Search Results - "Scharoba, Stefan"

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  1. 1
    Detecting Improvised Land-mines using Deep Neural Networks on GPR Image Dataset targeting FPGAs

    Detecting Improvised Land-mines using Deep Neural Networks on GPR Image Dataset targeting FPGAs by Mahmood, Safdar, Scharoba, Stefan, Schorlemer, Jonas, Schulz, Christian, Hubner, Michael, Reichenbach, Marc

    “…Armed conflicts and guerrilla warfare in different geographical locations have caused great trouble to the communities living in respective territories and…”
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  2. 2
    Fast power overhead prediction for hardware redundancy-based fault tolerance

    Fast power overhead prediction for hardware redundancy-based fault tolerance by Scharoba, Stefan, Vierhaus, Heinrich T.

    “…Due to the downscaling of transistor feature sizes, nowadays integrated circuits are more vulnerable to various effects that can cause faults during operation…”
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  3. 3
    DeepTest: How Machine Learning Can Improve the Test of Embedded Systems

    DeepTest: How Machine Learning Can Improve the Test of Embedded Systems by Bielefeldt, Jens, Kai-Uwe, Basener, Reza Khan, Siddique, Massah, Mozhdeh, Hans-Werner, Wiesbrock, Scharoba, Stefan, Hubner, Michael

    “…When performing functional tests or stress or runtime tests of embedded systems, a large amount of data is collected. The tests are partly performed by…”
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  4. 4
    Towards Machine Learning Support for Embedded System Tests

    Towards Machine Learning Support for Embedded System Tests by Scharoba, Stefan, Basener, Kai-Uwe, Bielefeldt, Jens, Wiesbrock, Hans-Werner, Hubner, Michael

    “…The correctness of embedded systems needs to be ensured by a high number of tests. Large amounts of data reflecting the system behavior are collected during…”
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  5. 5
    Combining Correction of Delay Faults and Transient Faults

    Combining Correction of Delay Faults and Transient Faults by Koal, Tobias, Scharoba, Stefan, Vierhaus, Heinrich T.

    “…The on-going down-scaling of devices in microelectronics has resulted both in reliability problems and in problems regarding power dissipation. Even worse,…”
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  6. 6
    An Interactive Design Space Exploration Tool for Dependable Integrated Circuits

    An Interactive Design Space Exploration Tool for Dependable Integrated Circuits by Scharoba, Stefan, Vierhaus, Heinrich T.

    “…The downscaling of transistor feature sizes has led to integrated circuits that are more susceptible to various fault effects. In order to meet dependability…”
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  7. 7
    A comprehensive software-based self-test and self-repair method for statically scheduled superscalar processors

    A comprehensive software-based self-test and self-repair method for statically scheduled superscalar processors by Scholzel, Mario, Koal, Tobias, Muller, Sebastian, Scharoba, Stefan, Roder, Stephanie, Vierhaus, Heinrich T.

    “…The integration of a diagnostic software-based self-test and a software-based self-repair method into a single statically scheduled superscalar processor is…”
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  8. 8
    On reliability estimation for combined transient and permanent fault handling

    On reliability estimation for combined transient and permanent fault handling by Scharoba, Stefan, Scholzel, Mario, Koal, Tobias, Vierhaus, Heinrich T.

    “…This paper addresses the problem of modeling the reliability of systems, where permanent and transient faults are handled in a combined manner. First, we…”
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