Search Results - "Scharfetter, L"

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    BSIM: Berkeley short-channel IGFET model for MOS transistors by Sheu, B.J., Scharfetter, D.L., Ko, P.-K., Jeng, M.-C.

    Published in IEEE journal of solid-state circuits (01-08-1987)
    “…The Berkeley short-channel IGFET model (BSIM), an accurate and computationally efficient MOS transistor model, and its associated characterization facility for…”
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    Journal Article
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    Gallium arsenide pixel detectors by Bates, R, Campbell, M, Cantatore, E, D'Auria, S, DaVià, C, del Papa, C, Heijne, E.M, Middelkamp, P, O'Shea, V, Raine, C, Ropotar, I, Scharfetter, L, Smith, K, Snoeys, W

    “…GaAs detectors can be fabricated with bidimensional single-sided electrode segmentation. They have been successfully bonded using flip-chip technology to the…”
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    Journal Article
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    The influence of a magnetic field on the performance of a binary pixel detector system by Scharfetter, L., Campbell, M., Cantatore, E., Heijne, E.H.M., Howard, A., Middelkamp, P., Snoeys, W.

    “…In the framework of the RD19 collaboration, a binary silicon pixel detector system has been tested in a magnetic field between −2 and +2 T. The spatial…”
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    Journal Article
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    General optimization and extraction of IC device model parameters by Doganis, K., Scharfetter, D.L.

    Published in IEEE transactions on electron devices (01-09-1983)
    “…VLSI circuit simulation necessitates specification of model parameters. For the device equations to predict the measured I-V characteristics, the extraction of…”
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    Journal Article
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    Large-signal analysis of a silicon Read diode oscillator by Scharfetter, D.L., Gummel, H.K.

    Published in IEEE transactions on electron devices (01-01-1969)
    “…This paper presents theoretical calculations of the large-signal admittance and efficiency achievable in a silicon p-n-v-ns Read IMPATT diode. A simplified…”
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    Journal Article
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    AVALANCHE SHOCK FRONTS IN p-n JUNCTIONS by Bartelink, D. J., Scharfetter, D. L.

    Published in Applied physics letters (15-05-1969)
    “…A new transient mode of avalanche breakdown in p-n junctions is described. For sufficiently high current, a region of impact ionization of carriers advances as…”
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    Journal Article
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    A multichip module, the basic building block for large area pixel detectors by Becks, K.-H., Heijne, E.H.M., Middelkamp, P., Scharfetter, L., Snoeys, W.

    “…In order to build large array pixel detectors for future experiments in High Energy Physics e.g. for experiments at the Large Hadron Collider (LHC) at CERN,…”
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    Conference Proceeding
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    Device physics of TRAPATT oscillators by DeLoach, B.C., Scharfetter, D.L.

    Published in IEEE transactions on electron devices (01-01-1970)
    “…This paper utilizes a simplified physical model to describe TRAPATT (TRApped Plasma Avalanche Triggered Transit) operation. By yielding on computational…”
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    Journal Article
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    Power-impedance-frequency limitations of IMPATT oscillators calculated from a scaling approximation by Scharfetter, D.L.

    Published in IEEE transactions on electron devices (01-08-1971)
    “…The obtainable CW power of silicon IMPATT oscillators, as a function of frequency, is calculated by scaling from reference results. The analysis differs from…”
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    Journal Article
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    A transimpedance amplifier using a novel current mode feedback loop by Jarron, Pierre, Anghinolfi, Francis, Delagne, Eric, Dabrowski, Wladek, Scharfetter, Luitwin

    “…We present a transimpedance amplifier stage based on a novel current mode feedback topology. This circuit employs exclusively NMOS and PMOS transistors and…”
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    Journal Article
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    The Use of LSI Modules in Computer Structures: Trends and Limitations by Siewiorek, D.P., Thomas, D.E., Scharfetter, D.L.

    Published in Computer (Long Beach, Calif.) (01-07-1978)
    “…Advances in LSI technology are beginning to outstrip architectural innovations and their implementation, calling for greater software productivity and…”
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    Journal Article
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    High injection in epitaxial transistors by Poon, H.C., Gummel, H.K., Scharfetter, D.L.

    Published in IEEE transactions on electron devices (01-05-1969)
    “…An analysis of base widening and the current dependence of the cutoff frequency f T has been given previously [1]. The analysis is approximate and is based on…”
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    Journal Article