presents with typical symptoms such as dysphagia, regurgitation, weight loss, and atypical chest pain, the time until first…”
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    Journal Article
  5. 5

    Comparison of resection and transarterial chemoembolisation in the treatment of advanced intrahepatic cholangiocarcinoma – A single-center experience by Scheuermann, U, Kaths, J.M, Heise, M, Pitton, M.B, Weinmann, A, Hoppe-Lotichius, M, Otto, G

    Published in European journal of surgical oncology (01-06-2013)
    “…Abstract Aims The aim of this study is to evaluate factors associated with the outcome after surgical resection and to compare the efficacy of surgery to…”
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    Journal Article
  6. 6

    Reliability of spring pressure contacts under environmental stress by Lang, F., Scheuermann, U.

    Published in Microelectronics and reliability (01-09-2007)
    “…Spring contacts are an excellent solution for connecting a power module with a printed circuit board (PCB). They can be applied in a wide current range from…”
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    Journal Article Conference Proceeding
  7. 7

    Impact of load pulse duration on power cycling lifetime of chip interconnection solder joints by Junghaenel, M., Scheuermann, U.

    Published in Microelectronics and reliability (01-09-2017)
    “…Thermo-mechanical stress limits the useful life of power modules in the application. Active power cycling tests have been applied for more than three decades…”
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    Journal Article
  8. 8
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    A Novel Power Module Design and Technology for Improved Power Cycling Capability by Scheuermann, U., Herr, E.

    Published in Microelectronics and reliability (01-09-2001)
    “…An advanced power semiconductor package design without base plate has a number of advantages compared to standard base plate modules. It allows to use…”
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    Journal Article
  10. 10

    Power cycling testing with different load pulse durations by Scheuermann, U, Schmidt, R, Newman, P

    “…For many applications, the impact on the component lifetime of temperature swings generated by low output frequency is of special interest. Therefore, active…”
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    Conference Proceeding
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    Power Module Design without Solder Interfaces - an Ideal Solution for Hybrid Vehicle Traction Applications by Scheuermann, U.

    “…Hybrid vehicle traction applications require compact power modules with high reliability. A major challenge is the lifetime under thermal cycles. While the…”
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    Conference Proceeding
  13. 13

    Reliability of pressure contacted intelligent integrated power modules by Scheuermann, U.

    “…The pressure contact concept offers new opportunities for an advanced power module package technology. It is flexible with respect to the substrate size or…”
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    Conference Proceeding
  14. 14

    Reliability of Planar SKiN Interconnect Technology by Scheuermann, U.

    “…The classical module design is limited in lifetime by solder interfaces and wire bond technology. The elimination of the traditional base plate and the…”
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    Conference Proceeding
  15. 15

    Using the chip as a temperature sensor - The influence of steep lateral temperature gradients on the Vce(T)-measurement by Schmidt, R., Scheuermann, U.

    “…During operation steep lateral temperature gradients evolve in IGBT power semiconductor chips. The influence of these lateral gradients on the measurement of…”
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    Conference Proceeding
  16. 16

    Separating Failure Modes in Power Cycling Tests by Schmidt, R., Scheuermann, U.

    “…The direct comparison of silver-sintered and soldered chip-DBC-interconnects allows studying the influence of the two main end-of-life failure modes in power…”
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    Conference Proceeding
  17. 17
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    Impact of solder fatigue on module lifetime in power cycling tests by Scheuermann, U., Schmidt, R.

    “…Different end-of-life mechanisms in power modules (i.e., solder fatigue and wire bond failures) and their interactions are subject of investigation. Their…”
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    Conference Proceeding
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