Search Results - "Scheuermann, U."
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Impact of load pulse duration on power cycling lifetime of Al wire bonds
Published in Microelectronics and reliability (01-09-2013)“…The elimination of solder interfaces in advanced power modules has increased the lifetime in active power cycling tests. It facilitates the investigation of Al…”
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Reliability challenges of automotive power electronics
Published in Microelectronics and reliability (01-09-2009)“…A high reliability of power electronic modules is an essential requirement for hybrid traction applications. This includes a high capability to withstand the…”
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3
Power cycling results for different control strategies
Published in Microelectronics and reliability (01-09-2010)“…Power cycling is an important method to characterize the lifetime of power semiconductor modules. Application engineers use lifetime curves published by…”
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4
Achalasia—an unnecessary long way to diagnosis
Published in Diseases of the esophagus (01-05-2017)“…SUMMARY Although achalasia presents with typical symptoms such as dysphagia, regurgitation, weight loss, and atypical chest pain, the time until first…”
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Comparison of resection and transarterial chemoembolisation in the treatment of advanced intrahepatic cholangiocarcinoma – A single-center experience
Published in European journal of surgical oncology (01-06-2013)“…Abstract Aims The aim of this study is to evaluate factors associated with the outcome after surgical resection and to compare the efficacy of surgery to…”
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Reliability of spring pressure contacts under environmental stress
Published in Microelectronics and reliability (01-09-2007)“…Spring contacts are an excellent solution for connecting a power module with a printed circuit board (PCB). They can be applied in a wide current range from…”
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Impact of load pulse duration on power cycling lifetime of chip interconnection solder joints
Published in Microelectronics and reliability (01-09-2017)“…Thermo-mechanical stress limits the useful life of power modules in the application. Active power cycling tests have been applied for more than three decades…”
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Reliability of low current electrical spring contacts in power modules
Published in Microelectronics and reliability (01-09-2003)Get full text
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A Novel Power Module Design and Technology for Improved Power Cycling Capability
Published in Microelectronics and reliability (01-09-2001)“…An advanced power semiconductor package design without base plate has a number of advantages compared to standard base plate modules. It allows to use…”
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Power cycling testing with different load pulse durations
Published in 7th IET International Conference on Power Electronics, Machines and Drives (PEMD 2014) (2014)“…For many applications, the impact on the component lifetime of temperature swings generated by low output frequency is of special interest. Therefore, active…”
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Unusual cause of recurrent gluteal abscess formation
Published in Chirurg (01-10-2017)Get full text
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Power Module Design without Solder Interfaces - an Ideal Solution for Hybrid Vehicle Traction Applications
Published in 2009 Twenty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition (01-02-2009)“…Hybrid vehicle traction applications require compact power modules with high reliability. A major challenge is the lifetime under thermal cycles. While the…”
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Conference Proceeding -
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Reliability of pressure contacted intelligent integrated power modules
Published in Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics (2002)“…The pressure contact concept offers new opportunities for an advanced power module package technology. It is flexible with respect to the substrate size or…”
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Conference Proceeding -
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Reliability of Planar SKiN Interconnect Technology
Published in 2012 7th International Conference on Integrated Power Electronics Systems (CIPS) (01-03-2012)“…The classical module design is limited in lifetime by solder interfaces and wire bond technology. The elimination of the traditional base plate and the…”
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Conference Proceeding -
15
Using the chip as a temperature sensor - The influence of steep lateral temperature gradients on the Vce(T)-measurement
Published in 2009 13th European Conference on Power Electronics and Applications (01-09-2009)“…During operation steep lateral temperature gradients evolve in IGBT power semiconductor chips. The influence of these lateral gradients on the measurement of…”
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Separating Failure Modes in Power Cycling Tests
Published in 2012 7th International Conference on Integrated Power Electronics Systems (CIPS) (01-03-2012)“…The direct comparison of silver-sintered and soldered chip-DBC-interconnects allows studying the influence of the two main end-of-life failure modes in power…”
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Ungewöhnliche Ursache rezidivierender Glutealabszessbildung
Published in Chirurg (01-10-2017)Get full text
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Impact of solder fatigue on module lifetime in power cycling tests
Published in Proceedings of the 2011 14th European Conference on Power Electronics and Applications (01-08-2011)“…Different end-of-life mechanisms in power modules (i.e., solder fatigue and wire bond failures) and their interactions are subject of investigation. Their…”
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