Search Results - "Schönbohm, F."

Thermal stability of an ultrathin hafnium oxide film on plasma nitrided Si(100) by Skaja, K., Schönbohm, F., Weier, D., Lühr, T., Keutner, C., Berges, U., Westphal, C.

“…We report on the thermal stability of an ultrathin hafnium oxide film on a plasma nitrided Si(100) surface. The ultrathin silicon nitride buffer layer was…”
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The local adsorption of pyridine on Si(100) a combined PES and XPD study by Weier, D., Lühr, T., Beimborn, A., Schönbohm, F., Döring, S., Berges, U., Westphal, C.

“…The chemical and geometrical properties of the system pyridine on Si(100) are investigated in a combined photoelectron spectroscopy (XPS) and photoelectron…”
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Photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) studies on the local adsorption of cyclopentene on Si(100) by Weier, D., Lühr, T., Beimborn, A., Schönbohm, F., Döring, S., Berges, U., Westphal, C.

“…We investigated the chemical and geometrical characteristics of the system cyclopentene on Si(100) in a combined photoelectron spectroscopy (PES) and…”
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A detailed look beneath the surface: Evidence of a surface reconstruction beneath a capping layer by Krull, D., Tesch, M.F., Schönbohm, F., Lühr, T., Keutner, C., Berges, U., Mertins, H.-Ch, Westphal, C.

“…[Display omitted] •Demonstration of a detailed look into internal interface structures.•Close-up view to an internal surface beneath a capping layer.•Resolving…”
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Structural investigation of the three-layer system MgO/Fe/GaAs(001) by means of photoelectron spectroscopy and diffraction by Handschak, D., Lühr, T., Schönbohm, F., Döring, S., Keutner, C., Berges, U., Westphal, C.

“…We report a combined high-resolution photoemission (XPS) and photoelectron diffraction (XPD) investigation of the three layer system MgO/Fe/GaAs(001). Each…”
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