Search Results - "Sanghavi, Shail"

Characterization of amorphous zinc tin oxide semiconductors by Rajachidambaram, Jaana S., Sanghavi, Shail, Nachimuthu, Ponnusamy, Shutthanandan, Vaithiyalingam, Varga, Tamas, Flynn, Brendan, Thevuthasan, Suntharampillai, Herman, Gregory S.

“…Amorphous zinc tin oxide (ZTO) was investigated to determine the effect of deposition and postannealing conditions on film structure, composition, surface…”
Get full text

Probing the Size- and Environment-Induced Phase Transformation in CdSe Quantum Dots by Karakoti, Ajay S, Sanghavi, Shail, Nachimuthu, Ponnusamy, Yang, Ping, Thevuthasan, Suntharampillai

“…The structural and electronic properties of CdSe quantum dots were investigated by in situ micro X-ray diffraction, X-ray photoelectron spectroscopy, and…”
Get full text

Criticality of Photo Track Monitoring for Lithography Defect Control by Mowell, Nathaniel, Sheumaker, Brian, Han, Timothy, Chaung, Joe, Sanghavi, Shail, Khopkar, Yashdeep, Levitov, Felix, Bielec, Brandon, Salvador, Dave, Naguib, Kareem, Nguyen, Vu

“…Precise control over the lithography process is vital to high volume manufacturing in the semiconductor industry. As integrated circuit design continues to…”
Get full text