Search Results - "Sandow, C."

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  1. 1

    Ex vivo effects of insulin on the structural integrity of equine digital lamellae by Sandow, C., Fugler, L. A., Leise, B., Riggs, L., Monroe, W. T., Totaro, N., Belknap, J., Eades, S.

    Published in Equine veterinary journal (01-01-2019)
    “…Summary Background Laminitis has a considerable impact on the equine industry. Endocrinopathic laminitis is the most common form and affected horses often have…”
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    Journal Article
  2. 2

    Impact of electrostatics and doping concentration on the performance of silicon tunnel field-effect transistors by Sandow, C., Knoch, J., Urban, C., Zhao, Q.-T., Mantl, S.

    Published in Solid-state electronics (01-10-2009)
    “…We present experimental studies on the performance of ultra-thin body SOI tunnel FETs depending on channel length, gate oxide thickness and source/drain doping…”
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    Journal Article
  3. 3

    Omega-Gated Silicon and Strained Silicon Nanowire Array Tunneling FETs by Richter, S., Sandow, C., Nichau, A., Trellenkamp, S., Schmidt, M., Luptak, R., Bourdelle, K. K., Zhao, Q. T., Mantl, S.

    Published in IEEE electron device letters (01-11-2012)
    “…This letter presents experimental results on tunneling field-effect transistors featuring arrays of Ω-gated uniaxially strained and unstrained silicon…”
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    Journal Article
  4. 4

    Schottky-barrier height tuning of NiGe/n-Ge contacts using As and P segregation by Mueller, M., Zhao, Q.T., Urban, C., Sandow, C., Buca, D., Lenk, S., Estévez, S., Mantl, S.

    “…We present a systematic study of the Schottky barrier lowering induced by dopant segregation during nickel germanidation at NiGe/n-Ge(1 0 0) contacts. We used…”
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    Journal Article
  5. 5

    Opportunities and challenges of a 1200 V IGBT for 5 V gate voltage operation by Imperiale, I., Baburske, R., Arnold, T., Philippou, A., Griebl, E., Wolter, F., Thees, H.-J., Mauder, A., Niedernostheide, F.-J., Sandow, C.

    “…This work presents a novel scaling approach for IGBTs which applies constant electric-field scaling while keeping the short-circuit current density, the…”
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    Conference Proceeding
  6. 6

    Gadolinium scandate as an alternative gate dielectric in field effect transistors on conventional and strained silicon by Roeckerath, M., Lopes, J. M. J., Durğun Özben, E., Sandow, C., Lenk, S., Heeg, T., Schubert, J., Mantl, S.

    “…Long channel n-type metal oxide semiconductor field effect transistors on thin conventional and strained silicon on insulator substrates have been prepared by…”
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    Journal Article
  7. 7

    Systematic study of Schottky barrier MOSFETs with dopant segregation on thin-body SOI by Urban, C., Sandow, C., Zhao, Q.-T., Knoch, J., Lenk, S., Mantl, S.

    Published in Solid-state electronics (01-02-2010)
    “…In this paper, we present a detailed study of nickel-silicide source and drain Schottky barrier MOSFETs on thin-body silicon-on-insulator. We use silicidation…”
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    Journal Article
  8. 8

    Small-signal analysis of high-performance p- and n-type SOI SB-MOSFETs with dopant segregation by Urban, C., Emam, M., Sandow, C., Zhao, Q.T., Fox, A., Mantl, S., Raskin, J.-P.

    Published in Solid-state electronics (01-09-2010)
    “…In this paper, we present fully-depleted Schottky barrier MOSFETs with dopant-segregated NiSi source and drain junctions. Schottky barrier MOSFETs with a…”
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    Journal Article Conference Proceeding
  9. 9
  10. 10

    Epitaxial growth of NiSi2 induced by sulfur segregationat the NiSi2/Si(100) interface by Zhao, Q.T., Mi, S.B., Jia, C.L., Urban, C., Sandow, C., Habicht, S., Mantl, S.

    Published in Journal of materials research (01-01-2009)
    “…Epitaxial growth of a NiSi2 layer was observed on S+ ion-implanted Si(100) at a low temperature of 550 °C. Depending on the S+ dose and the Ni thickness, we…”
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    Journal Article
  11. 11

    GLOBAL BURNED AREA MAPPING FROM EUROPEAN SATELLITES: THE ESA FIRE_CCI PROJECT by Chuvieco, E., Sandow, C., Guenther, K. P., González-Alonso, F., Pereira, J. M., Pérez, O., Bradley, A. V., Schultz, M., Mouillot, F., Ciais, P.

    “…The European Space Agency (ESA) Climate Change Initiative (CCI) is part of the European contribution to the Global Climate Observing System (GCOS) program…”
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  12. 12

    A DEPFET pixel matrix system for the ILC vertex detector by Trimpl, M., Andricek, L., Fischer, P., Kohrs, R., Krüger, H., Lutz, G., Moser, H.G., Peric, I., Reuen, L., Richter, R.H., Sandow, C., Strüder, L., Treis, J., Wermes, N.

    “…The DEPFET detector offers radiation detection and amplification jointly by embedding a field effect transistor into fully depleted silicon. Due to the…”
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    Journal Article
  13. 13

    Development of a prototype module for a DEPFET pixel vertex detector for a linear collider by Kohrs, R., Andricek, L., Fischer, P., Harter, M., Karagounis, M., Kruger, H., Lutz, G., Moser, H.G., Peric, I., Porro, M., Reuen, L., Richter, R.H., Sandow, C., Struder, L., Trimpl, M., Wermes, N.

    Published in IEEE transactions on nuclear science (01-08-2005)
    “…For operation at a linear collider the excellent noise performance of depleted field effect transistor (DEPFET) pixels allows building very thin detectors with…”
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    Journal Article
  14. 14

    Performance of a DEPFET prototype module for the ILC vertex detector by Reuen, L., Kohrs, R., Velthuis, J.J., Andricek, L., Fischer, P., Giesen, F., Kruger, H., Lutz, G., Mathes, M., Moser, H.G., Peric, I., Richter, R.H., Sandow, C., von Torne, E., Trimpl, M., Treis, J., Wermes, N.

    Published in IEEE transactions on nuclear science (01-06-2006)
    “…For the detection of secondary vertices of long lived bottom and charm quarks at the proposed International Linear Collider (ILC) a DEPFET pixel detector is…”
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    Journal Article
  15. 15
  16. 16

    Silicon Nanowire Tunneling Field-Effect Transistor Arrays: Improving Subthreshold Performance Using Excimer Laser Annealing by Smith, J T, Sandow, C, Das, S, Minamisawa, R A, Mantl, S, Appenzeller, J

    Published in IEEE transactions on electron devices (01-07-2011)
    “…We have experimentally established that the inverse subthreshold slope S of a Si nanowire tunneling field-effect transistor (NW-TFET) array can be within 9% of…”
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    Journal Article
  17. 17

    Influence of quasi-3D filament geometry on the latch-up threshold of high-voltage trench-IGBTs by Toechterle, C., Pfirsch, F., Sandow, C., Wachutka, G.

    “…Current filaments are inherently three-dimensional phenomena regardless of the chip topography, which can be stripe-or checkerboard-shaped. Therefore, we…”
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    Conference Proceeding
  18. 18

    Evolution of current filaments limiting the safe-operating area of high-voltage trench-IGBTs by Toechterle, C., Pfirsch, F., Sandow, C., Wachutka, G.

    “…An improved understanding of the physical processes leading to the formation of current filaments and latch-up in large arrays of monolithically integrated…”
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    Conference Proceeding
  19. 19

    IGBT with superior long-term switching behavior by asymmetric trench oxide by Sandow, C., Brandt, P., Felsl, H.-P., Niedernostheide, F.-J., Pfirsch, F., Schulze, H.-J., Stegner, A., Umbach, F., Santos, F., Wagner, W.

    “…The continued shrinking of IGBT chips calls for new design approaches to ensure reliable and stable switching operation during the chip lifetime. We…”
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    Conference Proceeding
  20. 20

    Free-carrier absorption experiments for the investigation of the physical device properties in IGBTs with hydrogen-related donors by Korzenietz, A., Wachutka, G., Hille, F., Sandow, C., Niedernostheide, F.-J

    “…Hydrogen-related donors can be advantageously used in IGBTs and power diodes with a view to creating field-stop layers and to optimising the electrical…”
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    Conference Proceeding