Search Results - "Satyala, N.T."

Experimental and modeling study of the capacitance–voltage characteristics of metal–insulator–semiconductor capacitor based on pentacene/parylene by Wondmagegn, W.T., Satyala, N.T., Mejia-Silva, I., Mao, D., Gowrisanker, S., Alshareef, H.N., Stiegler, H.J., Quevedo-Lopez, M.A., Pieper, R.J., Gnade, B.E.

“…The capacitance–voltage (C–V) characteristics of metal–insulator–semiconductor (MIS) capacitors consisting of pentacene as an organic semiconductor and…”
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Simulation based performance comparison of transistors designed using standard photolithographic and coarse printing design specifications by Wondmagegn, W.T., Satyala, N.T., Stiegler, H.J., Quevedo-Lopez, M.A., Forsythe, E.W., Pieper, R.J., Gnade, B.E.

“…In this work a simulation based comparative study of organic field effect transistors designed using standard lithographic and printing designs is presented…”
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Conditions for Gaussian long term manufacturing processes by Pieper, R.J., Satyala, N.T.

“…The manufacturing community defines capability indices for manufacturing processes applicable time-wise for both long term and short term processes. The long…”
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An Improved Characterization for Predicting a Capability index with Dependence on Manufacturing Target Bias by Pieper, R.J., Satyala, N.T.

“…A target bias dependent capability index predictor is proposed and compared to two other commonly used paradigms. The formalism for the proposed approach…”
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