Search Results - "Scheuermann, Michael"

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    Redox-Responsive Protein Design: Design of a Small Protein Motif Dependent on Glutathionylation by Scheuermann, Michael J, Forbes, Christina R, Zondlo, Neal J

    Published in Biochemistry (Easton) (26-12-2018)
    “…Cysteine S-glutathionylation is a protein post-translational modification that promotes cellular responses to changes in oxidative conditions. The design of…”
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    Journal Article
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    Arginine Mimetics Using α-Guanidino Acids: Introduction of Functional Groups and Stereochemistry Adjacent to Recognition Guanidiniums in Peptides by Balakrishnan, Shalini, Scheuermann, Michael J., Zondlo, Neal J.

    “…Arginine residues are broadly employed for specific biomolecular recognition, including in protein–protein, protein–DNA, and protein–RNA interactions. Arginine…”
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    Journal Article
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    Analysis and Modeling of DC Current Crowding for TSV-Based 3-D Connections and Power Integrity by Xin Zhao, Scheuermann, Michael R., Sung Kyu Lim

    “…3-D integration using through-silicon-vias (TSVs) is emerging as one of the key technology options for continued miniaturization. However, because of increased…”
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    Journal Article
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    A 3D system prototype of an eDRAM cache stacked over processor-like logic using through-silicon vias by Wordeman, M., Silberman, J., Maier, G., Scheuermann, M.

    “…3D integration (3DI) holds promise for improved performance of integrated systems by increasing interconnect bandwidth [1]. A processor stacked with cache…”
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    Conference Proceeding
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    Arginine Mimetics via α-Guanidino Acids: Introduction of Functional Groups and Stereochemistry Adjacent to Recognition Guanidiniums in Peptides by Balakrishnan, Shalini, Scheuermann, Michael J., Zondlo, Neal J.

    “…Arginine residues are broadly employed for specific biomolecular recognition, including in protein-protein, protein-DNA, and protein-RNA interactions. Arginine…”
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    Journal Article
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    Analysis of DC current crowding in through-silicon-vias and its impact on power integrity in 3D ICs by Zhao, Xin, Scheuermann, Michael, Lim, Sung Kyu

    Published in DAC Design Automation Conference 2012 (03-06-2012)
    “…Due to the large geometry of through-silicon-vias (TSVs) and their connections to the power grid, significant current crowding can occur in 3D ICs. Prior works…”
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    Conference Proceeding
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    Anomalous voltage overshoot during turn-off of thin-film n-channel SOI MOSFETs by Dubois, E., Shahidi, G.G., Scheuermann, M.R.

    Published in IEEE electron device letters (01-04-1993)
    “…An anomalous output voltage overshoot observed during the turn-off of single short-channel thin-film silicon-on-insulator SOI n-MOSFETs is reported. The…”
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    Journal Article
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    Design and Modeling Methodology of Vertical Interconnects for 3DI Applications by Gordin, R, Goren, D, Shlafman, S, Elad, D, Scheuermann, M, Young, A, Fei Liu, Xiaoxiong Gu, Tyberg, C

    “…This paper presents a design and modeling methodology of vertical interconnects for three-dimensional integration (3DI) applications. Compact semi-analytical…”
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    Journal Article
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    Decoupling capacitor modeling and characterization for power supply noise in 3D systems by Zheng Xu, Putnam, C., Xiaoxiong Gu, Scheuermann, M., Rose, K., Webb, B., Knickerbocker, J., Jian-Qiang Lu

    “…Decoupling capacitors are essential to reduce high transient current noise and to provide a low impedance power delivery path. 3D technology has several…”
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    Conference Proceeding
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    Design, CAD and technology challenges for future processors: 3D perspectives by Burns, Jeff, Carpenter, Gary, Kursun, Eren, Puri, Ruchir, Warnock, James, Scheuermann, Michael

    “…Technology scaling has provided the semiconductor industry a recipe to successfully meet the application demands for performance for over three decades. This…”
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    Conference Proceeding
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    Transient modeling of TSV-wire electromigration and lifetime analysis of power distribution network for 3D ICs by Xin Zhao, Yang Wan, Scheuermann, Michael, Sung Kyu Lim

    “…In this paper, we present a transient modeling of electromigration (EM) in TSV and TSV-to-wire interfaces in the power delivery network (PDN) of 3D ICs. In…”
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    Conference Proceeding